The study of topological properties of samples’ surface in this experiment was performed with AFM (NTEGRA; NT-MDT, Eindhoven, the Netherlands). The software used to estimate the values of the average roughness and peak to valley was the AFM model NTEGRA and SPM (NT-MDT). Surface properties of the nanofibers were examined using a nanoscope AFM in the tapping mode and expressed as height and phase images.
Ntegra
Manufactured by NT-MDT
NTEGRA is a high-performance scanning probe microscope (SPM) system designed for advanced research and development applications. It offers a modular and flexible platform that can be configured with various SPM modes, including atomic force microscopy (AFM), magnetic force microscopy (MFM), and scanning tunneling microscopy (STM). The core function of NTEGRA is to provide researchers with a versatile tool for high-resolution imaging, surface characterization, and nanoscale analysis.
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Lab products found in correlation
Xplora, by Horiba (1 mentions)
Sr830, by Stanford Research Systems (1 mentions)
Tm3000 benchtop sem, by Hitachi (1 mentions)
Nova software, by NT-MDT (1 mentions)
Dsa25b, by Krüss (1 mentions)
Uv 2501pc, by Shimadzu (1 mentions)
Dektak 150, by Veeco (1 mentions)
Quanta 200 scanning electron microscope, by Thermo Fisher Scientific (1 mentions)
Themis 200, by Thermo Fisher Scientific (1 mentions)
Vk 9710k, by Keyence (1 mentions)
D max 2200, by Rigaku (1 mentions)
Invia confocal raman microscope, by Renishaw (1 mentions)
Nova px software, by NT-MDT (1 mentions)
16 protocols using ntegra
1
Topographical Analysis of Nanofiber Surfaces
2
AFM Analysis of C60/Ti Morphology
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The surface morphologies of the C60/Ti layers were analyzed by atomic force microscopy (AFM microscope NTEGRA, NT-MDT) using a static (contact) mode. The scanning area was selected as 5 x 5 μm2.
3
Friction Behavior of Graphite Flake Heterojunctions
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As illustrated in Fig. 1A , the experimental setup is composed of a commercial AFM (NT-MDT, NTEGRA), a 100-μm piezoelectric scanning tube, a 100× objective lens with an aperture of 0.7 (Mitutoyu), a heating stage (NT-MDT, SU045NTF) with temperature ranging from room temperature to 150°C, and an environmental chamber. During the measurement process, a top visual tip (VIT-P/IR; nominal spring constant, 50 N/m) is used to press the SiO2 cap on the top of the graphite flake and slide the flake laterally relative to the mica substrate at a constant speed. For all the heterojunctions, the friction is measured as normal load increases first and then decreases, which is called loading and unloading processes, respectively. Limited to the spring constant of AFM tip, the range of the normal load is about 20 to 150 μN. The typical sliding displacement is 1 μm, and the sliding velocity is 1 μm/s. The friction dependence on sliding velocity is also measured under nitrogen atmosphere with a range of 0.1 to 10 μm/s. All the experiments are operated under one-line mode, i.e., the AFM tip is always conducted reciprocating motion along the same line. A standard calibration method is adopted for both normal (34 , 35 ) and friction (36 ) forces (fig. S1). After annealing, the friction is measured at room temperature (~28°C) under nitrogen atmosphere (RH of <5%).
4
Raman Characterization of Graphene Flakes
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Details with regards
to the structure and quality of the out-of-plane graphene flakes were
examined by Raman spectroscopy (NT-MDT NTEGRA). The representative
peaks in the Raman spectrum (Figure 2 b), i.e., D, G, and 2D peaks, confirm the existence
of graphene. The typical G band around 1580 cm–1 is generated by the E2g phonon at the center of the Brillouin
zone, while the 2D band at ∼2680 cm–1 representing
the double-resonant Raman scattering can be explained by the appearance
of juxtaposed single- to few-layer graphene flakes in the form of
high-density graphene flakes. The strong D band at ∼1340 cm–1 that indicates structural disorders and defects is
also observed. While the D band is generated from the one-phonon defect-assisted
process, the D + D′ band corresponds to a two-phonon defect-assisted
process.46 (link) For the out-of-plane graphene
flakes, the presence of edges causes translational symmetry breaking,
which results in the emergence of the D′ peak as a shoulder
to the G peak.
to the structure and quality of the out-of-plane graphene flakes were
examined by Raman spectroscopy (NT-MDT NTEGRA). The representative
peaks in the Raman spectrum (
of graphene. The typical G band around 1580 cm–1 is generated by the E2g phonon at the center of the Brillouin
zone, while the 2D band at ∼2680 cm–1 representing
the double-resonant Raman scattering can be explained by the appearance
of juxtaposed single- to few-layer graphene flakes in the form of
high-density graphene flakes. The strong D band at ∼1340 cm–1 that indicates structural disorders and defects is
also observed. While the D band is generated from the one-phonon defect-assisted
process, the D + D′ band corresponds to a two-phonon defect-assisted
process.46 (link) For the out-of-plane graphene
flakes, the presence of edges causes translational symmetry breaking,
which results in the emergence of the D′ peak as a shoulder
to the G peak.
