The spatially resolved reflectance spectrum was measured by using an optical microscopic spectrum system, which included an optical microscope (Zeiss Axio Imager. A2m) equipped with a halogen lamp (Zeiss Hal 100, 12 V, and 100 W), and a spectrometer (Horiba Jobin Yvon Triax 320). One end of an optical fiber was placed at the image plane of the microscope to selectively couple part of the light signal there to the spectrometer. The diameter of the optical fiber is 9 μm.
Triax 320
Manufactured by Horiba
Sourced in Japan
The Triax 320 is a versatile spectrometer designed for a range of scientific applications. It features a triple grating monochromator that provides high-resolution spectral analysis across a wide wavelength range. The Triax 320 is capable of performing various spectroscopic measurements with precision and accuracy.
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Lab products found in correlation
Xe 120, by Park Systems (2 mentions)
Fluorolog 3, by Horiba (2 mentions)
Hal100, by Zeiss (1 mentions)
Axio imager a2m, by Zeiss (1 mentions)
Syncerity, by Horiba (1 mentions)
Fluoromax 4, by Horiba (1 mentions)
Icps 8100, by Shimadzu (1 mentions)
Nirquest512, by OceanOptics (1 mentions)
Jsm 6500f, by JEOL (1 mentions)
H 7650, by Hitachi (1 mentions)
Rint 2000, by Rigaku (1 mentions)
H7844, by Hamamatsu Photonics (1 mentions)
R943 02, by Hamamatsu Photonics (1 mentions)
Gg385, by Schott (1 mentions)
Triax 320 spectrometer, by Horiba (1 mentions)
Quantaurus qy, by Hamamatsu Photonics (1 mentions)
Gemini 180, by Horiba (1 mentions)
Thms600 heating stage, by Linkam (1 mentions)
Pixis 100, by Teledyne (1 mentions)
Mc2000, by Thorlabs (1 mentions)
19 protocols using triax 320
1
Spatially Resolved Reflectance Spectroscopy
2
Raman Spectroscopy of Functionalized SWNTs
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The measurements were performed by using a custom-made micro Raman setup [42 (link)]. via back scattering geometry. Briefly, scattered light from two different lasers (785 and 532 nm, 0785-08-11 and 08-DPL 532 nm 100 mW; Cobolt AB, Solna, Sweden) was collected via 50× objective lens (MPlan, N.A.: 0.75, Olympus, Japan) and delivered to spectrometer with a Si array CCD (Triax 320, focal length: 320 mm, 1800 gr/mm, resolution: 2 cm−1; 26 μm/pixel, 1024 × 256, Syncerity; Horiba Jobin-Yvon, Kyoto, Japan). The laser spot size is approximately 1 μm and an additional Si peak at 520.89 cm−1 was used as an internal reference. A total of 50 μL of SWNT dispersion was dropcast on a 285 nm-thick SiO2/Si substrate and dried at 90 °C on a hot plate. The sample was concentrated by repeating this process several times and washed with copious amounts of acetone to remove flavins. The laser power was below 0.2 mW to minimize sample damage. The spectra were acquired by averaging several points and were normalized against the maximum at each region. For Raman spectra of flavin derivatives, 785-nm excitation on powder sample was utilized with power of 50 mW, whereas 532-nm excitation results in fluorescence emission of flavin derivatives.
3
Photophysical Characterization of Organic Thin Films
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UV-Vis absorption spectroscopy was performed using a Horiba Fluoromax-4. Photoluminescence (PL) emission64 was generated from PffBT4T-2OD:PC71BM thin films (deposited onto a glass slide and annealed using the conditions described above) following excitation using a 532 nm diode pumped solid state laser. Emission was then imaged into a Jobin Yvon Triax 320 spectrometer, with spectra recorded using a liquid nitrogen cooled CCD. A long pass filter with a cut off of 532 nm was placed before the entrance to the spectrometer to reduce scattered laser-light.
4
Characterization of Y2O3 Phosphor Nanoparticles
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Particles were observed with a transmission electron microscope (TEM, H-7650, Hitachi). Particle size was determined from TEM images using the ‘Analyze particles’ function of ImageJ software (National Institutes of Health). The concentrations of rare-earth elements in the NPs were calibrated with an inductively coupled plasma atomic emission spectroscope (ICP-AES, ICPS-8100, Shimadzu). Structural analyses of the NPs were conducted by using X-ray diffraction (XRD) with Cu Kα1 radiation (Rint2000, Rigaku). Near-infrared luminescent spectra of Y2O3 phosphors excited by a 980 nm NIR diode laser (IRM980TR-500, Laser Century) were measured with a spectrometer (NIRQUEST512, Oceanoptics) as shown in Fig. S1 . Cathodoluminescent spectra and images of the NPs were measured with a spectrometer (TRIAX-320, Horiba-Jobin Yvon) and a cooled CCD camera (CCD-1024 × 256-4, Horiba-Jobin Yvon) placed in a CL measurement unit (Horiba) attached to an FE-SEM instrument (JSM-6500F, JEOL) as shown in Fig. S2 .
