Electrochemical measurements were performed using a potentiostat (Gamry 600, Gamry Instruments, Pennsylvania, USA). The morphology of graphene oxide was characterized using field-emission scanning electron microscopy (SEM) (Zeiss Leo Field Emission SEM), and FT-Raman spectra (micro Raman Spectrometer, 532 nm excitation laser) was used to obtain Raman shift of the electrode surface. pH microprobe was used to measure the pH of the EBC samples. As a gold standard method to benchmark the performance of our sensor, chemiluminescence detection (NOA 280i, GE analytics, boulder) was used to justify nitrite detection ability of the fabricated sensor. The electrical impedance was measured using a commercial lock-in amplifier (Zurich Instrument HF2A, Zurich, Switzerland).
Leo field emission sem
Manufactured by Zeiss
Sourced in Germany
The LEO Field Emission SEM is a scanning electron microscope that utilizes a field emission gun to generate high-resolution images of sample surfaces. It is designed to provide detailed topographical and compositional information at the nanoscale level.
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Lab products found in correlation
6 protocols using leo field emission sem
1
Electrochemical Characterization of Graphene Oxide
2
Shunt Morphometry via Microscopy
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Shunt OD was measured via optical microscopy using an Eclipse TS100 (Nikon Instruments, Melville, NY). Inner lumen diameter and shunt morphology were examined via SEM at 1 kV with a LEO Field Emission SEM (Zeiss, Oberkochen, Germany) following desiccation for at least 24 h and sputter coating with 10 nm of Au/Pd. Imaging was conducted prior to removal of the template wire, after removal of the wire, and following in vitro fluid flow studies. Image analysis and shunt dimensions were measured using ImageJ (U. S. National Institutes of Health, Bethesda, MD, https://imagej.nih.gov/ij/ ).
3
Suture Diameter Measurement via SEM Imaging
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Sutures were serially dehydrated in ethanol (Sigma Aldrich) and dried prior to sputter coating with 10 nm of Au/Pd. Samples were then imaged via scanning electron microscopy (SEM) at 1 to 2 kV using a LEO Field Emission SEM (Zeiss, Oberkochen, Germany) and suture diameter measured using ImageJ software (n = 14 for each condition; http://imagej.nih.gov/ij/ ; provided in the public domain by the National Institutes of Health, Bethesda, MD).
4
Suture Morphology Visualized by SEM
5
Suture Morphology Visualized by SEM
6
Nanofiber Morphology Analysis via SEM
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Suture morphology was observed via SEM at 1 kV using a LEO Field Emission SEM (Zeiss, Oberkochen, Germany). Prior to imaging, samples were desiccated and then sputter coated with 10 nm of Au/Pd (Desk II, Denton Vacuum, Moorestown, New Jersey). Measurement of individual nanofiber diameters (n = 9) was conducted using ImageJ (US National Institutes of Health, Bethesda, Maryland, https://imagej.nih.gov/ij/ ).
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