The morphology of the obtained samples was characterized by a field-emission scanning electron microscope (Hitachi Limited SU-8010) and transmission electron microscopy (JEOL-2100FS). The X-ray diffraction (XRD) pattern was determined by PANalytical X'Pert PRO (PANalytical X'Pert PRO, monochromated Cu Kα radiation 40 mA, 40 kV) to characterize the crystal structure. X-ray photoelectron spectroscopy (XPS) was performed with a Thermo Fisher Scientific K-Alpha (Fisher Scientific Ltd., Nepean, ON).
X pert pro
Manufactured by Malvern Panalytical
Sourced in Netherlands, United Kingdom, United States, Japan, Germany, France, Spain, Austria
The X'Pert PRO is a versatile X-ray diffraction (XRD) system designed for materials characterization. It is capable of performing a range of XRD analyses, including phase identification, structural characterization, and thin-film analysis. The system features advanced optics and a high-performance X-ray source to deliver accurate and reliable results.
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Lab products found in correlation
S 4800, by Hitachi (21 mentions)
Escalab 250xi, by Thermo Fisher Scientific (20 mentions)
Jem 2100f, by JEOL (16 mentions)
Jem 2100, by JEOL (14 mentions)
Ultra 55, by Zeiss (13 mentions)
Asap 2020, by Micromeritics (13 mentions)
K alpha, by Thermo Fisher Scientific (13 mentions)
Nicolet is50, by Thermo Fisher Scientific (9 mentions)
Escalab 250, by Thermo Fisher Scientific (8 mentions)
Supra 55vp, by Zeiss (7 mentions)
Jsm 7800f, by JEOL (6 mentions)
Zetasizer nano zs90, by Malvern Panalytical (6 mentions)
Uv 3600, by Shimadzu (5 mentions)
Su8010, by Hitachi (5 mentions)
Mira3, by TESCAN (5 mentions)
Tecnai g2 20, by Thermo Fisher Scientific (5 mentions)
Cary 5000, by Agilent Technologies (5 mentions)
Multipurpose diffractometer, by Malvern Panalytical (4 mentions)
Solidspec 3700, by Shimadzu (4 mentions)
Ttk 450, by Anton Paar (4 mentions)
767 protocols using x pert pro
1
Structural Characterization of Samples
2
Structural and Electrochemical Characterization of Hard Carbon
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The morphology of the samples was observed by SEM (S4800) and TEM (JEM-2100F). The structure of the hard carbon material was characterized by XRD (X‘Pert PRO, PANalytical B.V., Cu Kα = 1.54056 Å, 2Θ = 10–80) and Raman ( Thermo Fisher Scientific DXR, Waltham, MA, USA), with the 532 nm excitation wavelength. The micropore volume and average pore size of the materials were characterized by nitrogen adsorption and desorption experiments (Quantachrome, Autosorb, Boynton Beach, FL, USA) at 77 k. The electrical conductivity of the material was measured by the four-probe method using model RTS-2A (Guangzhou Four-Probe Technology, Guangzhou, China) equipment.
The morphology of the samples was observed by SEM (S4800) and TEM (JEM-2100F). The structure of the hard carbon material was characterized by XRD (X‘Pert PRO, PANalytical B.V., Cu Kα = 1.54056 Å, 2Θ = 10–80) and Raman ( Thermo Fisher Scientific DXR, America), with the 532 nm excitation wavelength. The micropore volume and average pore size of the materials were characterized by nitrogen adsorption and desorption experiments (Quantachrome, Autosorb) at 77 k. The electrical conductivity of the material was measured by the four-probe method using model RTS-2A ( Guangzhou Four-Probe Technology, Guangzhou, China) equipment.
The morphology of the samples was observed by SEM (S4800) and TEM (JEM-2100F). The structure of the hard carbon material was characterized by XRD (X‘Pert PRO, PANalytical B.V., Cu Kα = 1.54056 Å, 2Θ = 10–80) and Raman ( Thermo Fisher Scientific DXR, America), with the 532 nm excitation wavelength. The micropore volume and average pore size of the materials were characterized by nitrogen adsorption and desorption experiments (Quantachrome, Autosorb) at 77 k. The electrical conductivity of the material was measured by the four-probe method using model RTS-2A ( Guangzhou Four-Probe Technology, Guangzhou, China) equipment.
3
Powder X-ray Diffraction Analysis Methodology
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For phase identification, powder X-ray diffraction (PXRD) data was collected on a PANalytical X’Pert Pro automated diffractometer equipped with an X’Celerator detector in Bragg–Brentano geometry, using Cu-Kα radiation (λ = 1.5418 Å) without a monochromator, in the 2θ range 5–40° (step size: 0.033°; time/step: 40 s; Soller slit: 0.04 rad; antiscatter slit: 1/2; divergence slit: 1/4; 40 mA × 40 kV). For structure solution purposes, in the case of Cu(KA)2, PXRD patterns were collected on a PANalytical X’Pert Pro automated diffractometer with transmission geometry equipped with a focusing mirror and a PIXcel detector, using Cu-Kα radiation (λ = 1.5418 Å) without a monochromator, in the 2θ range 3–70° (step size 0.0130°, time/step 200 s, Soller slit: 0,04 rad; antiscatter slit: 1/2; divergence slit: 1/4; 40 kV × 40 mA). To improve the data quality, three repetitions were performed, and the results of the three scans were combined for the final result.
