The morphology of the samples was characterized by transmission electron microscopy (TEM, Phillips CM 300 at 300 kV) and scanning electron microscopy (SEM, FEI Quanta field emission microscope) measurements. UV–vis absorption spectra were acquired with a PerkinElmer Lambda 35 UV–vis spectrophotometer, and photoluminescence measurements were conducted with a PTI fluorospectrophotometer. X-ray photoelectron spectra (XPS) were recorded with a PHI 5400/XPS instrument equipped with an Al Kα source operated at 350 W and 10−9 Torr. X-ray diffraction (XRD) studies were conducted with a Rigaku D/MAX-2200 diffractometer with Cu Kα radiation (λ = 1.540 Å). Inductively coupled plasma-optical emission spectroscopy (ICP-OES) measurements were carried out with a PerkinElmer Optima Instrument. Energy-dispersive X-ray spectroscopy (EDS) measurements were performed with an Apreo 2 SEM.
D max 2200 diffractometer
Manufactured by Rigaku
Sourced in Japan
The D/MAX-2200 diffractometer is a versatile X-ray powder diffraction system designed for materials analysis. Its core function is to collect and analyze diffraction patterns of powdered or polycrystalline samples to identify their crystalline structure and composition.
Automatically generated - may contain errors
Lab products found in correlation
S 4800, by Hitachi (2 mentions)
Cm300, by Philips (1 mentions)
Optima instrument, by PerkinElmer (1 mentions)
1800 pc uv vis spectroscope, by MAPADA (1 mentions)
Le438, by Mettler Toledo (1 mentions)
Jem 2100f, by JEOL (1 mentions)
Fe20 ph meter, by Mettler Toledo (1 mentions)
F 7000 fluorescence spectrophotometer, by Hitachi (1 mentions)
Pyris 1 tga, by PerkinElmer (1 mentions)
Axios max spectrometer, by Malvern Panalytical (1 mentions)
Nexion 300, by PerkinElmer (1 mentions)
Diamond tg dta instrument, by PerkinElmer (1 mentions)
Jsm 6390, by JEOL (1 mentions)
Sx100, by Cameca (1 mentions)
11 protocols using d max 2200 diffractometer
1
Comprehensive Characterization of Nanomaterials
2
Comprehensive Characterization of Materials
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Electrochemical measurements including impedance spectroscopy (EIS) were performed on a CHI760E electrochemical workstation (China). The three-electrode system consists of a platinum counter electrode, an Ag/AgCl (3.0 M KCl) reference electrode, and a glassy carbon working electrode (GCE, 3.0 mm diameter). Morphology images were obtained on a JEOL-JSM-7500 scanning electron microscope (SEM) (Japan). The optical characterization was conducted using a Mapada 1800 PC UV-Vis spectroscope (China) from 200–800 nm and ultra-pure water was used as the reference. Fourier transform infrared spectroscopy (FTIR) characterization was performed on a Nicolet MX-1E spectroscope (USA). X-ray diffraction (XRD) was conducted using a Rigaku Dmax2200 diffractometer (Japan). Thermal gravimetric analysis (TGA) was performed using a NETZSCH 299-F1 analyzer (Germany).
3
Characterization of Solid Sample by Advanced Analytical Techniques
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The pH was measured using an FE20 pH meter (Mettler Toledo, USA) equipped with a glass electrode (LE438, Mettler Toledo, USA). Concentrations of exchanged liquid were determined by ion chromatography (METROSEP A SUPP 5-250) at a flow rate of 0.7 mL min−1 with an eluent mixture of 3.2 mM Na2CO3/1.0 mM NaHCO3. The solid sample was characterized by Fourier transform infrared spectroscopy (FT-IR) (Thermo, Scientific 380 FT-IR) in the range of 4000 to 500 cm−1 with resolution of 4 cm−1. X-ray diffraction (XRD) patterns of solid were obtained on a D/max2200 diffractometer (Rigaku Co., Japan) with Cu Ka radiation (λ = 0.15406 nm) operating at 40 kV and 100 mA in the range of 2θ = 10–80° at a scan speed of 4° min−1. The morphology of the solid was characterized by scanning electron microscopy (SEM, S-4800, Hitachi Ltd., Japan). The morphologies and sizes of the as-obtained samples were observed by transmission electron microscopy (TEM, JEM-2100F, JEOL, Japan) at 200 kV to obtain high-resolution images.
4
Thermal-Induced Crystalline Structure Shifts
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The change in crystalline structure of native DSF and T-DSF samples at various temperatures was recorded on a D/max-2200 diffractometer (Rigaku, Tokyo, Japan) using a Cu-Kα source, and diffraction data were collected from 5° to 50° with a step interval of 0.02°, an accelerating voltage of 40 kV and a current of 30 mA.
