Fls920 fluorescence spectrophotometer

The steady-state and time-resolved PL measurements were performed on a FLS920 fluorescence spectrophotometer (Edinburgh Instruments). To minimize the effect of air exposure, all the measurements were taken in vacuum with pressure of <0.01 torr. Pulsed laser diodes (EPL405 and EPL635) with tunable repeating frequency of 20 kHz to 20 MHz were used as the excitation source. For CH₃NH₃PbI₃ and CH₃NH₃PbI_3−xCl_x films, EPL635 with a wavelength of 638.8 nm and pulse width of 86.4 ps was used. For CH₃NH₃PbBr₃, we used EPL405 with a wavelength of 404.2 nm and pulse width of 58.6 ps. The excitation fluence for both wavelengths was ∼4 nJ cm⁻². For excitation density-dependent measurements at the low level, the lasers operated at 20 MHz and the light fluence was tuned by a neutral attenuator. For moderate excitation experiments, a 355 nm frequency-tripled Nd:YAG laser (FTSS 355-50, CryLaS GmbH) with a pulse width of 1 ns and a repetition rate of 100 Hz was used. For lifetime measurements by time-correlated single-photon counting, the lasers operated at 200 kHz. The temperature-dependent measurements were performed with a closed-cycle helium cryostat.

J–V curves of PSCs were measured using a Keithley 2400 source meter under the illumination of AM 1.5G, 100 mW cm⁻² solar simulator (Newport 91160, 300 W). The EQE of the PSCs was measured using an EQE system equipped with a xenon lamp (Oriel 66902), an Si detector (Oriel 76175_71 580), a monochromator (Newport 66902), and a dual channel power meter (Newport 2931_C). UV–vis spectra were measured with a Perkin Elmer_UV–vis‐NIR spectrometer. SEM images were characterized by a field emission scanning electron microscope (Tescan MAIA3). XRD measurements were performed on a Rigaku Smartlab Diffractometer. Ultraviolet photoelectron spectroscopy (UPS) was measured on Thermo Fisher Scientific system. Steady‐state photoluminescence (PL) and time‐resolved photoluminescence (TRPL) were measured using an Edinburgh FLS920 fluorescence spectrophotometer. The Raman measurements were performed on a WITEC_Confocal Raman system. Field emission TEM was performed with a JEOL Model JEM‐2100F instrument operated at 200 kV. Atomic force microscopy (AFM) images were collected using Bruker NanoScope 8.

ANS was employed as a fluorescent probe to evaluate the exposure of hydrophobic residues in SPPIA BSA&LZM. Native BSA&LZM with different mass ratios were incubated with ANS (200 µm) for 30 min in the dark. Then, an equivalent volume of SP (2 mg mL⁻¹) was added. After 6 h reaction, the fluorescence intensity of ANS was quantified using an FLS‐920 fluorescence spectrophotometer (Edinburgh Instruments). The emission spectra were recorded in the range of 410 to 590 nm with the excitation wavelength set at 355 nm. The mixture of native BSA&LZM and ANS without adding SP was set as control.

Er:SRON films containing 18 at.% excess Si and 0.4 at.% Er were deposited onto the Si (100) substrates by reactive co-sputtering of Er, Si, and Si₃N₄ targets in Ar-diluted 1% O₂ atmosphere. After deposition, the films were annealed for 1 h under N₂ flux at 600°C or 1,100°C. Transmission electron microscopy measurements showed the absence of Si aggregates in the 600°C annealed sample, while Si-NCs could be clearly observed in the 1,100°C annealed sample [19 (link)]. An Edinburgh Instruments FLS-920 fluorescence spectrophotometer (Edinburgh Instruments, Livingston, UK) was employed, with a xenon lamp as the excitation source in the steady-state PL measurements. A microsecond lamp and a picosecond laser diode were used in the transient PL measurements. The samples were put on the cold finger of a closed-loop He cryostat and kept in a vacuum during the low-temperature measurements. The matrix-related PL spectra were corrected for the system spectra response. A more detailed description of the experimental procedures can be found in [19 (link)].

The X-ray diffraction patterns were obtained on a Rigaku D/max-2400 powder diffractometer by using Cu Kα radiation at 40 kV and 60 mA. The luminescence decay curves were measured by a FLS-920T fluorescence spectrophotometer with a nF900 microsecond flashlamp as the light source. The photoluminescence and the long persistent luminescence spectra were recorded by FLS-920 fluorescence spectrophotometer (Edinburgh Instruments). The absorption spectra were recorded by a PerkinElmer Lambda 950 spectrometer in the region of 400–700 nm, while BaSO₄ was used as a reference.