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Agilent 7800 series

Manufactured by Agilent Technologies
Sourced in United States

The Agilent 7800 series is an inductively coupled plasma mass spectrometer (ICP-MS) designed for high-performance multi-element analysis. It features advanced technology to provide accurate, reliable, and efficient analysis of a wide range of sample types.

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3 protocols using agilent 7800 series

1

Quantification of Gadolinium in Solutions

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The samples were prepared as 0.5 grams maximum with the addition of 8 mL HNO3 and 2 mL H2O2 solution. After microwave decomposition, the samples were filtered using a 0.45 µm syringe filter and read by the device without a second dilution. Each reading indicated the average of 3 parallel readings. The ICP-MS Agilent 7800 series (Agilent Technologies, Tokyo Japan) was used to determine the concentration of the Gd element in the solution. Mass Hunter 4.2 Workstation (Software 7800 ICP-MS Top C.01.02) was used to calculate the measurements. The element concentrations were automatically calculated in parts per billion (ppb) by the software according to the formula given below. The ppb concentration values were converted to mg/kg and recorded for each sample. A detailed description of the analysis is given in Appendix 1.
Dilution factor = (final weight or volume/sample quantity or volume) × dilution coefficient
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2

Metal Ion Release from PB and ZnPB

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The release behaviour of Fe2+, Fe3+ and Zn2+ from PB (200 p.p.m.) and ZnPB (200 p.p.m.) was investigated in PBS (pH 7.4) at 37 °C at different time points (2 h, 12 h, 1 day, 3 days, 5 days and 7 days). The released Fe2+, Fe3+ and Zn2+ ions were detected by inductively coupled plasma atomic emission spectrometry (Optimal 8000, Perkin-Elmer, USA), inductively coupled plasma optical emission spectrometry (Agilent 700 Series) and inductively coupled plasma mass spectrometry (Agilent 7800 Series), respectively.
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3

Spectroscopic and Thermal Analysis Protocol

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UV spectra of isolated
compounds were recorded on a Shimadzu UV–vis spectrophotometer
(UV2600, Japan). IR spectra were recorded on an Agilent FT-IR spectrometer
(Cary 660 series, USA). Melting points were measured on the Buchi
melting point apparatus (M-565, Buchi, Switzerland). 1H
NMR and 13C NMR were recorded on an Avance Neo 500 MHz
FT-NMR Spectrometer (Bruker, Switzerland) at 500 and 125 MHz, respectively.
Chemical shifts were recorded in δ (ppm) values relative to
tetramethylsilane as an internal reference. Thermogravimetric analysis
TGA analysis was done using a Perkin Elmer simultaneous thermal analyzer
(STA 8000, USA) in the temperature range of 30 to 800 °C. High-resolution
mass spectra (HR-MS) were recorded on Waters Micromass Q-Tof Micro,
USA. Trace metal analysis was done on ICP-MS Agilent 7800 series (USA)
using pure helium gas. XRD analysis was carried out on a Panalytical
X’PERT PRO X-ray diffractometer at scattering angle (2θ)
versus intensity, step size 0.001°, working voltage 45 kV with
a Cu Kα Ni-filtered radiation (λ = 1.5406 Å). Elemental
analysis was performed on an Elementar CHNOS Analyzer (Vario MACRO
cube, Germany).
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