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Vacprep 061 sample degas system

Manufactured by Micromeritics

The VacPrep 061 sample degas system is a laboratory equipment designed to remove contaminants from solid samples prior to analysis. It utilizes a combination of heat and vacuum to degas the samples, preparing them for further characterization or testing.

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2 protocols using vacprep 061 sample degas system

1

BET Surface Area of Functionalized Nanodiamonds

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The Brunauer-Emmett-Teller (BET) specific surface area of functionalized diamond nanoparticles was determined from N2 adsorption/desorption isotherms obtained using a Micromeritics Gemini VII 2390 surface area analyzer. The pelleted nanodiamond was outgassed at 180°C under vacuum for 1 h using a Micromeritics VacPrep 061 sample degas system. The sample was subsequently introduced into the surface area analyzer and measured over the relative pressure range (P/P0) of 0.05-0.3, where P0 is the saturated pressure of N2.
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2

Characterization of Greenly Synthesized TiO2 NPs

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The morphology and elemental composition of the greenly synthesized TiO2 NPs were studied by scanning electron micrographs and X-Ray energy dispersion spectra, respectively, obtained with a JSM-6610-LV microscope, JEOL. Structural analysis of samples was performed using X-ray diffraction patterns collected in a D8 Avance A25 Bruker X-Ray diffractometer equipped with CuKα radiation. Textural properties of titania samples were determined by the N2 thermal adsorption measurements using TriStar II-3020 equipment, Micromeritics. Before the analysis, the samples were dried under vacuum (10–3 torr) at 300 °C for 3 h using a VacPrep 061-Sample degas system, Micromeritics. Obtained isotherms were analyzed via the Brunauer-Emmet-Teller (BET) and Barrett-Joyner-Halenda (BJH) models for the surface area and porosity determination, respectively. The optical characterization of the powder samples was determined by UV–Vis spectroscopy in diffuse reflectance mode using an UV-3600 Plus UV–VIS-NIR spectrophotometer, Shimadzu, equipped with an integrating sphere. The samples were placed in a quartz cell with 2 mm in the light path for the measurement. The electronic state of prepared samples was studied by the XPS technique with a PHOIBOS spectrometer, SPECS, with 150 WAL hemispherical energy analyzer and a monochromatic source (AlKα Xray, 1486.6 eV).
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