Scanning electron microscopy (JSM 4900LV; JEOL Ltd., Japan) was used to acquire microphotographs on the surface and cross-section of the freshly prepared extrudates. To improve conductivity prior to examination, samples were coated with gold using a Polaron SC7640 sputter gold coater (Quorum Technologies, UK).
Jsm 4900lv
Manufactured by JEOL
Sourced in Japan
The JSM 4900LV is a low-vacuum scanning electron microscope (SEM) designed for the observation and analysis of a wide range of materials. It operates at accelerating voltages between 0.5 kV and 30 kV and can achieve a high-resolution imaging performance. The JSM 4900LV is capable of examining samples in a low-vacuum environment, making it suitable for the observation of non-conductive and moisture-containing specimens.
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Lab products found in correlation
2 protocols using jsm 4900lv
1
Scanning Electron Microscopy of Extrudates
2
SEM Analysis of SMD Film Morphology
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Scanning electron microscopy (SEM) (JSM 4900LV; JEOL Ltd., Japan) images were collected on freshly prepared films to investigate SMD film morphology and particle size analysis. To improve conductivity prior to examination, samples were coated with 20 nm of gold under vacuum using a PolaronSC7640 sputter gold coater (Quorum Technologies, UK). The average diameter of the drug was determined from the mean value of 100 measurements using ImageJ (USA, version 1.46v).
The particle size of formulated OLZ in SMD films was measured. Prior to the analysis a weighed amount of film was dissolved in distilled water (120 mL) using a Hydro MV Mastersizer 3000 (Malvern; Grovewood Road, UK) at a rotational speed of 2800 rpm.
The particle size of formulated OLZ in SMD films was measured. Prior to the analysis a weighed amount of film was dissolved in distilled water (120 mL) using a Hydro MV Mastersizer 3000 (Malvern; Grovewood Road, UK) at a rotational speed of 2800 rpm.
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