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Jem 2100 instrument

Manufactured by JEOL
Sourced in Japan

The JEM-2100 is a high-performance transmission electron microscope (TEM) designed for advanced materials analysis. It features a LaB6 electron source and provides a resolution of 0.25 nm, enabling detailed examination of microstructures and nanomaterials. The instrument offers a wide range of operating voltages from 80 kV to 200 kV, allowing users to optimize imaging and analytical capabilities for their specific research needs.

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28 protocols using jem 2100 instrument

1

Characterization of Silver Nanoparticles

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UV–visible spectral analysis was performed by detecting of the optical density (OD) using a “T80” UV/VIS spectrometer (Bruker Corporation, Billerica, MA, USA). Measurements were performed at room temperature between 200 and 800 nm ranges. The baseline was established by using silver nitrate (1 mM) as a blank. Transmission electron microscopy (JEOL JEM-2100 instrument, (JEOL Ltd., Tokyo, Japan)) was utilized to explore the morphology and size of silver nanoparticles. The sample was equipped by bringing a drop of them on a carbon-coated copper grid and using a lamp to dry it.
Fourier transform infrared (FTIR) spectroscopy measurements were used to confirm the AgNPs synthesis and also to estimate the possible bioactive components in the plant latex that enhance the reduction of the Ag+ ions and play roles in stabilization of the synthesized nanoparticles [122 (link)]. Both crude latex and silver nanoparticle samples were ground to dry semisolid form and mixed with Kbr and analyzed using a NicoletTM iSTM 10 FTIR spectrometer (Thermo Scientific, Inc., Waltham, MA, USA). The results were detected in the range of 4000–400 cm−1 at a resolution of 8 cm−1 at 25°C.
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2

Structural and Optical Characterization of RE3+-Doped GdVO4 Phosphors

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XRD measurements were performed on a Rigaku SmartLab diffractometer using Cu-Kα radiation (λ = 0.15405 nm). Diffraction data were recorded with a step size of 0.02° and a counting time of 0.7° min−1 over the angular range 10° ≤ 2θ ≤ 100°. Crystallite sizes were estimated using the Halder–Wagner method by analyzing all major diffraction peaks. TEM imaging was performed using a JEOL-JEM 2100 instrument (Akishima-shi, Japan) equipped with a LaB6 cathode operating at 200 kV.
Photoluminescence measurements were carried out on pellets prepared from RE3+-GdVO4 powders under a load of 2 ton cm−2. All DC luminescence measurements were performed at room temperature using a Fluorolog-3 spectrofluorometer (model FL3-221, Horiba Jobin Yvon), which uses a 450-W xenon lamp as an excitation source for emission measurements (λexc = 330 nm for GdVO4:Eu3+ and λexc = 345 nm for GdVO4:Er3+/Yb3+) and a xenon–mercury pulsed lamp for decay time measurements. The emission spectra were scanned in the wavelength ranges 350–640 and 375–660 nm, respectively. The UC emission spectra were measured upon excitation with 980-nm radiation (MDLH 980 3w) on an AvaSpec-2048 Fiber Optic Spectrometer system.
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3

Evaluating ZnO Nanoparticle Size and Morphology

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The size and morphology of ZnO-NPs can be evaluated experimentally using TEM, specifically employing JEOL's JEM-2100 instrument. A small amount of colloidal solution was carefully placed onto a copper grid coated with carbon and a 400 mesh to prepare the specimens for TEM investigation. Subsequently, the solvent was left to evaporate naturally at ambient room temperature. Image J software was used to determine the mean particle size of NPs.
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4

Zn_x Cd_1-x S Nanostructure Characterization

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Powder X-ray diffraction (XRD) patterns were collected by using a Bruker D8 ADVANCE diffractometer with CuKα radiation (λ = 1.5418 Ǻ). The morphology of the samples were characterized by scanning electron microscopy (SEM, Hitachi S-4800). Energy-dispersive X-ray spectroscopy (EDS) attached to the SEM instrument was used to analyze the composition of the ZnxCd1−xS samples. Transmission electron microscopy (TEM), high-resolution TEM (HRTEM) images, and the corresponding selected area electron diffraction (SAED) were obtained with a JEOL JEM-2100 instrument transmission electron microscope at an acceleration voltage of 200 KV. UV/Vis diffusion reflectance spectra (DRS) of the samples were studied with a UV-3600 spectrophotometer (Shimadzu, Japan) and BaSO4 was used as the reference.
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5

CTAB-Mediated AuNPs Characterization

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By introducing 20 μL of AuNPs (∼3
× 1012 NPs/mL) into 2 mL of an aqueous CTAB solution
(0–0.6 mM), the desired AuNPs/CTAB mixtures were obtained (mixture
B).
UV–visible spectra of mixtures A and B were recorded
with a Lambda 35 UV–vis spectrometer (PerkinElmer, Waltham).
Transmission electron microscopy (TEM) images were recorded on a JEM-2100
instrument (JEOL, Tokyo, Japan) with an accelerating voltage of 200
kV (20 μL of the sample was dropped onto a carbon-coated Cu
grid and dried in air). Effective surface charges on the surface of
AuNPs (1.5 × 1012 NPs/mL) in the presence of different
contents of CTAB (0, 0.00025, 0.0075, 0.01, 0.025, 1.0, 1.5, 2, 2.5,
5, and 10 mM) were measured using a ζ potential analyzer (Malvern
Instruments Zetasizer, Worcestershire, U.K.). Each sample was measured
three times to obtain an average value. It should be noted that all
of the solutions mentioned above for determination were analyzed immediately
after mixing because of their unstable characteristics.
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6