5
Nanomaterial Imaging and Characterization
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NP locations were observed under 980 nm NIR light and electron beam irradiation. Each type of NP was dispersed on a 50 nm-thick silicon nitride membrane grid (SN100-A50Q33, SPI Supplies). Bright-field and NIRL images were obtained with a modified laser scanning microscope (C1, Nikon) equipped with a 980 nm NIR diode laser and a photomultiplier tube (H7844 or H10330B-75, Hamamatsu) as shown in Fig. S3 . NIRL images were constructed by raster scanning using a galvano mirror. After NIRL imaging, CL images were obtained with the FE-SEM-CL system described in our previous study17 (link). The emitted CL was directed to a spectrometer (TRIAX-320, Horiba-Jobin Yvon) and CL images were recorded with a photomultiplier tube-type detector (PMT, R943-02, Hamamatsu).
6
Optical Reflectance Measurement of Pictorial Layers
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Measurements of the optical reflectance during the laser irradiation were obtained, irradiating the pictorial layers with a white lamp (Energetiq LDLS, Laser-Driven Light Source) under confocal microscope conditions (Olympus 900, HORIBA), and the reflected spectra were taken by a TRIAX 320 (HORIBA Jobin Yvon) spectrometer working in the 300 to 800 nm range. The optical absorption was then evaluated using the standard equation where Ir and I0 are the reflected and source intensity at each wavelength, respectively. The total optical absorption was evaluated from the integral of a(λ) on the whole visible range and normalized to have the maximum value of 1 for a constant value of a(λ) = 1 in the entire 300- to 800-nm spectral range. We are aware that our formula is simplifying the real physical phenomena, better described by the Kubelka-Munk formula. However, scattering in pigments is most pronounced when the particle diameter is about half that of the light wavelength. In the present case, as the structures have a dimension in the hundreds of nanometers, scattering effects may be neglected.
7
TERS Microscope Setup for Enhanced Raman Imaging
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The TERS microscope (see ESI, Fig. S3 † for a detailed layout) consisted of an inverted microscope (IX71, Olympus), a Raman spectrometer (Triax 320, Horiba; DU-401, Andor Tech) and an atomic force microscope (AFM, XE-120, Park Systems) operating under the contact mode. The linearly polarized laser beam (wavelength of 532 nm, Nd:YAG) was converted to radially polarized light using a radial polarizer (Nanophoton, ZPol-532-QzM-4). The radially polarized beam 25, 26 provides the enhanced z-polarization component ( parallel to the tip axis) of the electric field at the tip-sample junction, enhancing the TERS signal. The beam was focused onto the tip through an objective lens (oil immersion, NA = 1.46), and the Raman signal was collected through the same objective lens (ESI, Fig. S3 †).
8
Comprehensive Material Characterization Techniques
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Scanning electron microscopy (SEM) was utilized for morphological analysis, employing the SEO-SEM Inspect S50-B microscope (Sumy Plant of Electronic Microscopes, Sumy, Ukraine) at a voltage of 20 kV. The deposited layers were examined using energy-dispersive X-ray (EDX) spectroscopy for compositional analysis and material identification. Spectra acquisition modes included point analysis and surface mapping technology (20 kV). X-ray diffraction (XRD) was conducted for structural analysis using the Dron-3 M system (Sumy State University, Sumy, Ukraine) with unfiltered Cu Ka radiation in the angle range of 2θ from 10° to 80° with a step of 0.01°. Raman measurements were carried out at room temperature using the RENISHAW inVia Reflex system (Renishaw plc, Wotton-under-Edge, UK). Luminescence measurements were performed on a miniature DAC from easyLab, placed in a continuous-flow cryostat CF 200 Oxford Instruments with an ITC4 Oxford Instruments temperature controller (easyLab Technologies Ltd., now part of Oxford Instruments, Abingdon, UK). Luminescence was collected in a backscattering geometry using a Yobin Yvon-Spex Triax 320 monochromator equipped with a Spectrum One CCD camera (Horiba Jobin Yvon, Longjumeau, France). This experiment’s luminescence was excited using 405 nm radiation from a 100 mW diode laser or the 325 nm line from a 20 mW He–Cd laser.
9
Rat Kidney Fluorescence Imaging
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AF spectra under 355 nm, UV excitation were collected by imaging onto the slit of a spectrometer (Triax 320, Jobin-Yvon Horiba, equipped with a 300-grooves∕mm grating blazed at 450 nm) the emission from a rat kidney during 150 min ischemia and 90 min reperfusion (under the same illumination conditions described in the imaging configuration). A 385-nm long-pass filter (GG-385, Schott) was positioned at the entrance of the spectrometer for 355-and 325-nm excitation and a 295-longpass (WG-295, Schott) for 266-nm excitation to reject the excitation light from entering the spectrometer. The spectra were detected by a back-illuminated CCD (LN/CCD-1340/400EB/1, Roper Scientific). After correcting for system response, each spectrum was normalized to peak intensity. This normalization was motivated by our interest in observing how the spectral profile itself changes during injury and recovery as well as because animal movement prevented a reliable measurement of absolute emission intensity.
10
Integrated Nano-Raman Microscopy Setup
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The TENOM set-up consisted of an inverted microscope (IX71, Olympus), a Raman spectrometer (Triax 320, Horiba; DU-401, Andor Tech), avalanche photodiodes (APDs), and an atomic force microscope (AFM, XE-120, Park Systems) operating under contact and tapping modes. The laser-beam (wavelength of 532 nm, Nd:YAG) was focused onto the tip through an objective lens (oil immersion, NA = 1.46), and Raman and fluorescence signals were collected through the same objective lens (see ESI Fig. S1 †).
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