4
Characterizing Porous Oxides using XRD and BET
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An X'Pert PRO diffractometer (X'Pert PRO, PANalytical B.V.) equipped with a Cu Kα radiation source (40 kV and 40 mA) was used to obtain X-ray diffraction (XRD) patterns of the OCs. The OCs were scanned at a rate of 2° min−1 from 2θ = 10° to 80° with a scanning step of 0.02°. N2 adsorption–desorption isotherms and pore-diameter distribution at −196 °C were measured using a Micrometrics ASAP 2010 system. The specific surface areas were calculated by the Brunauer–Emmett–Teller (BET) method. The surface morphology of the OCs was obtained using environmental scanning electron microscopy (ESEM; FEI Quanta 200) in conjunction with energy-dispersive X-ray spectroscopy (EDS). H2-TPR was conducted in an AutoChem II 2920. First, the sample (about 0.20 g) was heated to 300 °C at a rate of 10 °C min−1 in helium (50 mL min−1) and kept for 3 h. After being cooled to 50 °C, helium was replaced by a gas mixture consisting of 10/90H2/Ar v/v% (50 mL min−1), and the sample was reheated to 900 °C at a rate of 10 °C min−1.
5
X-ray Diffraction Analysis of Polymorphic Drug Crystals
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The X-ray diffractograms of ASP-I, ASP-II, and ASP-III were obtained by using an X-ray diffractometer (PAN analytical's X' Pert PRO, The Netherlands), equipped with X' Pert PRO data collector software. The radiations used were generated by CuKα -1 source fitted with a filter made up of nickel metal, and the instrument was operated at a voltage of 45 KV. The drug crystals were packed into the holder and gently pressed by the glass slide to ensure the co-planarity between the samples and the surface of the sample holder. Samples were scanned for 2θ values over the range of 5-45°at a scanning rate of 10°/min to get the X-ray diffractograms.
6
TEM and XRD Microstructural Analysis
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The cross-sectional image of the current and temperature samples were taken using a transmission electron microscopy (TEM, Tecnai F20). The TEM samples were fabricated using a focused ion beam (FIB, SII NanoTechnology SMI3050SE). Microstructural analysis using X-ray diffractometry (XRD, PANalytical X’pert Pro) was also performed.
7
Crystalline Phases Analysis via XRD
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X-ray diffraction (XRD) patterns of the materials showed crystalline phases with cubic spinel structures. XRD was performed with an X-ray diffractometer (XPert PRO, PANalytical, Malvern Panalytical Ltd., Malvern, UK) equipped with a Ge111 single-crystal monochromator and by selecting the Kα1 radiation wavelength of the Cu X-ray tube (0.15405 nm).
8
Nanocomposite Ce-Fe-B Alloy Fabrication
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Ce12Fe84+xB6 (x = 2, 6, 14, 26) alloy ingots are prepared by arc melting under a high-purity Ar atmosphere (99.999%) using the raw materials Ce, Fe, and FeB with purities over 99.9%, and the raw materials were purchased from Zhongnuo Advanced Material (Beijing, China) Technology Co., Ltd. (Beijing, China). The alloy ribbons were obtained by melt-spinning at a wheel speed of 35 m/s. In order to obtain nanocomposite structure, as-spun ribbons with amorphous structure were annealed at a temperature of 650 °C for 10 to 20 min. The phase constitution was identified by X-ray diffraction with a Cu-Kα source (XRD, X’ Pert Pro, PANalytical, Malvern, UK). The magnetic properties were measured by a vibrating sample magnetometer in the physical property measurement system (PPMS, Quantum Design, San Diego, CA, USA).
9
Determining Quercetin Crystal Morphology
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PXRD was used to confirm
the quercetin solid form and identify the morphologically dominant
facets in the crystals analyzed. This was estimated by a comparison
of the experimental and predicted diffractogram from the crystal structure,
where the reflection that was significantly enhanced in the experiment
as compared to the theoretical was assumed to be the dominant plane.
PXRD patterns were collected on a Panalytical X’Pert PRO that
was set up in Bragg–Brentano mode, using Cu Kα radiation
(λ = 1.54184 Å), in a scan between 5 and 50° in 2θ
with a step size of 0.032° and time per step of 25 s.
the quercetin solid form and identify the morphologically dominant
facets in the crystals analyzed. This was estimated by a comparison
of the experimental and predicted diffractogram from the crystal structure,
where the reflection that was significantly enhanced in the experiment
as compared to the theoretical was assumed to be the dominant plane.
PXRD patterns were collected on a Panalytical X’Pert PRO that
was set up in Bragg–Brentano mode, using Cu Kα radiation
(λ = 1.54184 Å), in a scan between 5 and 50° in 2θ
with a step size of 0.032° and time per step of 25 s.
10
X-ray Diffraction Mineralogical Analysis
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The bulk mineralogical compositions of the residues and the starting materials were determined using the Panalytical X’pert Pro X-ray diffractometer operating at IMPMC (Paris, France) at 40 kV and 40 mA (Co Kα radiation). A few mL of suspension of each sample were dried on a silicium sample holder, then analyzed in the 20°–100° 2θ angle range, with a step size of 0.001° (2θ) for a minimum total counting time of 2 h per sample.
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