Geminisem 300
The GeminiSEM 300 is a scanning electron microscope (SEM) developed by Zeiss. It is designed to provide high-resolution imaging and analysis of a wide range of materials. The GeminiSEM 300 utilizes a field emission electron source and advanced optics to deliver high-quality images with low accelerating voltages.
Lab products found in correlation
295 protocols using geminisem 300
Scanning Electron Microscopy of Egg Shells
Characterization of 6ReS2–Nb2CTx Composite
Characterization of Al/ZnO Heterostructures
Ultrastructural Changes of Duodenum
Characterization of Novel Materials
Angular-Resolved THz Spectroscopy of Hybrid Metastructures
The morphology of the metastructure is characterized by field emission scanning electron microscopy (SEM, ZEISS GeminiSEM 300, ZEISS, Jena, Germany). Graphene properties are characterized by Raman spectroscopy (Laboratory Ram HR800, CA, USA, excitation wavelength at 532 nm). The electrical properties of the device are measured using a sourcemeter (Agilent 2400 and 2401).
Characterization of Electrospun Fibers by SEM
Starch Granule Morphology Analysis
Multimodal Analysis of Plant Roots
The root samples of HM and PH groups were collected, embedded in resin, then sliced into 5 μm slices by a slicer (LKB Bromma ultratome pyramitome 11800, Stockholm, Sweden). Subsequently, the ultrathin section was map-scanned by a micro-confocal Raman spectrometer (inVia-Reflex 532/XYZ, Renishaw, London, UK).
Scanning Electron Microscopy Imaging of Wafers
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