5
Synthesis and Characterization of Coordination Compounds
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The two ligands were obtained by the literature method.30,31 (link) All available reagents for the synthesis were purchased from commercial sources and used directly. FT-IR spectra on KBr disk were recorded on a Nicolet-IS10 spectrometer. Elemental analysis was performed on an EA1110 CHNO-S microanalyzer. Luminescence properties were carried on a Hitachi F-7000 fluorescence spectrophotometer. Powder X-ray diffraction (PXRD) measurements were carried out on a Rigaku D/MAX 2200 diffractometer. Scanning electron microscopy (SEM) was recorded on a Hitachi S-4800. 1H and 13C NMR spectrum were tested on a 400 MHz Bruker instrument using DMSO-d6 as solvent. All general characterizations were carried out with crystal samples.
6
Comprehensive Characterization of Phosphor Materials
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X-ray diffraction (XRD) data of as-synthesized phosphors were collected using a Rigaku D-max 2200 diffractometer with Cu Kα radiation at 40 kV and 26 mA. XRD Rietveld profile refinements of the structural model were performed with the use of General Structure Analysis System (GSAS).18,19 (link) The crystal structures were drawn and analyzed with VESTA software.20 (link) The fourier transform infrared spectroscopy (FTIR) were investigated using a Shimadzu Spectrometer IRAffinity-1 model. The morphologies of the samples were characterized by a JEOL 840A field emission scanning electron microscope (FE-SEM) equipped with X-ray energy diffraction spectroscopy (EDAX). Diffuse reflection spectra (DRS) of the final synthesized phosphors were recorded at room temperature on a UV-visible-NIR spectrometer (Carry-5000). The photoluminescence excitation and emission spectra and fluorescence lifetime were collected with an FLS 920-combined Time-Resolved and Steady-State Fluorescence Spectrometer (Edinburgh) with photomultiplier tube operating at 400 V and Xe-lamp as an excitation source. And the temperature-dependent emission spectra were also collected on the same instrument with a temperature controller. The quantum yield of the synthesized phosphors was recorded on a Horiba FL3 (Japan) equipped with an integrating sphere.
7
Crystalline Structure Analysis of Film-Forming Solutions
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The changes in the crystalline structure of
the film-forming solution
and film-forming solution of chemical treatment were investigated
by using a D/MAX-2200 diffractometer (Rigaku, Tokyo, Japan) with a
Cu Kα source. Diffraction data were collected from 5 to 50°
with a step interval of 0.02° at 40 kV and 30 mA.
the film-forming solution
and film-forming solution of chemical treatment were investigated
by using a D/MAX-2200 diffractometer (Rigaku, Tokyo, Japan) with a
Cu Kα source. Diffraction data were collected from 5 to 50°
with a step interval of 0.02° at 40 kV and 30 mA.
8
XRD Analysis of Hydrogel Powder
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XRD patterns of the hydrogels were analyzed by using a D/max-2200 diffractometer (Rigaku, Japan) at a voltage of 40 kV and a current of 30 mA through Cu-Kα radiation. The scanning scope of 2θ was ranged from 5° to 90° at a scanning rate of 5°/min. The sample was ground to a powder of >200-mesh for testing.
9
Characterization of ZnO Quantum Dots
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The specimens were examined in a TECNAI 10 PHILIPS transmission electron microscope (TEM) (Amsterdam, Holland) operated at the accelerating voltage of 100 kV. The powder X-ray diffraction (XRD) pattern of the samples was recorded by a D/MAX 2200 diffractometer (Rigaku, Tokyo, Japan) using Cu Kα radiation in a scan step of 0.02° and a scan range between 5° and 70°. All thermogravimetric analysis (TGA) tests were carried out by a thermal analyzer (TGA pyris 1, Perkin Elmer Co., Waltham, MA, USA) at a linear heating rate of 10 °C/min under pure nitrogen within the temperature range of 50 to 800 °C. The mass of the samples was kept within 3–4 mg. Ultraviolet-visible (UV-vis) and photoluminescence spectra of ZnOQDs and ZnOQD/CMC nanocomposites were recorded on a GENESYS 10 UV-vis spectrometer (Beijing, China) and fluorescence F-4600 fluorescence spectro-photometer (Hitachi, Japan), respectively.
10
Characterization of Magnetic Nanocomposites
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FTIR, SEM, XRD, and TGA analyses were performed to characterize the structural and thermal properties of the synthesized magnetic nanocomposites. FTIR analyses were carried out by turning the samples into pellets with the KBr method using a Bruker Alpha device (Bruker, Billerica, MA, USA). The morphology of the nanocomposites was observed with a Vega 3 scanning electron microscope (SEM; Tescan, Warrendale, PA, USA) at 10,000× magnification. The surface of the samples was sputter-coated with a gold-palladium layer for SEM visualization. The specific surface areas of the nanocomposites were determined by N2 adsorption–desorption isotherms using the BET method on a NOVAtouch device (Quantachrome, Boynton Beach, FL, USA). XRD analyses were performed with a Rigaku D/Max-2200 diffractometer (Rigaku Corp., Tokyo, Japan) and the intensities of data from the nanocomposites were measured in the range of 20° to 60° at the 2θ angle with a scanning rate of 2°/min. TGA analyses were performed using the STA-7200 simultaneous thermogravimetric analyzer (Hitachi, Tokyo, Japan) with heating under nitrogen gas from room temperature to 1000 °C at a rate of 10 °C/min.
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