TEM was carried out using a JEOL-3010 microscope, operating at 300 kV (Cs 0.6 mm, resolution 1.7 Å). Images were recorded using a CCD camera, using a low-dose condition.
3010 microscope
Manufactured by JEOL
The JEOL-3010 is a high-resolution transmission electron microscope (TEM) designed for advanced materials analysis. The microscope features a LaB6 electron source and a 300 kV accelerating voltage, providing high-resolution imaging capabilities. The JEOL-3010 is equipped with various analytical tools, including energy-dispersive X-ray spectroscopy (EDS) and electron energy-loss spectroscopy (EELS), enabling comprehensive materials characterization.
Automatically generated - may contain errors
Lab products found in correlation
Tecnai g2 f20 tem, by Thermo Fisher Scientific (1 mentions)
Ccd camera, by Ametek (1 mentions)
3600 uv vis nir spectrophotometer, by Shimadzu (1 mentions)
Zetasizer nano zs90, by Malvern Panalytical (1 mentions)
Ir prestige 21 spectrophotometer, by Shimadzu (1 mentions)
F 7000 fl spectrophotometer, by Hitachi (1 mentions)
Asap 2010 sorptometer, by Micromeritics (1 mentions)
Zetasizer nano instrument, by Malvern Panalytical (1 mentions)
Fluoview fv300, by Olympus (1 mentions)
6 protocols using 3010 microscope
1
TEM Imaging of Nanomaterials
2
Synthesis of Cu/Au/Pt Trimetallic Nanoparticles
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Generally, 12 μL of 0.1 M CuSO4 and 25 μL of 0.1 M sodium citrate were added into 10 mL of water. Afterward, 0.5 mL of freshly prepared NaBH4 (25 mM) was rapidly injected into the mixture above. About 15 min later, the mixed solution was added with the mixture of 25 μL HAuCl4 (0.1 M) and 25 μL K2PtCl4 (0.1 M) and kept stirring for 20 min. The final Cu/Au/Pt TNPs solution was stored at room temperature before its further application. X-ray energy-dispersive spectroscopy (EDS) and high-resolution transmission electron microscopy (HRTEM) were performed on a JEOL-3010 microscope operating at an accelerating voltage of 200 kV. The elemental mapping of Cu/Au/Pt TNPs was analyzed on Titan G2 microscope at an accelerating voltage of 300 kV. All TEM samples were deposited on Mo supporting film and dried overnight before examination.
3
Characterization of Ferroelectric Domains using DF-TEM
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DF-TEM imaging was performed on the 300-keV JEOL 3010 microscope. Cross-sectional TEM specimens were collected as shown above. The samples were tilted off the crystallographic zone axis, and imaging was performed in a two-beam condition, where the diffracted [200] beam was aligned to the optical axis. In the bright field–TEM (and DF-TEM) images such as that observed in Fig. 3A , we observe stripes at a 45° angle, corresponding to the distortion observed in Fig. 2B . We also observe horizontal and vertical stripes corresponding to the dumbbell structure as that observed in Fig. 2C . This interpretation was confirmed with high-resolution HAADF-STEM region imaging of identical regions. We also observe contrast from the ferroelectric domains. Here, the domains form arrays that could also be imaged in high resolution (analogous to the case of (BiFeO3)15/(SrTiO3)15).
4
In-situ TEM Characterization of CrCoNi MEA
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Samples for this study were extracted from a previously produced nominally equiatomic CrCoNi MEA whose microstructure and mechanical properties were reported in a recent paper8 (link) where details of its processing and mechanical characterization can be found. Atomic structures were investigated using the aberration-corrected TEAM0.5 transmission electron microscope (operating at 200 kV), housed at the National Center for Electron Microscopy at the Lawrence Berkeley National Laboratory (LBNL), and the in situ compression tests were performed using a Hysitron PI95 nanoindenter in a JEOL 3010 microscope at 300 KV. The nanopillars for the in situ compression tests were produced using focused-ion beam techniques; details of sample preparation and in situ compression have been described in previous studies65 (link)66 (link). The in situ TEM tensile tests were conducted at room temperature using a Gatan model 654 single-tilt straining holder in an FEI Tecnai G2 F20 TEM operating at 200 kV. Roughly 12 samples, thinned by jet polishing and well attached to the substrate, were selected for in situ tensile straining and detailed TEM investigation as described in a previous paper22 (link). Time-resolved TEM and HRTEM images of the regions of interest were recorded with a Gatan CCD camera at 10 frames per second.