5
Comprehensive Characterization of Generated Films
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Characterization of the generated films was performed by UV-vis light absorption, Raman spectroscopy and atomic force microscopy (AFM). For light absorption, the films were deposited on quartz slides following the procedure previously described and the spectra were measured by an UV-vis spectrophotometer (model 8453 from Agilent, Santa Clara, CA, USA). Raman spectroscopy measurements of the films deposited on the silicon substrates were performed by a Raman microscope (model Xplora, from Horiba, Kyoto, Japan) equipped with a 100 × 0.9 NA objective. The wavelength of the laser beam was 532 nm and the power was reduced to less than 1 mW to avoid damaging the sample. Film morphology was visualized with a scanning probe microscope (model NTEGRA, from NT-MDT, Apeldoorn, The Netherlands) equipped with supersharp silicon probes (model SSS-NCHR, from NANOSENSORSTM, Neuchatel, Switzerland) operated in semi-contact mode in air.
6
Surface Morphology Analysis by SPM
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To determine the surface morphology, SPM
measurements (fiber diameter,
average roughness) were performed using an NT-MDT-NTEGRA scanning
probe microscope with a positioning sensitivity of 2 μm and
resonance frequency in the range of 115–190 kHz. The average
roughness values were obtained after one-dimensional (1D) line fitting
and third-order surface subtraction of the raw images.
measurements (fiber diameter,
average roughness) were performed using an NT-MDT-NTEGRA scanning
probe microscope with a positioning sensitivity of 2 μm and
resonance frequency in the range of 115–190 kHz. The average
roughness values were obtained after one-dimensional (1D) line fitting
and third-order surface subtraction of the raw images.
7
Piezo-Response Force and Conductive AFM
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The measurements were carried out with a commercial atomic force microscope (NTEGRA from NT-MDT) equipped with a supplementary external lock-in amplifier (SR 830 from Stanford Research Systems) for the PFM measurements and a low noise current amplifier (DLPCA-200 from FEMTO Messtechnik GmbH) for the c-AFM measurements. The probes used were diamond coated (HA_HR_DCP from NT-MDT), exhibiting a tip radius of about 100 nm. For the PFM measurements, we applied an alternating voltage (f = some 10 kHz, Upp = 15 V) to the tip, and recorded the in-phase output channel of the lock-in amplifier. For the c-AFM measurements, we applied a DC voltage of 10–100 V to the Cr-bottom electrode, and the current was collected from the tip using the current amplifier. Typical scanning speed was set to few µm/s.
8
Morphological Analysis of Lyophilized Samples
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The morphology and structure of the samples were assessed using scanning electron microscopy (SEM) performed on a Hitachi TM 3000 Benchtop SEM instrument (Tokyo, Japan) operating at 15 kV acceleration voltage. Observations were carried out on fragile fractures (in liquid nitrogen) of samples lyophilized and sputter-coated with gold.
Observations at higher magnification were carried out with a commercial AFM (NTMDT) model NTEGRA in tapping mode. For AFM measurements, the oxidized PS sample was fixed on a glass slide with a double tape.
Observations at higher magnification were carried out with a commercial AFM (NTMDT) model NTEGRA in tapping mode. For AFM measurements, the oxidized PS sample was fixed on a glass slide with a double tape.
9
Atomic Force Microscopy of α-Synuclein Fibrils
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α-Syn fibrils formed in the presence and absence of 500 µM of each studied cation were also analyzed by atomic force microscopy. Briefly, 10 µl of 100 fold diluted α-Syn fibril samples were placed on a freshly cleaved mica and dried at room temperature. Then, the images were obtained in semicontact mode using an Atomic Force Microscopy (NTEGRA, NT-MDT, Russia) followed by processing the images by Nova software (version 1.26.0.1443). For each sample 23–27 measurements were performed.
10
Antibacterial Coatings for Surgical Blades
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Electrophoretic deposition of PBSNPs and CSNPs was performed on stainless steel surgical blades (No 15 Glassvan; DNP Enterprise, Gujarat, India) using procedure described earlier.31 To observe the PBSNP coating on surgical blades, atomic force microscopy (NTEGRA; NT-MDT, Moscow, Russia) was performed. Antibacterial activity of PBSNPs, CSNPs, and uncoated surgical blades (negative control) were tested on an MH agar plate spread with 100 μL of 0.2 OD600P. aeruginosa PAO1 cells and incubated overnight at 37°C. To ascertain the contribution of polymyxin B toward antibacterial activity, PBSNPs-coated surgical blade was treated with proteinase K (5 mg/mL) for 1 hour at 37°C followed by incubation with
P. aeruginosa cells on agar assay, as mentioned above.
P. aeruginosa cells on agar assay, as mentioned above.
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