The particle size and microscopic morphology of SCR-CDs were observed using a transmission electron microscope (TEM; Tecnai G2 20; FEI Company, Hillsboro, OR, United States). The atomic lattice spacing of SCR-CDs was uncovered utilizing a high-resolution TEM (JEN-1230; Japan Electron Optics Laboratory, Tokyo, Japan). The ultraviolet-visible (UV-vis) absorption spectra and photoluminescence characteristics of SCR-CDs were determined using a UV-vis spectrometer (CECIL, Cambridge, United Kingdom) and a fluorescence (FL) spectrophotometer (F-4500, Tokyo, Japan), respectively. Moreover, the functional groups and proportioning of chemical elements in SCR-CDs were characterized using Fourier transform infrared (FTIR) spectroscopy (Thermo Fisher, Fremont, CA, United States) and X-ray photoelectron spectroscopy (XPS; ESCALAB 250Xi, Thermo Fisher Scientific, Fremont, CA, United States), respectively. The zeta potential values and hydrodynamic diameter were determined using a Malvern Zetasizer Nano ZS90 (Malvern Instruments). The main components in the solutions of CR and SCR-CDs were identified using high-performance liquid chromatography (HPLC; Agilent 1260) with a ultraviolet detector at 265 nm.
Jen 1230
Manufactured by JEOL
Sourced in Japan
The JEN-1230 is a high-performance scanning electron microscope (SEM) designed for advanced materials analysis. It features a stable electron optical system and high-resolution imaging capabilities.
Automatically generated - may contain errors
Lab products found in correlation
Escalab 250xi, by Thermo Fisher Scientific (24 mentions)
Tecnai g2 20, by Thermo Fisher Scientific (12 mentions)
Ftir spectroscopy, by Thermo Fisher Scientific (5 mentions)
D8 advanced x ray diffractometer, by Bruker (5 mentions)
Ftir spectrophotometer, by Thermo Fisher Scientific (2 mentions)
Malvern zetasizer nano zs90, by Malvern Panalytical (1 mentions)
Uv vis spectrometer, by Hitachi (1 mentions)
F 4500, by Hitachi (1 mentions)
Tecnai g2, by Thermo Fisher Scientific (1 mentions)
Infrared spectrophotometer, by Thermo Fisher Scientific (1 mentions)
Fourier transform infrared spectroscopy ftir, by Thermo Fisher Scientific (1 mentions)
Ftir spectra, by Thermo Fisher Scientific (1 mentions)
Ftir spectrometer, by Thermo Fisher Scientific (1 mentions)
D8 advanced, by Bruker (1 mentions)
13 protocols using jen 1230
1
Characterization of Sulfur-Doped Carbon Dots
2
Comprehensive Characterization of Fluorescent Polymer Carbon Dots
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The morphology, distribution and microstructure information of FP-CDs were revealed by transmission electron microscopy (TEM) (Tecnai G220, FEI Company, United States), while the atomic lattice spacing of FP-CDs was uncovered utilizing a high-resolution TEM (JEN-1230, Japan Electron Optics Laboratory, Japan). The emission wavelength and electronic transition characteristics of FP-CDs were gotten by utilizing ultraviolet (UV-Vis) spectrophotometer (CECIL, Cambridge, United Kingdom) and fluorescence (FL) spectrophotometer (F-4500, Tokyo, Japan) respectively. The functional group properties of FP-CDs were further characterized with Fourier transform infrared (FTIR) spectroscopy (Thermo Fisher, Fremont; California, United States) and X-ray photoelectron spectroscopy (XPS) (ESCALAB 250Xi, Thermo Fisher Scientific, United States). The polydispersity index (PDI) value of FP-CDs was measured with dynamic light scattering (DLS).
