X-ray diffraction (XRD) of the samples was carried out on a Bruker AXS D8 X-ray diffractometer with a Cu-Kα X-ray source operating at 40 kV and 100 mA. The morphologies of the samples were observed using a scanning electron microscope (SEM, JEOL JSM-6490LV) and a transmission electron microscope (TEM, FEI Tecnai G2). X-ray photoelectron spectroscopic (XPS) measurements were made on an Escalab 250Xi system. UV-vis diffuse reflection spectra of the as-prepared products were carried out using an Evolution 220 UV-vis spectrophotometer (Thermo Fisher) from 200 to 800 nm. Fourier transform infrared (FT-IR) spectra of the samples were measured by a Nicolet 5700 Fourier transform infrared spectrometer. The photoluminescence spectra (PL) of the samples were obtained using a fluorescence spectrometer (Hitachi F-4500) at 293 K.
Axs d8 x ray
Manufactured by Bruker
The AXS D8 is an X-ray diffractometer designed for materials analysis. It utilizes X-ray technology to study the structure and composition of solid materials.
Automatically generated - may contain errors
Lab products found in correlation
Tecnai g2, by Thermo Fisher Scientific (1 mentions)
F 4500, by Hitachi (1 mentions)
Jsm 6490lv, by JEOL (1 mentions)
Evolution 220 uv vis spectrophotometer, by Thermo Fisher Scientific (1 mentions)
Tecnai g2 f30, by Thermo Fisher Scientific (1 mentions)
Su8020, by Thermo Fisher Scientific (1 mentions)
Gc 2014c, by Shimadzu (1 mentions)
3 protocols using axs d8 x ray
1
Comprehensive Characterization of Samples
2
Characterization of Ag/TiO2 Nanocomposites
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X-ray diffraction (XRD) analysis was recorded on a Bruker-AXS D8 X-ray diffractometer with a scan range of 20–80°. X-ray photoelectron spectroscopy (XPS, Thermo Escalab 250Xi, Waltham, MA, USA) was used to characterize the elemental compositions and chemical states of as-prepared Ag/TiO2. The morphology and microstructure were observed by scanning electron microscopy (SEM, Hitachi Limited SU8020, Tokyo, Japan), transmission electron microscopy (TEM, FEI Tecnai G2 F30, Hillsboro, TX, USA), and high-resolution transmission electron microscopy (HRTEM, FEI Tecnai G2 F30, Hillsboro, TX, USA).
3
Comprehensive Characterization of Photocatalytic Materials
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The samples were
characterized by powder X-ray diffraction (XRD) on a Bruker AXS D8
X-ray diffractometer with Cu Kα (λ = 1.54056 Å) to
identify their phases. The particle size and lattice fringes of the
samples were analyzed on a transmission electron microscope (TEM;
JEM 2100F) with an accelerating voltage of 200 kV. UV–vis diffuse
reflectance spectra (DRS) were recorded on a spectrophotometer (Varian
Cary 5000) using BaSO4 as a reference. The chemical structure
and quantity of the products were determined by 1H nuclear
magnetic resonance (NMR) spectroscopy (Bruker Avance 400 spectrometer).
The produced hydrogen was measured by a gas chromatograph (GC-2014C,
Shimadzu, with argon as a carrier gas) with a 5 Å molecular sieve
column (3 × 2 m2) and a thermal-conductivity detector.
Thermogravimetric analysis was performed on a TA Instrument Q600 SDT
from room temperature to 500 °C.
characterized by powder X-ray diffraction (XRD) on a Bruker AXS D8
X-ray diffractometer with Cu Kα (λ = 1.54056 Å) to
identify their phases. The particle size and lattice fringes of the
samples were analyzed on a transmission electron microscope (TEM;
JEM 2100F) with an accelerating voltage of 200 kV. UV–vis diffuse
reflectance spectra (DRS) were recorded on a spectrophotometer (Varian
Cary 5000) using BaSO4 as a reference. The chemical structure
and quantity of the products were determined by 1H nuclear
magnetic resonance (NMR) spectroscopy (Bruker Avance 400 spectrometer).
The produced hydrogen was measured by a gas chromatograph (GC-2014C,
Shimadzu, with argon as a carrier gas) with a 5 Å molecular sieve
column (3 × 2 m2) and a thermal-conductivity detector.
Thermogravimetric analysis was performed on a TA Instrument Q600 SDT
from room temperature to 500 °C.
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