Jsm 6490lv
The JSM-6490LV is a scanning electron microscope (SEM) manufactured by JEOL. It is designed for high-resolution imaging and analysis of a wide range of samples. The JSM-6490LV features a high-performance electron optical system and advanced imaging capabilities, providing users with detailed information about the surface and internal structure of their samples.
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177 protocols using jsm 6490lv
Morphological Characterization of RGO and RGO/Alg Scaffolds
Scanning Microscopy Analysis of Oyster Mushroom Colonization on Plastic Sheets
Last, atomic force microscopy (AFM), [49 (link),84 (link)] and scanning electrom microscopy (SEM), [35 (link),73 (link)], were used to study surface changes (roughness and topography). Nanosurf ™ easyscan 2 contact mode was employed for AFM. Parameter were: size: 61.8 μm, Set point: 20 nN; P-Gain: 1000; I-Gain: 100; D-Gain: 0. For roughness calculation, three measurements at different locations of the sample were carried-out, and mean ± SD was determined according to
Additionally, SEM (Jeol™ JSM 6490LV) with a 10 kV to 20kV potency SEI signal and 500 and 6,500 X was used to characterize surfaces.Servicecontractedthrough Universidad de los Andes (UNIANDES), Bogotá, Colombia. Samples were coated with gold in Denton Vacuum Desk IV preparation system.
Characterization of UISeNPs by SEM and EDX
The energy-dispersive X-ray (EDX) analysis was performed using a JSM 6490 LV (JEOL) instrument operated at 200 kV in order to determine the elemental compositions of the particles. Images were captured at magnifications of 50 and 100 kV.
Characterization of Micelle Morphology
Characterizing AgNP Composite Structure
SEM Examination of CCB Fracture Surface
SEM Imaging of Polymer Scaffold Degradation
Formation and Characterization of K. pneumoniae Biofilms
Characterization of PEO Coatings
The surface roughness was measured with the TR-220 profilometer (TIME Group Inc, Beijing, China). The coating porosity was assessed with Image J software from the SEM images following the ASTM E112-10.
The phase composition of the surface layer was characterized by X-ray diffractometer Rigaku Ultima IV (Rigaku, Tokyo, Japan) in CuKα radiation at 40 kV and 40 mA using 0.02 deg. step scan with 2 s exposure, from 25 to 80 degrees 2θ. Further, the XRD spectra were processed using X’Pert Highscore Plus 3.0 (PANalytical B.V., Almelo, The Netherlands) software with PDF2 pattern database; a built-in SemiQuant algorithm was employed to quantify the amounts of the crystalline phases in the coating.
The tribological properties were tested by a pin-on-disc Nanovea TRB-1 tribometer (Nanovea, Inc., Irvine, CA, USA) at a normal load of 2 N against a 6 mm diameter Al2O3 ball at a room temperature. The sliding speed was 0.1 m/s for a distance of 200 m.
Bacterial Pellicle Sampling Using Activated Carbon Cloth
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