Tm3030plus
The TM3030Plus is a scanning electron microscope (SEM) produced by Hitachi. It is designed for high-resolution imaging and analysis of a wide range of materials. The TM3030Plus features a compact and user-friendly design, and offers a range of advanced capabilities for both research and industrial applications.
Lab products found in correlation
109 protocols using tm3030plus
Scanning Electron Microscopy of Fractured Samples
Particle Characterization via SEM Imaging
To estimate the point of self-agglomeration, light microscope images were taken of mixtures when larger self-agglomerates started to visually appear in the blends. The images were taken using a Zeiss SteREO Discovery.V8 (Carl Zeiss GmBH, Oberkochen, Germany) at 1× magnification.
Microstructural Analysis of ADNFRC
SEM Imaging of Platinum-Coated Samples
Elemental Analysis of Microscope Slides
Preparation for Scanning Electron Microscopy
Orchid Seed Ultrastructure Imaging
SEM Imaging of Angled MN Patches
Characterizing Ultramarine Blue in Thermoplastics
Scanning Electron Microscopy of Freeze-Dried Samples
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