5
Comprehensive Characterization of Carbon-Based Quantum Dots
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Fluorescence spectral measurements
were carried out using a JASCO spectrofluorometer (FP-8500) set with
excitation and emission slit widths at 2.5 nm. UV–vis spectral
studies were conducted on a Shimadzu UV–vis–NIR 3600
spectrophotometer. Fluorescence decay analysis was done on a Fluoro
Cube, Lifetime System (Horiba Jobin Yvon) with a 370 nm Nano LED excitation
source. Transmission electron microscopy (TEM) images were acquired
on a JEOL 3010 microscope operating at an accelerating voltage of
200 kV by drop-casting a proper dilution of CBCDs aqueous solution
onto the carbon-coated copper grids. X-ray photoelectron spectroscopy
(XPS) measurements were carried out by Kratos AXIS Ultra spectrometer
with Al Kα X-ray as the excitation source (1486.71 eV). Fourier
transform infrared (FTIR) spectrum was recorded on a Shimadzu IR Prestige-21
spectrophotometer. ζ potential measurements were conducted using
a Malvern, Nano ZS90 Zetasizer. Raman spectra were measured with a
Horiba Jobin Yvon LabRAM HR with a focal length of 800 mm and equipped
with a He–Ne 633 nm Laser. X-ray diffraction (XRD) patterns
of CBCDs were obtained using an X’pert Pro powder X-ray diffractometer
(the Netherlands) with Cu Kα radiation, λ = 1.5406 Å.
were carried out using a JASCO spectrofluorometer (FP-8500) set with
excitation and emission slit widths at 2.5 nm. UV–vis spectral
studies were conducted on a Shimadzu UV–vis–NIR 3600
spectrophotometer. Fluorescence decay analysis was done on a Fluoro
Cube, Lifetime System (Horiba Jobin Yvon) with a 370 nm Nano LED excitation
source. Transmission electron microscopy (TEM) images were acquired
on a JEOL 3010 microscope operating at an accelerating voltage of
200 kV by drop-casting a proper dilution of CBCDs aqueous solution
onto the carbon-coated copper grids. X-ray photoelectron spectroscopy
(XPS) measurements were carried out by Kratos AXIS Ultra spectrometer
with Al Kα X-ray as the excitation source (1486.71 eV). Fourier
transform infrared (FTIR) spectrum was recorded on a Shimadzu IR Prestige-21
spectrophotometer. ζ potential measurements were conducted using
a Malvern, Nano ZS90 Zetasizer. Raman spectra were measured with a
Horiba Jobin Yvon LabRAM HR with a focal length of 800 mm and equipped
with a He–Ne 633 nm Laser. X-ray diffraction (XRD) patterns
of CBCDs were obtained using an X’pert Pro powder X-ray diffractometer
(the Netherlands) with Cu Kα radiation, λ = 1.5406 Å.
6
Characterization of Mesoporous Silica Nanoparticles
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Transmission electron microscopy (TEM) images were obtained on a JEOL 3010 microscope. A small angle powder X-ray diffraction pattern of the MSN materials was obtained in a Scintag XDS-2000 powder diffractometer. N2 adsorption−desorption isotherm was obtained at 77 K on a Micromeritics ASAP 2010 sorptometer by static adsorption procedures. Zeta potential experiments were performed using a Malvern ZetaSizer Nano instrument. All fluorescence spectra were recorded on a Hitachi F-7000 FL spectrophotometer in PBS buffer. The confocal laser scanning microscopy (CLSM) images were obtained on a FluoView FV300, Olympus.
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