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Micromax 002 ccd diffractometer

Manufactured by Rigaku
Sourced in United States

The MicroMax-002+ CCD diffractometer is a laboratory X-ray instrument designed for single-crystal X-ray diffraction analysis. The core function of this product is to collect high-quality, low-noise X-ray diffraction data from small single-crystal samples. It utilizes a CCD (Charge-Coupled Device) detector to capture the diffraction patterns generated by the interaction between the sample and the X-ray beam.

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2 protocols using micromax 002 ccd diffractometer

1

X-ray Diffraction Structural Analysis

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The X-ray diffraction experiments were carried out on a Rigaku MicroMax-002+ CCD diffractometer with Cu radiation (λ=1.54178 Å) at 293 K (Rigaku, Americas, the Woodlands, Texas, USA). Absorption correction and integration of the collected data were handled using the CrystalClear software package (Rigaku Americas). The crystal structures were solved by the direct method followed by Fourier syntheses with SHELXS–97 and then refined by full-matrix least-squares procedures using SHELXL–97 on F2 with anisotropic displacement parameters (ADPs) for non-hydrogen atoms. The H atoms were placed in calculated positions and included in the final cycles of refinement in the riding modes21 (link). To help data convergence, some restraints were introduced to the refinement of disorders22 . The PLATON program with the probe radius of 1.2 Å was also employed to calculate the volume of the channels where the solvents resided in an asymmetric unit of solvates23 (link).
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2

Single Crystal X-Ray Diffraction Analysis

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Samples were analyzed on a Rigaku MicroMax-002+ CCD
diffractometer with Cu–Kα radiation (λ = 1.54178
Å) (Rigaku, Americas, the Woodlands, Texas). Absorption correction
and integration of the collected data were handled using the CrystalClear
software package (Rigaku Americas). The crystal structures were resolved
using the Olex2 (link) crystallography software
platform.19 (link) Structure determination was
achieved by direct method, followed by Fourier synthesis with SIR2008.20 (link) The refinement on F2 was performed via the full-matrix least-squares procedures in SHELXL.21 (link) For non-hydrogen atoms, anisotropic displacement
parameters (ADPs) were introduced, whereas hydrogen atoms were refined
isotropically with an isotropic atomic displacement parameter (Uiso) that is 1.2 times the value of the parent
atom. Those from the methyl or hydroxyl groups were assigned 1.5 times
that of the parent atom. The hydrogen atoms were placed in ideal positions
and refined using the riding model, whereas hydrogen atoms involved
in the hydrogen bonding were detected in the experimental electron
density map and refined freely. Refinement of disorders with restraints
was introduced to help data convergence.22 (link)
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