The microstructure of these samples were investigated using scanning electron microscopy (SEM, ZEISS Merlin, Oberkochen, Germany) and transmission electron microscopy (TEM, JEM-2100, JEOL Ltd., Tokyo, Japan). The crystalline structure of the electrode materials was determined using an X-ray diffractometer (XRD, D/max-IIIA with nickel-filtered Cu Kα radiation (λ = 0.15418 nm), Rigaku Corporation, Tokyo, Japan). X-ray photoelectron spectroscopy (XPS) was conducted on an AMICUS (Shimadzu, Japan) spectrometer with monochromated Mg Kα radiation. The nitrogen sorption measurements were carried out using an ASAP 2020 analyzer (Micromeritics, Georgia, GA, USA). The Raman spectra were recorded on a Raman Spectrometer (HORIBA Jobin Yvon, Paris, France).
Amicus
Manufactured by Shimadzu
Sourced in Japan
AMICUS is a high-performance liquid chromatography (HPLC) system designed for a wide range of applications in analytical chemistry. It features advanced technology and functionality to provide reliable and efficient separation and analysis of various samples.
Automatically generated - may contain errors
Lab products found in correlation
D max iiia, by Rigaku (1 mentions)
Jem 2100, by JEOL (1 mentions)
Raman spectrometer, by Horiba (1 mentions)
Elexsys 500 spectrometer, by Bruker (1 mentions)
Ftir1650 spectrophotometer, by Shimadzu (1 mentions)
Em208s 100kv, by Philips (1 mentions)
Uv 2550, by Shimadzu (1 mentions)
Miniflex 600, by Rigaku (1 mentions)
2 protocols using amicus
1
Comprehensive Microstructural and Structural Analysis
2
Characterization of TiO2/β-Bi2O3 Nanocomposite
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The crystal structure of the TiO2/β-Bi2O3 nanocomposite synthesized by the Rigaku MiniFlex 600 (XRD) radiation diffract meter was investigated using Cu Ka radiation as the X-ray source. Fourier transform infrared (FTIR) spectroscopy (Shimadzu, FTIR 1650 spectrophotometer, Japan) were also applied to determine the chemical features of the nanocomposite. X-ray photoelectron (XPS) spectroscopy was performed using AMICUS, Kratos Analytical (Shimadzu) spectroscopy to investigate the oxidation state and chemical environment of the elements in the sample. The morphology and morphology of the samples were studied by a field diffusion scanning electron microscope (FESEM; JEOLJSM-7600F) equipped with an energy scattering spectrometer (EDS). The detailed study of the structure and size of nanoparticles was performed using TEM analysis (Philips EM208S 100KV). Nanocomposite topography was determined using atomic force microscopy (AFM). Ultraviolet reflection spectrum (DRS) was recorded on UV–Vis spectroscopy (Shimadzu, UV-2550, Japan). The Brunauer-Emmett-Teller (BET) surface area and sample pore size distribution were studied in the N2 adsorption analyzer (NOVA 2000e) the USA. Active free radicals were determined using electron paramagnetic resonance (EPR) in a Bruker ELEXSYS 500 spectrometer.
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