3
Comprehensive Characterization of Oxidized Defect-Rich Carbon Dots
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The morphology and microstructure of OD-CDs were characterized by transmission electron microscopy (TEM, Tecnai G2 20, FEI Company, OR, USA) at an accelerating voltage of 200 kV. The structural details and the atomic lattice fringes of OD-CDs were examined by high-resolution TEM (HRTEM, JEN-1230, Japan Electron Optics Laboratory, Japan), transmission electron microscopy (TEM), and high-resolution TEM.
The spectral properties of the OD-CDs were investigated using ultraviolet-visible spectroscopy (UV-vis, CECIL, Cambridge, UK) and fluorescence spectroscopy (F-4500, Tokyo, Japan) in a standard quartz cuvette. Moreover, the Fourier transform infrared (FTIR, Thermo, California, USA) spectra were recorded to analyse the organic functional groups in the OD-CDs within a spectral window of 400–4000 cm−1. Raman spectra were acquired by using a Renishaw (in Via plus) Raman microscope with 785 nm wavelength incident laser light. To obtain X-ray diffraction (XRD) patterns, an X-ray diffractometer (D8-Advanced X-ray diffractometer, Bruker AXS, Karlsruhe, Germany) with Cu Kalpha radiation was applied. The surface composition and elemental analysis of the OD-CDs were recorded using X-ray photoelectron spectroscopy (XPS, ESCALAB 250 Xi, Thermo Fisher Scientific, Fremont, CA, USA) and a mono X-ray source Al Kl excitation (1486.6 eV).
The spectral properties of the OD-CDs were investigated using ultraviolet-visible spectroscopy (UV-vis, CECIL, Cambridge, UK) and fluorescence spectroscopy (F-4500, Tokyo, Japan) in a standard quartz cuvette. Moreover, the Fourier transform infrared (FTIR, Thermo, California, USA) spectra were recorded to analyse the organic functional groups in the OD-CDs within a spectral window of 400–4000 cm−1. Raman spectra were acquired by using a Renishaw (in Via plus) Raman microscope with 785 nm wavelength incident laser light. To obtain X-ray diffraction (XRD) patterns, an X-ray diffractometer (D8-Advanced X-ray diffractometer, Bruker AXS, Karlsruhe, Germany) with Cu Kalpha radiation was applied. The surface composition and elemental analysis of the OD-CDs were recorded using X-ray photoelectron spectroscopy (XPS, ESCALAB 250 Xi, Thermo Fisher Scientific, Fremont, CA, USA) and a mono X-ray source Al Kl excitation (1486.6 eV).
4
Comprehensive Structural and Optical Characterization of CRC-CDs
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TEM (Tecnai G220; FEI Company, USA) was used to analyze the microstructure, particle size distribution, and morphology of CRC-CDs at a 100 kV accelerating voltage. HRTEM (JEN-1230; Japan Electron Optics Laboratory; Japan) was used to study atomic lattice fringes and other structural features. Using UV-Vis (CECIL, Cambridge, UK) and fluorescence (F-4500, Tokyo, Japan) spectroscopy, respectively, the ultraviolet-visible (UV-Vis) spectrum and fluorescence characteristics were recorded and quantified. XRD (D8-Advanced X-ray diffractometer, Bruker AXS, Karlsruhe, Germany) was performed with Cu K-alpha radiation. The surface composition of CRC-CDs was investigated using X-ray photoelectron spectroscopy (XPS) on an X-ray photoelectron spectrometer (ESCALAB 250Xi, Thermo Fisher Scientific, MA, USA) with a mono X-ray source AlK 150 W. The composition of functional groups on the surface of CRC-CDs between 400 and 4000 cm−1 was identified using Fourier transform infrared (FTIR) spectroscopy (Thermo, California, USA).