Comprehensive Materials Characterization Protocol

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X-ray powder diffraction patterns are obtained with a Bruker AXS D8 Advance X-ray diffractometer in the range of 20–80° using Cu Kα radiation (40 kV and 35 mA, step size 0.02°). Attached functional groups have been analysed with Fourier transform infrared spectrometry (FTIR interferometer IR prestige-21 FTIR (model-8400S)) in the range of 400–4000 cm−1 by making calcined product pallets with KBr in a weight ratio of 1:10. ESR measurements were performed at room temperature by using an X-band JEOL JES-ME spectrometer. ESR spectra are recorded under following experimental conditions: magnetic field sweep rate of 50 mT/min, modulation width of 0.35 mT, modulation frequency of 100 kHz, and microwave power of approx. 10 mW (9.5 GHz). Magnetic properties have been studied with a vibrating sample magnetometer (Lakeshore 7410) at room temperature. Microwave studies have been carried out with vector network analyser (Agilent 8722ES) by pressing the powder and making samples of 2 mm thickness (15.8 mm × 7.9 mm). Transmission electron microscopy (TEM) images of samples have been recorded using a JEOL JEM 2100 instrument.
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7

Characterization of Metallic Nanoparticles

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Morphology and size of the MNPs were characterized using a Jeol JEM 2100 instrument, operated at 200 kV for HRTEM/EDS and 90 kV for TEM. UV-vis absorption spectra were recorded at room temperature using a Thermo Scientific Genesys 10 S spectrometer, the UV-vis spectra were recorded over the range of 200–1000 nm by a UV- VIS.
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8

Comprehensive Characterization of Carbon Dots

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The transmission electron microscopy (TEM) images were acquired using a JEM 2100 instrument (JEOL) (acceleration voltage: 200 kV); the UV-vis absorption spectra were obtained with a UV-3600 spectrophotometer (Shimadzu, Japan); the Fourier transform infrared (FT-IR) absorption spectra were obtained with a NICOLET iS10 FT-IR spectrometer (Thermo Scientific™, America); the X-ray photoelectron spectroscopy (XPS) data, including binding energy survey and high resolution spectra of C 1s, N 1s and O 1s, were acquired on a PHI 5000 Versa Probe (UlVAC-PHI, Japan). The photoluminescence (PL) emission spectra, emission mapping and the photoluminescence quantum yield (PLQY) of CDs in ethanol solution were measured with a FluoroLog FL3 spectrophotometer (HORIBA, Japan). The PL lifetime, URTP lifetime and URTP emission spectra were measured on an FLS980 spectrophotometer (Edinburgh Instrument, UK) equipped with a microsecond flash-lamp (μF900); all URTP emission spectra were measured with the following configuration unless otherwise specified: lamp frequency: 50 Hz, initial delay: 5 ms, sampling window: 15 ms.
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9

Structural Characterization of Materials

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X-ray diffraction (XRD) characterizations of the samples were recorded by a D8 Focus diffractometer (Bucker AXS Inc., Germany) with Cu Ka radiation (k = 0.154 nm). The operating target voltage was 40 kV and the current was 40 mA. The sample was scanned for 2θ, ranging from 0.5° to 10.0° for small-angle. Transmission electron microscopy (TEM) images were obtained with a JEM-2100 instrument (JEOL Ltd., Japan) operated at an accelerating voltage of 200 kV. The samples were ultrasonically dispersed in ethanol and then dropped onto carbon-coated copper grids prior to measurement.Nitrogen sorption isotherms were measured on a Micromeritics ASAP2020 system (Micromeritics Instrument Corp., USA).The surface areas were calculatedusing the BET method, and the poredistributions were plotted using the DFT model.
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10

Characterization of AuNPs for Acetylcholinesterase Inhibition

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Eggs were purchased from the Chaoshifa supermarket. AChE and ACh were purchased from Sigma-Aldrich (USA). H2SO4, NaOH, and HAuCl4 were sourced from Sinopharm Co. (China), and all other chemicals were obtained from the Beijing Chemical Plant. Deionized (DI) water was produced using the Milli-Q system (USA). Incubators and magnetic stirrer plates were purchased from IKA Instrument Co. (Germany). Fluorescence spectra were recorded on a HITACHI 2000 spectrometer (Hitachi Co., Japan), and Fluorescence Spectrometer FS5 from Edinburgh Instruments (U.K.). Transmission electron microscopy (TEM) imaging was performed using a JEM-2100 instrument (JEOL Co., Japan). The Fourier transform infrared spectrometer was Tensor 27 from Buruker. Co. etc.(Germany). X-ray Photoelectron Spectroscopy (XPS) was tested by using PHI Quantera SXM, from ULVAC-PHI (Japan).
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