Ntegra
NTEGRA is a high-performance scanning probe microscope (SPM) system designed for advanced research and development applications. It offers a modular and flexible platform that can be configured with various SPM modes, including atomic force microscopy (AFM), magnetic force microscopy (MFM), and scanning tunneling microscopy (STM). The core function of NTEGRA is to provide researchers with a versatile tool for high-resolution imaging, surface characterization, and nanoscale analysis.
Lab products found in correlation
16 protocols using ntegra
Topographical Analysis of Nanofiber Surfaces
AFM Analysis of C60/Ti Morphology
Friction Behavior of Graphite Flake Heterojunctions
Raman Characterization of Graphene Flakes
to the structure and quality of the out-of-plane graphene flakes were
examined by Raman spectroscopy (NT-MDT NTEGRA). The representative
peaks in the Raman spectrum (
of graphene. The typical G band around 1580 cm–1 is generated by the E2g phonon at the center of the Brillouin
zone, while the 2D band at ∼2680 cm–1 representing
the double-resonant Raman scattering can be explained by the appearance
of juxtaposed single- to few-layer graphene flakes in the form of
high-density graphene flakes. The strong D band at ∼1340 cm–1 that indicates structural disorders and defects is
also observed. While the D band is generated from the one-phonon defect-assisted
process, the D + D′ band corresponds to a two-phonon defect-assisted
process.46 (link) For the out-of-plane graphene
flakes, the presence of edges causes translational symmetry breaking,
which results in the emergence of the D′ peak as a shoulder
to the G peak.
Comprehensive Characterization of Generated Films
Surface Morphology Analysis by SPM
measurements (fiber diameter,
average roughness) were performed using an NT-MDT-NTEGRA scanning
probe microscope with a positioning sensitivity of 2 μm and
resonance frequency in the range of 115–190 kHz. The average
roughness values were obtained after one-dimensional (1D) line fitting
and third-order surface subtraction of the raw images.
Piezo-Response Force and Conductive AFM
Morphological Analysis of Lyophilized Samples
Observations at higher magnification were carried out with a commercial AFM (NTMDT) model NTEGRA in tapping mode. For AFM measurements, the oxidized PS sample was fixed on a glass slide with a double tape.
Atomic Force Microscopy of α-Synuclein Fibrils
Antibacterial Coatings for Surgical Blades
P. aeruginosa cells on agar assay, as mentioned above.
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