The largest database of trusted experimental protocols

8 protocols using jsm 700f

1

Characterization of ABBSC Material

Check if the same lab product or an alternative is used in the 5 most similar protocols
X-ray
diffraction of the sample was recorded using a Bruker D8
Advance X-ray diffractometer (Cu–K radiation (λ = 1.5406
Å)). Utilizing WITec Raman spectroscopy, green laser light (λ
= 532 nm) with an excitation energy of 2.33 eV was employed to get
Raman spectra. By using JEOL-JEM-2011(200 kV) and JEOL-JSM-700F instruments,
we studied the field emission scanning electron microscopy (SEM) and
transmission electron microscopy (TEM) images, respectively. Using
the Barrett–Joyner–Halenda (BJH) and Brunauer–Emmett–Teller
(BET) procedures, the ABBSC material pore diameter and specific surface
area were determined by using Autosorb iQ, Quantachrome, USA. Cyclic
voltammetry (CV) was performed at a scan rate of 0.05 mV s–1 and within the potential window of 0.01–3.0 V by using a
Biologic Science Instrument VMP3 multichannel potentiostat–galvanostat
system. However, electrochemical impedance spectroscopy (EIS) measurements
were carried out at room temperature at an amplitude voltage of 10
mV and a frequency range of 10 kHz to 100 mHz utilizing a Biologic
VSP electrochemical workstation.
+ Open protocol
+ Expand
2

Mg-Zn-Ca Alloy Fabrication and Characterization

Check if the same lab product or an alternative is used in the 5 most similar protocols
Mg-Zn-Ca master alloys were prepared by arc-melting under vacuum (better than 3.0 × 10−3 Pa) mixing constituent elements of high purity (Mg 99.98 wt.%, Zn 99.9 wt.%, and Ca 99.5 wt.%). Ribbon specimens of the composition Mg93−xZnxCa7, where x = 3, 13, 23, 33, 43, 53, 63, and 73, were fabricated by ejecting molten master alloys under pressure of purified Ar through an orifice on the surface of a rotated cooper wheel. Ribbons were about 50 µm thick, 5 mm wide, and 100 mm long. The final chemical composition of the as-prepared ribbons was determined by energy-dispersive X-ray microanalysis, employing a scanning electron microscopy Jeol JSM 700F (JEOL Ltd., Akishima, Japan) with an accelerating voltage of 15 keV.
Mechanical properties such as elastic modulus and hardness were obtained using a nano-indentation tester, TTX-NHT S/N:01-03730 CSM Instruments (Lausanne, Switzerland), using a Berkovich pyramid diamond tip. In total, 20 indentations were performed and the final data were statistically evaluated.
The mass density of as-prepared materials was determined using a helium pycnometer, AccuPyc II 1340.
Thermal analysis measurements were performed using a Perkin-Elmer differential scanning calorimeter, DSC 8500 (PerkinElmer, Waltham, MA, USA), at a heating rate of 10 °C/min. The baseline was modelled using a polynomial function of the fifth order and then subtracted from the raw data.
+ Open protocol
+ Expand
3

Comprehensive characterization of advanced carbon materials

Check if the same lab product or an alternative is used in the 5 most similar protocols
The morphological, elemental and chemical composition, and structure of the ACs were characterized using field emission scanning electron microscopy (FE-SEM, JEOL JSM-700F), X-ray photoelectron spectroscopy (XPS, PHI Quantera II) and Raman spectroscopy with a laser wavelength of 532 nm (Thermo Scientific DXR SmartRaman), respectively. Nitrogen adsorption–desorption isotherm measurements were performed by degassing at 350 °C for 12 h using a gas adsorption analyzer (Micromeritics ASAP 2020). The Brunauer–Emmett–Teller (BET) surface area was analyzed from the nitrogen adsorption isotherms, while the pore size distribution and pore volume were calculated via the density functional theory (DFT) method. The Hall effect measurement was utilized to characterize the carrier density of ACs using van der Pauw method, employing a four-point probe under a magnetic field of 0.2 T with a sample dimension of 10 mm diameter and 0.3 mm thickness (KEITHLEY 6221 DC and AC current source and 2182 NANOVOLTMETER).
+ Open protocol
+ Expand
4