5
Characterization of RSFC-CDs Nanoparticles
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The morphological features, structural details and atomic lattice fringes of RSFC-CDs were measured using transmission electron microscopy (TEM; Tecnai G220, FEI Company, Hillsboro, OR, USA) and high-resolution TEM (HRTEM; JEN-1230, Japan Electron Optics Laboratory, Tokyo, Japan). The X-ray diffraction (XRD) pattern was characterized with a D8 DISCOVER Plus X-ray Diffractometer (Bruker AXS, Karlsruhe, Germany) with Cu K α radiation. The fluorescent performances and ultraviolet-visible (UV-vis) absorption spectra of RSFC-CDs were studied using a fluorescence spectrophotometer (F-4500, Hitachi, Tokyo, Japan) and a UV-vis spectrometer (CECIL, Cambridge, UK). Fourier transform infrared (FTIR) spectroscopy was performed to identify characteristic chemical bonds and functional groups with a FTIR spectrophotometer (Thermo Fisher Scientific, CA, USA). Through X-ray photoelectron spectroscopy (XPS), the surface composition of RSFC-CDs was examined using an X-ray photoelectron spectrometer (ESCALAB 250Xi, Thermo Fisher Scientific, MA, USA) with a mono X-ray source Al Kα 150 W.
6
Characterization of AFIC-Derived Carbon Dots
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We employed various analytical techniques to examine the particle size and microscopic structure of AFIC-CDs. The transmission electron microscope (TEM; Tecnai G2; FEI Company, Hillsboro, OR, United States) was used for observing particle size and microscopic morphology. For a closer look at structural details and atomic lattice fringes, a high-resolution TEM (HRTEM) system (JEN-1230, Japan Electron Optics Laboratory, Tokyo, Japan) was utilized. To assess photoluminescent and ultraviolet-visible (UV-vis) absorption properties, we recorded spectra with a fluorescence (FL) spectrophotometer (F-4500, Tokyo, Japan) and a UV-vis spectrometer (CECIL, Cambridge, United Kingdom), respectively. The identification of functional groups and the elemental composition of AFIC-CDs was accomplished using an FTIR spectrophotometer (Thermo Fisher, CA, United States) and X-ray photoelectron spectroscopy (XPS, Thermo Fisher Scientific, MA, United States). Furthermore, the crystalline nature of AFIC-CDs was investigated through X-ray diffraction (XRD) using a D8 Venture Plus X-ray Diffractometer (Bruker AXS, Karlsruhe, Germany). The main components in the solution of AFIC and AFIC-CDs were identified using high-performance liquid chromatography (HPLC; Agilent 1,260) with the detection wavelength at 284 nm.
7
Comprehensive Characterization of Synthetic GRR-CDs
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The morphology, size, and microstructure of the synthetic GRR-CDs were characterized by transmission electron microscopy (TEM) (Tecnai G2 20, FEI Co., Hillsboro, OR, USA) at an accelerating voltage of 100 kV, while the structural details and the atomic lattice fringes of GRR-CDs were examined by high-resolution transmission electron microscopy (HRTEM) (JEN-1230, Japan Electron Optics Laboratory, Tokyo, Japan).
X-ray diffraction (XRD) (D8-Advanced X-ray diffractometer, Bruker AXS, Karlsruhe, Germany) was performed with Cu K alpha radiation (wavelength λ = 1.5418 Å).
The excitation and emission spectrum of GRR-CDs were determined by a fluorescence spectroscopy (FL) (F-4500, Tokyo, Japan). The absorption spectra of GRR-CDs was detected by a ultraviolet-visible spectrophotometer (UV-vis) (CECIL, Cambridge, UK). In addition, the Fourier transform infrared spectrum (FT-IR) (Thermo Fisher, Fremont, CA, USA) was recorded to identify the organic functional groups in GRR-CDs within a spectral window of 400–4000 cm−1.
The element composition, content and surface active group of GRR-CDs were analyzed by X-ray photoelectron spectroscopy (XPS) (ESCALAB 250Xi, Thermo Fisher Scientific, Fremont, CA, USA).
X-ray diffraction (XRD) (D8-Advanced X-ray diffractometer, Bruker AXS, Karlsruhe, Germany) was performed with Cu K alpha radiation (wavelength λ = 1.5418 Å).
