Escalab 250xi xps spectrometer microprobe

XPS measurements were performed using Surface Science Instruments X-Probe spectrometers to investigate the surface composition of the PSBMA film. The ESCALAB 250Xi XPS spectrometer microprobe (Thermo Fisher Scientific, MA, USA) with an Al Kα X-ray source (1486.71 eV of photons) was used. The pressure in the analysis chamber was maintained at about 8 × 10⁻⁷ Pa during each measurement. The survey spectra (from 0 to1400 eV) and the core-level spectra with higher resolution were both collected. An ion gun was used to compensate for surface charge effects. The software Thermo ScientificTM Avantage Data system was used to fit the XPS spectra peaks.

XPS measurements were performed using Surface Science Instruments X-Probe spectrometers to investigate the surface composition of the PSB and PDA-PSB films. The ESCALAB 250Xi XPS spectrometer microprobe (Thermo Fisher Scientific, MA, USA) with an Al Kα X-ray source (1486.71 eV of photons) was used. The pressure in the analysis chamber was maintained at about 8 × 10⁻⁷ Pa during each measurement. The survey spectra (from 0 to1400 eV) and the core-level spectra with higher resolution were both collected. An ion gun was used to compensate for surface charge effects. The software Thermo scientific™ Avantage Data system was used to fit the XPS spectra peaks.