Characterization of Synthesized Materials

Check if the same lab product or an alternative is used in the 5 most similar protocols
The crystal structure of the synthesized materials were characterized with a powder X-ray diffraction instrument (XRD, D/Max–2500, Rigaku). The morphology and microstructure were examined by scanning electron microscopy (FE-SEM, JEOL–JSM 700F). The chemical composition was characterized using energy dispersive X-ray spectroscopy (EDS). TEM and HRTEM images were obtained with a Tecnai G2 F20 instrument. The UV–vis diffuse reflectance spectra were captured by a Shimadzu UV–2550 UV–vis spectrophotometer using BaSO4 as a reference in the wavelength region of 200–800 nm. Photoluminescence (PL) spectra were measured at room temperature on a Renishaw 1000 Raman system using a 325 nm laser.
+ Open protocol
+ Expand
5

Nanowire Structural Characterization

Check if the same lab product or an alternative is used in the 5 most similar protocols
Surface morphology of the nanowire structures was investigated by field emission scanning electron microscopy (FESEM; JEOL, JSM-700F) and transmission electron microscopy (TEM), scanning TEM (STEM), and high-resolution TEM (HR-TEM). The structural properties were investigated by X-ray diffraction (XRD; Rigaku D/MAX-RC) using Cu Kα radiation with a Ni filter. The electronic structure of the surface of samples was elucidated by X-ray photoelectron spectroscopy (XPS; VGMultilab 2000; Thermo VG Scientific, UK).
+ Open protocol
+ Expand
6

Surface Morphology and Composition Analysis

Check if the same lab product or an alternative is used in the 5 most similar protocols
AFM (AFM JPK NanoWizard II) and FESEM
(JSM-700F, JEOL) were used to analyze the surface morphology of the
samples and measure the thickness of the PAA layer. XPS study was
performed using an Al Kα X-ray source (MultiLab 2000, Thermo)
with a spot size of 0.5 μm2. FTIR spectra were obtained
using a Thermo Scientific Nicolet 6700 spectrometer.
+ Open protocol
+ Expand
7

Comprehensive Materials Characterization Protocol

Check if the same lab product or an alternative is used in the 5 most similar protocols
The crystallinity of samples was detected using an X-ray diffraction (XRD) diffractometer (Bruker D8 Advance, Karlsruhe, Germany), equipped with a mono Cu Kα (λ = 1.541874 Å). And the version of measurement software was V6.5.0 (32 Bit) (Bruker AXS, Karlsruhe, Germany). Moreover, a UV-vis-NIR spectrometer (UV-3600, Shimadzu, Kyoto, Japan) was used to measure diffuse reflectance spectra (DRS) of the samples. The X-ray photoelectron spectroscopy (XPS; Nexsa, ThermoFisher, Waltham, MA, USA) was used to determine the chemical compositions and the valence potential of the as-prepared samples. The morphologies of the samples were measured using scanning electron microscopy (SEM; JSM-700F, JEOL, Akishima, Japan), transmission electron microscopy (TEM; FEI Talos F200s, ThermoFisher, Waltham, MA, USA) and high-resolution TEM (HRTEM; FEI Talos F200s, ThermoFisher, Waltham, MA, USA). The elements were confirmed through energy dispersive spectrometer (EDS; FEI Talos F200s, USA). The existence of free radicals was tested through an electron paramagnetic resonance (EPR) spectrometer (Bruker A300, Bruker, Munich, Germany)
+ Open protocol
+ Expand
8

Pressure-Assisted Perovskite Solar Cell Characterization

Check if the same lab product or an alternative is used in the 5 most similar protocols
Plots of current density against voltage (J-V) were obtained for the fabricated perovskite solar cells. These were measured (before and after the pressure treatment) using a Keithley SMU2400 system (Keithley, Tektronix, Newark, NJ, USA) that was connected to an Oriel simulator (Oriel, Newport Corporation, Irvine, CA, USA) under AM1.5 G illumination of 100 mW cm−2. The J-V curves of devices (with zero pressure) were first measured before subsequent J-V measurements of the devices that were subjected to applied pressures of 0–10 MPa.
The optical absorbances of the as-prepared and pressure-assisted perovskite layers were measured using an Avantes UV-Vis spectrophotometer (AvaSpec-2048, Avantes, BV, USA). The X-ray diffraction patterns of as-prepared and pressure-assisted perovskite layers were also obtained using an X-ray diffractometer (Malvern PANalytical, Westborough, MA, USA). The microstructural changes of the as-prepared and pressure-assisted perovskite layers were also observed using field emission scanning electron microscope (SEM) (JEOL JSM-700F, Hollingsworth & Vose, MA, USA).
+ Open protocol
+ Expand

About PubCompare

Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.

We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.

However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.

Ready to get started?

Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required

Sign up now

Revolutionizing how scientists
search and build protocols!