Ppms 9t

The aberration-corrected STEM and core-level EELS (JEOL JEM-ARM200F) were used to characterize the structure of the cross-sectional Ag/BTO/NSTO. PFM measurements were carried out with conductive SCM-PIT tips (Bruker Dimension Icon). A Keithley 4200A-SCS was used to apply customized pulse waveforms for STDP measurements. The carrier concentration of NSTO and the low temperature I–V measurements were carried out in a Physical Property Measurement System (PPMS-9T, Quantum Design).

2-probe electrical properties of the back-gate and top-gate MoS₂ FETs, including the Figs. 3e, f, 4b, 5b, c, e, h, were carried out by a semiconductor analyzer (FS-Pro) in a shielded vacuum chamber (<0.1 Torr) at room temperature, whose noise level is ~1 × 10⁻¹³A within the voltage range of ±2 V. The 4-probe transfer curves and gated 4-probe measurements (such as gated R_xx-T and Hall data), including Figs. 3b, d, 4c, were carried out in a Physical Properties Measurement Systems (PPMS-9T, Quantum Design) equipped with a homemade electrical measurement system, which is composed of 2 Keithley 2400, and 2 Keithley 2182 A nanovoltmeter and has a noise level of ~10⁻¹⁰A within the voltage range of ± 2 V. The C–V and C–f measurements were carried out on a FS336 LCR Meter.

Silica-coated FMNPs were synthesized and evaluated according to our previous reports¹⁶ (link)^,30 (link). Ethanol (95 mL) and 2 mL of 3-aminopropyltriethoxysilane (APS) were mixed and allowed to react at room temperature for 24 h. Amino-modified FMNPs were separated using permanent magnet, washed with deionized water three times, and stored for further use. The prepared amino-modified FMNPs were characterized by a transmission electron microscope (TEM). The fluorescent and magnetic properties of amino-modified FMNPs were also determined using the photoluminescence (PL) spectra (Perkin Elmer LS 55 Spectrofluorimeter, PerkinElmer, Waltham, MA, USA) and superconducting quantum interference device magnetometer (PPMS-9 T, Quantum Design, Beijing, China), respectively. The zeta-potential value of amino-modified FMNPs was measured with particle sizing systems (NICOMP 380ZLS, PSS, Port Richey, FL, USA).

For electrical conductivities measurements, nc-Ni and nc-Ni composites (0.8 vol.% C) were measured by Physical Property Measurement System (PPMS) (PPMS-9T, Quantum Design) in the temperature range of 2–300 K, using a standard van der Pauw resistivity measurement method⁴³ . The sample dimension is 8 mm × 8 mm × 1 mm (length × width × height). Due to the low electrical resistance of pure Cu and nc-Cu composite, the PPMS measurements yielded rather scattered data. The electrical conductivities of nc-Cu and nc-Cu composites were therefore obtained by eddy current measurements (SMP 10, Fischer) with an accuracy of ±0.5%. Ten positions were tested for each sample (sample dimension: 30 mm × 30 mm × 2 mm) in order to obtain the statistically meaningful average value. The electrical conductivity was expressed in terms of International Annealed Copper Standard (IACS). High-purity annealed copper was used for calibration purposes. All samples used for electrical conductivity measurements were polished down to a metallurgical grit of 4000 SiC paper.

The temperature dependence of the resistivity was measured using a standard four probe technique with a Physical Property Measurement System (Quantum Design PPMS-9T). The low-temperature resistivity (down to 0.3 K) was measured in a ³He refrigerator. The specific heat measurements were performed in a PPMS-9T using the two-τ relaxation method. Magnetic susceptibility measurements were performed down to 2 K using superconducting quantum interference device (SQUID) magnetometer, Magnetic Property Measurement System (Quantum Design MPMS-5T). The resistivity under pressure was measured in a piston-cylinder-type pressure cell up to 2.4 GPa, the maximum pressure which could be applied. Daphne 7373 was used as the pressure transmitting medium.

High-quality single crystals of Cu₃TeO₆ were grown using PbCl₂ (4 N) as the flux, following the procedures in ref.^{59 (link)}. X-ray diffraction data were collected in an x-ray diffractometer (X′TRA, ARL) using the Cu-K_α edge with a wave length of 1.54 Å. Rietveld refinements on the data were run in the Fullprof. suite. A single-crystal x-ray diffractometer was used to confirm the orientation of the single crystals. Susceptibility and heat capacity were measured in the physical property measurement system (PPMS-9T) from Quantum Design.