In addition, a dispersive energy X-ray (EDS) detector (Carl Zeiss, Gemini Sigma 300 VP, Oberkochen, Germany) operating at 10 KeV was used to determine the surface atomic composition of the decellularized bone scaffolds. Three random areas of interest were evaluated for each sample.
Gemini sigma 300 vp
The Gemini Sigma 300 VP is a high-performance scanning electron microscope (SEM) developed by Zeiss. It is designed for materials science and industrial applications, providing users with advanced imaging and analytical capabilities. The Gemini Sigma 300 VP utilizes a field emission electron gun and a variable pressure mode, allowing it to examine a wide range of sample types, including non-conductive and outgassing specimens, without the need for extensive sample preparation.
Lab products found in correlation
4 protocols using gemini sigma 300 vp
Scaffold Structure and hMSC Morphology Evaluation
In addition, a dispersive energy X-ray (EDS) detector (Carl Zeiss, Gemini Sigma 300 VP, Oberkochen, Germany) operating at 10 KeV was used to determine the surface atomic composition of the decellularized bone scaffolds. Three random areas of interest were evaluated for each sample.
Surface Characterization of Zirconia Ceramics
Geochemical Analysis of V-Bearing Deposits
samples for this research were collected from the V-bearing
deposits at the Bagong section, Sansui, Guizhou Province. The sample
used for elemental analysis was ground to 200 mesh powder, then fully
mixed with Li2B4O7-LiBO2 flux, and melted at 1000 °C. After the molten material was
cooled, dilute HNO3 and dilute HCI were added for dissolution,
and then analysis by X-ray fluorescence spectroscopy (XRF) was performed.
The type of instrument used for analysis is PANanalytical PW2424.
The content of some elements was also analyzed by inductively coupled
plasma mass spectrometry (ICP-MS). The analysis was conducted at ALS
Chemex (Guangzhou) Co. Ltd.
The data of TOC are calculated on
loss on ignition (LOI). The conversion
relationship between LOI and TOC is:
We used 2.125 as the conversion
factor between LOI and TOC in this
study; this conversion factor is based on the study of Qiu et al.55 Samples with high V content (samples shyc-2,
shyc-6, and shyc-7)
were picked out for scanning electron microscopy (SEM) and energy
dispersive spectroscopy (EDS) analyses. These samples were treated
by desiccation and gold spraying, SEM was used for the analysis of
morphology, and EDS was used for determination of chemical elements
in different minerals. The model of SEM-EDS was Zeiss Gemini Sigma
300 VP, and all samples were scanned in Guizhou University.
Characterizing MOF Film Sorption Properties
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