The largest database of trusted experimental protocols

109 protocols using tm3030plus

1

Scanning Electron Microscopy of Fractured Samples

Check if the same lab product or an alternative is used in the 5 most similar protocols
The fracture surfaces of the samples were morphologically evaluated using scanning electron microscopy (SEM) (TM3030Plus, Hitachi, Tokyo, Japan). The dried samples were sectioned when exposed to N2 (gaseous) atmosphere, and they were sputter-coated with silver (Ag0) (SCD005 Sputter Coater BAL-TEC, sample exposition for 150 s) and examined in a TM3030Plus Hitachi at CETEM. (Centre of Mineral Technology, Rio de Janeiro, São Paulo, Brazil) operating under high vacuum at 15 kV. The images were acquired in the backscattered electron mode (BSE).
+ Open protocol
+ Expand
2

Particle Characterization via SEM Imaging

Check if the same lab product or an alternative is used in the 5 most similar protocols
Scanning electron microscope images were taken of all powders and mixtures using a Hitachi TM3030Plus (Hitachi, Tokyo, Japan) for the mixtures and a Zeiss 1530 (Carl Zeiss GmBH, Oberkochen, Germany) for the APIs. A few scoop sampled particles were sprinkled over a carbon tape followed by gentle tapping to remove excess powder. The samples were then gold coated using a Cressington 108 auto sputter-coater (Cressington Scientific, Watford, UK). The Hitachi TM3030Plus was operated at an acceleration voltage of 5 kV with images captured at 100-500× magnification using a mixed BSE/SE detector. The Zeiss 1530 was operated at an acceleration voltage of 2.5 kV with images captured at 5-10kx magnification using an InLens detector.
To estimate the point of self-agglomeration, light microscope images were taken of mixtures when larger self-agglomerates started to visually appear in the blends. The images were taken using a Zeiss SteREO Discovery.V8 (Carl Zeiss GmBH, Oberkochen, Germany) at 1× magnification.
+ Open protocol
+ Expand
3

Microstructural Analysis of ADNFRC

Check if the same lab product or an alternative is used in the 5 most similar protocols
A high resolution scanner (Epson Expression 11000XL, Epson, Shinjuku, Tokyo) was used to acquire high resolution images of the ADN preforms. An optical microscope (Zeiss Axio Imager M2, Carl Zeiss AG, Oberkochen, Germany) and a scanning electron microscope (Hitachi TM3030Plus, Hitachi, Ltd., Tokyo, Japan) were used to analyse fibre length distributions, cross-sections, and fracture surfaces of the ADNFRC. Cold mounting followed by standard wet grinding and polishing for polymer matrix composites was applied to make the specimens, for cross-section analysis of each ADNFRC under the microscope. The figures of the specimens were shown in Section 3.1 and Section 3.3, and Supplementary Materials.
+ Open protocol
+ Expand
4

SEM Imaging of Platinum-Coated Samples

Check if the same lab product or an alternative is used in the 5 most similar protocols
SEM printlet images were obtained using a scanning electron microscope HITACHI TM3030 Plus (Hitachi, Tokyo, Japan) with an acceleration voltage of 15 kV. Samples were fixed on a support using a double-sided adhesive and covered with platinum using a high-resolution SEM coated spray Polaron SC7640 (Quorom Technologies, Lewes, UK).
+ Open protocol
+ Expand
5

Elemental Analysis of Microscope Slides

Check if the same lab product or an alternative is used in the 5 most similar protocols
The microscope slides were placed on the wide stage of the specimen holder using adhesive conductive tape and then placed in a low-vacuum SEM (TM4000Plus or TM3030Plus, Hitachi High-Tech, Tokyo, Japan) operating at 15 kV. Elemental analysis was performed by using an EDX detector equipped for low-vacuum SEM.
+ Open protocol
+ Expand
6

Preparation for Scanning Electron Microscopy

Check if the same lab product or an alternative is used in the 5 most similar protocols
Samples were fixed in 4% formaldehyde for 24 h and dehydrated with increasing concentrations of ethanol (30%, 50%, 70%, 90%, and 100%) for 10 min each and then treated with hexamethyldisilane (Sigma-Aldrich) overnight for further water extraction. Dehydrated samples were then mounted on aluminium stubs with double sided carbon tape (Agar Scientific, Essex, UK), and imaged with a tabletop scanning electron microscope (TM3030Plus, Hitachi Hightech, Tokyo, JP) at appropriate magnifications.
+ Open protocol
+ Expand
7

Orchid Seed Ultrastructure Imaging

Check if the same lab product or an alternative is used in the 5 most similar protocols
B. striata seeds were mounted on a carbon tape and observed using a low vacuum SEM (TM3030Plus; Hitachi High-Technologies Corporation, Tokyo, Japan). The intact seeds co-cultured with Tulasnella sp. or S. vermifera were collected by tweezers and some of the intact seeds had their seed coat removed just before the SEM observation under a stereomicroscope (SZX16; Olympus).
+ Open protocol
+ Expand
8

SEM Imaging of Angled MN Patches

Check if the same lab product or an alternative is used in the 5 most similar protocols
The MN patches were mounted on 45°-angled aluminum stubs using double-sided carbon adhesive tape (Nisshin EM, Tokyo, Japan) and imaged using SEM (TM3030Plus, Hitachi High-Tech, Tokyo, Japan) at 50× magnification.
+ Open protocol
+ Expand
9

Characterizing Ultramarine Blue in Thermoplastics

Check if the same lab product or an alternative is used in the 5 most similar protocols
Scanning electron microscope (SEM, TM3030Plus, Hitachi High-Technologies Corporation, Tokyo, Japan) and energy dispersive X-ray spectrometer (EDS, QUANTAX 70, Bruker Japan K.K., Tokyo, Japan) were used to observe the dispersion of ultramarine blue pigment on the surface of injection molded colored thermoplastics. The secondary electron images and EDS element mapping were analyzed.
+ Open protocol
+ Expand
10

Scanning Electron Microscopy of Freeze-Dried Samples

Check if the same lab product or an alternative is used in the 5 most similar protocols
Morphology was assessed using a low-vacuum scanning electron microscope (SEM) (TM3030Plus tabletop microscope; Hitachi High-Technologies, Japan) after freeze-drying the samples. SEM analysis was performed at EDX to obtain images at 600× magnification with a scattering and backscattering electron signal. The distance between granules was analyzed using the open-source software ImageJ (National Institutes of Health, USA).
+ Open protocol
+ Expand

About PubCompare

Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.

We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.

However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.

Ready to get started?

Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required

Sign up now

Revolutionizing how scientists
search and build protocols!