Fesem merlin
The FESEM Merlin is a field emission scanning electron microscope (FESEM) manufactured by Zeiss. It provides high-resolution imaging and analysis capabilities for a wide range of materials and applications. The FESEM Merlin utilizes a field emission electron source and advanced optics to deliver exceptional image quality and resolution.
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36 protocols using fesem merlin
Morphometric Analysis of Hollow Fibers
Elemental Composition and Morphology of PLD Films
Atomic Force Microscopy (AFM) topography images were measured by a Park XE-70 Instruments microscope (Park Systems, Suwon, Korea) operating under non-contact mode at room temperature in air environment. The scan size was set as 10 × 10 μm2. Average roughness Ra is provided to characterize the roughness characteristics of the PLD-deposited films.
FESEM Characterization of Nanoparticle Morphometry
Drops of 3 µl of F3-RK-GFP-H6 (C), and F3-RK-PE24-H6 (CS) samples diluted at 0.3 mg/ml in their respective buffers were directly deposited on silicon wafers (Ted Pella Inc.) for 30 s. Excess of liquid was blotted with Whatman filter paper number 1 (GE Healthcare), air dried for few min and immediately observed without coating with a FESEM Zeiss Merlin (Zeiss) operating at 1 kV and equipped with a high resolution in-lens secondary electron detector. Representative images of a general field and nanoparticle detail were captured at three high magnifications (from 150,000x, 250,000x and 400,000x).
Nanoparticle Characterization by DLS and FESEM
Ultrastructural morphometries of T22-GFP-H6, T22-GFP-H6-ATTO and T22-GFP-H6-S-Cy5 (size and shape) were determined at nearly native state with field emission scanning electron microscopy (FESEM). Drops of 3 µL of diluted samples at 0.3 mg/mL were directly deposited on silicon wafers (Ted Pella Inc., Redding, CA, USA) for 30 s, excess of liquid blotted, air dried and immediately observed without coating with a FESEM Zeiss Merlin (Zeiss, Oberkochen, Germany) operating at 1 kV and equipped with a high resolution in-lens secondary electron detector. In a qualitative approach, representative images of a general fields and nanostructure details were captured at two high magnifications (150,000× and 400,000×). In a quantitative approach, nanoparticles and nanoconjugate average size were analyzed by Image J software (Image J 1.48v, NIH, Bethesda, MA, USA) from FESEM images.
Scanning Electron Microscopy of Inclusion Bodies
Microdrops JAMF1 IB Characterization
Visualizing Protein Nanoparticles and Inclusion Bodies
Nanoparticle Morphometry: Size and Shape
Ultrastructural Characterization of Intracellular and Isolated Inclusion Bodies
Ultrastructural morphometry (size and shape) of nanoparticles was performed and characterized at nearly native state with field emission scanning electron microscopy (FESEM). Drops of 20 µL of IBs sample were directly deposited on silicon wafers (Ted Pella Inc.) for 30 s and immediately observed without coating with a FESEM Merlin (Zeiss) operating at 1 kV and equipped with a high-resolution secondary electron detector.
Ultrastructural Analysis of JAWS II Cells
Scanning electron microscopy images of the cells surfaces were obtained by incubating JAWSII with 5 µg/ml of NPs for 3 h, then the cells were fixed with warm 2.5% glutaraldehyde in 0.1 M phosphate buffer pH 7.2 for 20 min, as described in Ref. (17 (link)) and acquired using FE-SEM Merlin (Zeiss, Jena, Germany).
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