Jem 2010 high resolution electron microscope

The nanostructure of the cured nanocomposites was examined by small angle X-ray scattering (SAXS) and by transmission electron microscopy (TEM). For SAXS, cured bulk samples were converted to powder in a ball mill (Retsch model MM 400, Retsch GmbH, Haan, Germany) using 20-mm diameter steel balls and a frequency of 20 Hz for a period of 4 minutes. A Bruker D8 Advanced diffractometer (Bruker Corporation, Billerica, MA, USA) was used to obtain the scattering diagram, measurements being taken in a range of 2θ = 1° to 8° with copper Kα radiation, the scans being made with steps in 2θ of 0.02° and with a time of 10 s for each step.
TEM was carried out with a Jeol Jem-2010 High Resolution electron microscope (Jeol Ltd., Tokyo, Japan), with an accelerating voltage of 200 kV. Samples were prepared by ultramicrotomy of the bulk cured nanocomposites, to give a section of about 50-nm thickness.

C17200 (imported) and QBe2.0 (domestic) alloys were selected as the materials for this experimental study, and their alloy compositions are shown in Table 1. The initial state of QBe2.0 alloy is Y₂ state and that of C17200 alloy is 1/2H state, and they are both subjected to 21% cold deformation after solution treatment. Then, the initial state alloys were annealed in a chamber annealing furnace for 2 h at both 280 °C and 300 °C, to select the optimal heat treatment regime. The Vickers hardness was conducted on a WILSON VH1150 test instrument (Chicago, IL, USA) with an indentation load of 5 kg and a holding time of 15 s. Tensile specimens were measured on an MTS-WD 3100 tensile test machine (Eden Prairie, MN, USA) with a constant strain rate of 10⁻³ s⁻¹. The microstructures of the alloys in the peak-aged states were observed using a Zeiss Axiovert 200 MAT metallurgical microscope (Zeiss, Jena, Germany). A JEOL JSM 7001F field emission scanning electron microscope (JEOL, Tokyo, Japan) was used to observe the fracture morphologies of the samples, and its EBSD probe was used to analyze the grain organization, twinning, and grain boundaries. A JEOL JEM-2010 high-resolution electron microscope (Hillsboro, OR, USA) was also used to observe and analyze the precipitation phases of the two alloys with an operating voltage of 200 KV.