Axis ultra dld xps instrument

Manufactured by Shimadzu

The AXIS Ultra DLD XPS instrument is a high-performance X-ray photoelectron spectroscopy (XPS) system designed for surface analysis. It features a dual-anode X-ray source and a hemispherical analyzer with a delay-line detector for capturing photoelectron spectra. The instrument is capable of providing detailed information about the chemical composition and electronic structure of solid surfaces.

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Lab products found in correlation

Icap 6300, by Thermo Fisher Scientific (1 mentions) Miniflex 600, by Rigaku (1 mentions) Spectrum 100 ftir spectrometer, by PerkinElmer (1 mentions)

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Axis Ultra DLD (369 citations) Axis Ultra (124 citations) Axis Ultra XPS (18 citations) Axis Ultra DLD XPS (16 citations) Ultra DLD (16 citations) AXIS Ultra instrument (10 citations) Axis Ultra DLD instrument (9 citations)

2 protocols using axis ultra dld xps instrument

Characterization of Pt Catalyst by XRD, XPS, ICP-OES, and XAS

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With a scan rate of 0.02° per step and 4 s per step, the XRD patterns were monitored using a Rigaku Mini Flex 600 spectrometer.
Based on the Rietveld structural refinement framework which was implemented in the General Structure Analysis System (GSAS, version 1.0) package, the XRD patterns were analyzed. Kratos AXIS Ultra DLD XPS instrument was used to acquire XPS and UPS data using the parameter of Al-kα source (hν = 1486.68 eV) and He I (hν = 21.22 eV) illumination. XPS binding energy was calibrated to 284.8 eV using adventitious alkyl carbon C 1 s peak. Inductively coupled plasma optical emission spectrometry (ICP-OES, ThermoFisher, iCAP 6300) was used to determine the concentration of Pt loading. X-ray absorption spectroscopy (XAS) at Pt L3-edge was measured at the beamline BL14W1 of Shanghai Synchrotron Radiation Facility (XAFS station, SSRF). Demeter (version 0.9.26) software packages were used to process and analyze XANES and EXAFS data.

Ye T., Chen C., Wang D., Huang C., Yan Z., Chen Y., Jin X., Wang X., Ding X, & Shen C. (2024). Protective effects of Pt-N-C single-atom nanozymes against myocardial ischemia-reperfusion injury. Nature Communications, 15, 1682.

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Comprehensive Characterization of Materials

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X-ray diffractometry
(XRD) is performed on a TD-3500X X-ray diffractometer operating with
a scanning speed of 0.5°/min from 10° to 80°. Scanning
electron microscopy (SEM) is performed using a MERLIN VP compact microscope,
and further energy-dispersive X-ray spectroscopy (EDS) elemental mapping
is performed in the scanning SEM mode. Nitrogen sorption–desorption
isotherms at 77 K are determined by means of a US Mike TRISTAR II
3020M surface area and pore size analyzer. The relative pressure (P/P₀) range of 0–1.0
is selected for the calculation of the Brunauer–Emmett–Teller
(BET) surface areas. X-ray photoelectron spectroscopy (XPS) measurements
are conducted on a Kratos AXIS Ultra DLD XPS instrument equipped with
an Al Kα source at 10–9 Torr. The binding energy is corrected
based on C 1s (284.8 eV). The surface functional groups of FH–M
before and after adsorption were determined by Fourier transform infrared
(FT-IR) spectroscopy (PerkinElmer Spectrum 100 FT-IR Spectrometer)
in the wavenumber region between 4000 and 400 cm^–1 with a resolution of 4 cm^–1. Inductively coupled
plasma optical emission spectrometer (ICP-OES) (Optima 5300 DV) and
inductively coupled plasma mass spectrometry (ICP-MS) (ELAN DRC-e)
were used to measure the content of Cd(II)/As(V) before and after
adsorption.

Meng K., Wu X., Zhang X., Su S., Huang Z., Min X., Liu Y, & Fang M. (2019). Efficient Adsorption of the Cd(II) and As(V) Using Novel Adsorbent Ferrihydrite/Manganese Dioxide Composites. ACS Omega, 4(20), 18627-18636.

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