The excitation and emission spectrum of GRR-CDs were determined by a fluorescence spectroscopy (FL) (F-4500, Tokyo, Japan). The absorption spectra of GRR-CDs was detected by a ultraviolet-visible spectrophotometer (UV-vis) (CECIL, Cambridge, UK). In addition, the Fourier transform infrared spectrum (FT-IR) (Thermo Fisher, Fremont, CA, USA) was recorded to identify the organic functional groups in GRR-CDs within a spectral window of 400–4000 cm−1.
The element composition, content and surface active group of GRR-CDs were analyzed by X-ray photoelectron spectroscopy (XPS) (ESCALAB 250Xi, Thermo Fisher Scientific, Fremont, CA, USA).
8
Characterization of STC Nanoparticles
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The morphology, particle size distribution and microstructure of STC-NPs obtained at 400°C were examined by TEM (Tecnai G220; FEI Company, USA) at 200 kV, and the lattice spacing and other internal structures were observed by HRTEM (JEN-1230; Japan Electron Optics Laboratory; Japan) and X-ray diffractometer (XRD). The optical information of STC-NPs was analysed using ultraviolet spectrophotometer (CECIL, Cambridge, UK) and fluorescence spectrophotometer (F-4500, Tokyo, Japan). An infrared spectrophotometer (Thermo, California, USA) was used to analyse the distribution of functional groups on the surface of STC-NPs from 4000–400 cm−1. The elemental and surface compositions of NPs were observed by X-ray photoelectron spectroscopy (ESCALAB 250Xi, Thermo Fisher Scientific, USA).
9
Characterization of ASAC-Derived Carbon Dots
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The morphology, particle size distribution and microstructure of ASAC-CDs were characterized by TEM (Tecnai G220; FEI Company, USA) at an accelerating voltage of 100 kV. Atomic lattice fringes and other structural details were observed by HRTEM (JEN-1230; Japan Electron Optics Laboratory; Japan). The fluorescent performances and ultraviolet-visible (UV-vis) absorption spectra of the CDs were analysed using ultraviolet spectrophotometer (CECIL, Cambridge, UK) and fluorescence spectrophotometer (F-4500, Tokyo, Japan). XRD (D8-Advanced X-ray diffractometer, Bruker AXS, Karlsruhe, Germany) was performed with Cu K-alpha radiation. Fourier transform infrared (FTIR) spectroscopy (Thermo, California, USA) was utilized to recognize the composition of functional groups on the surface of ASAC-CDs from 400 to 4000 cm−1. In addition, the surface and elemental compositions of ASAC-CDs were further observed utilizing X-ray photoelectron spectroscopy (XPS) (ESCALAB 250Xi; Thermo Fisher Scientific, USA) with a mono X-ray source Al Kα excitation (1486.6 eV). A freezing centrifuge (TGL-16G) was obtained from Beijing Restorative Centrifuge Manufacturing plant (Beijing, China).
10
Comprehensive Characterization of CRC-CDs
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The morphology, microstructure and distribution state of CRC-CDs were revealed by transmission electron microscopy (TEM, Tecnai G220, FEI Company, USA) with an accelerating voltage of 100 kV, while the lattice spacing of CRC-CDs and other details were uncovered using a HRTRM (JEN-1230, Japan Electron Optics Laboratory, Japan). X-ray diffractometer (XRD, Bruker AXS, Karlsruhe, Germany) was performed with Cu K-alpha radiation. The spectral properties of the CDs were recorded by the ultraviolet spectrophotometer (UV-Vis) (CECIL, Cambridge, UK) and by the fluorescence (FL) spectrophotometer (F-4500, Tokyo, Japan). The surface composition of the sample was analyzed using Fourier transform infra-red (FTIR) spectroscopy (Thermo Fisher, Fremont, California, USA) and X-ray photoelectron spectroscopy (XPS) (ESCALAB 250Xi, Thermo Fisher Scientific, USA).
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