X-ray powder diffraction (XRD, Rigaku-DMax 2400) with a 2θ scan configuration in the range 5-80° in reflection mode (Cu-Ka radiation) was used to characterize the TiO 2 /Ag composites. Scanning electron microscope (SEM, Quanta-450, operated at 20 kV), field emission scanning electron microscope (FESEM, NOVA NANOSEM 450, measured at 15 kV) and energy dispersive X-ray (EDX, Quanta-450 instrument) were operated to check the size and morphologies of samples. The X-ray photoelectron spectroscopy (XPS, ESCALAB250) was employed to study the surface atomic composition and chemical state. The adsorption-desorption isotherms of the composites was performed on An ASAP 2020 physical absorption apparatus. The optical density (OD) and photocatalytic properties were measured by a cell density meter (CO8000) and UV-vis diffuse reflectance spectroscope (UV-550). Fluorescent-Based cell wall/membrane integrity assay was carried out with fluorescence microscopy (OLYMPUS BX51). The fluorescence spectroscope was operated on FP-8300 Fluorescence Spectrometer. A xenon arc lamp (BL-GHX-IV, operated at 300 W) was used to provide simulated solar irradiation.
Inductively coupled plasma atomic emission spectrometer (ICP-AES, Optima 200 DV, made by Perkin Elmer Company) was adopted to measure the silver content.
Inductively coupled plasma atomic emission spectrometer (ICP-AES, Optima 200 DV, made by Perkin Elmer Company) was adopted to measure the silver content.