Jem arm200f

TEM and EDX characterization of the morphology, crystal structure, and elemental composition of the samples were conducted with JEOL JEM-ARM200F and Bruker Quantax 400 instruments. X-ray diffraction data were collected with a Rigaku International Corporation MAX-2200 Ultima instrument for crystal structure analysis. SEM (S-4800, Hitachi) was employed to confirm the morphologies of the particles. A Shimadzu UV-2000 spectrophotometer was used for acquisition of the UV/Vis spectra for optical analysis. The silver content was analyzed by inductively coupled plasma spectroscopy (ICP, X-series, Thermo).

Powder X-ray diffraction (XRD) studies were conducted on an Empyrean diffractometer (PANalytical), using Cu Kα radiation (1.54 Å), a reflection-transmission spinner (sample stage), and PIXcel 3D detector, operating in the Bragg–Brentano geometry. The 2Theta scans were recorded at room temperature at angles ranging from 10° to 95° with a step size of 0.007°, in continuous scan mode.
Transmission electron microscopy (TEM) measurements were performed using a JEM-ARM-200F transmission electron microscope operating at an accelerating voltage of 200 kV.
The infrared spectra were obtained using a Tensor 27 (Bruker Optics) spectrometer equipped with a global source and MCT detector. Samples were prepared using potassium bromide as a matrix material and were mixed in proportions of 1 mg of sample to 200 mg KBr. Pellets were prepared using the standard technique under a pressure of 10 ton/cm² with a barrel of 16 mm in diameter. The measurements were performed at room temperature. For each spectrum, 512 scans in the spectral range of 4000–400 cm^− 1 were taken with a resolution of 4 cm^− 1. The data were processed using the Opus software package.
Spectrophotometric measurements (UV–Vis) were performed using UV/VIS/NIR Spectrometer Lambda 950 (Perkin Elmer) at wavelengths 200–800 nm with water as referred solution.

STEM measurements were performed by using Cs-Corrected Scanning Transmission Electron Microscopy by JEOL (JEM-ARM200F) and EDS spectra were achieved from Bruker Quantax 400.