The SEM images and EDS analysis were acquired using a Hitachi SU-8010 equipped with an EDX analyzer operated at an accelerating voltage of 5 kV. The TEM images were obtained on a JEM 2100 operating at 200 kV. The UV-vis diffuse reflectance spectroscopy (DRS) measurements were obtained on a UV-vis spectrometer (Shimadzu UV-2550) using BaSO4 as a reference standard. The specific surface area of the samples was measured by the Brunauer–Emmett–Teller (BET) method using nitrogen adsorption and desorption isotherms on a Micrometrics ASAP 2020 system. The UV-vis spectra were obtained on a Perkin Elmer Lamda 25 spectrophotometer. The NMR spectra were recorded on a Mercury Vx-300 MHz NMR spectrometer. XRD patterns were obtained on a Bruker D8-Advance. The luminescence spectra were measured using a Hitachi F-4500 spectrophotometer in MeOH at room temperature. A 500 W xenon lamp (CHFXQ 500 W, Global xenon lamp power) with a λ ≥ 420 nm optical filter, AM 1.5 optical filter and a heat cut-off filter provided visible light or simulated sunlight illumination.
Asap 2020 system
Manufactured by Micrometrics
The ASAP 2020 system is a laboratory equipment designed for surface area and porosity analysis. It measures the physical adsorption of gases on solid or porous materials to determine the surface area, pore size distribution, and pore volume of a sample.
Automatically generated - may contain errors
Lab products found in correlation
Tecnai f20, by Thermo Fisher Scientific (2 mentions)
Su8100, by Thermo Fisher Scientific (2 mentions)
F 4500 spectrophotometer, by Hitachi (1 mentions)
Su8010, by Hitachi (1 mentions)
Uv 2550, by Shimadzu (1 mentions)
D8 advance, by Bruker (1 mentions)
Jem 2100, by Shimadzu (1 mentions)
Lamda 25 spectrophotometer, by PerkinElmer (1 mentions)
D8 advance x, by Bruker (1 mentions)
Mfp 3d, by Oxford Instruments (1 mentions)
Jsm 6700f, by Thermo Fisher Scientific (1 mentions)
Jem 2010, by Thermo Fisher Scientific (1 mentions)
X pert, by Malvern Panalytical (1 mentions)
Esp 300e spectrometer, by Bruker (1 mentions)
2400 chn elemental analyzer, by PerkinElmer (1 mentions)
D8 advance diffractometer, by Bruker (1 mentions)
Tga 7 tg analyzer, by PerkinElmer (1 mentions)
X pert diffractometer, by Malvern Panalytical (1 mentions)
6 protocols using asap 2020 system
1
Characterization of Nanostructured Materials
2
Multi-Technique Characterization of Catalysts
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A Bruker D8 Advance X-ray diffractometer was used to analyze the crystal structures of the prepared catalysts. A Cary 500 ultraviolet-visible (UV-vis) diffuse reflectance spectrophotometer (DRS) was utilized to investigate the optical properties of the catalysts. A field-emission scanning electron microscope (FESEM; JSM-6700F) and a transmission electron microscope (TEM; JEM-2010, FEI, Tecnai G2 F20 FEG TEM) were used to determine the micromorphology of the as-synthesized samples. X-ray photoelectron spectroscopy (XPS) was performed using a Thermo Scientific ESCA Lab250 spectrometer consisting of monochromatic Al Kα as the X-ray source. All binding energies were calibrated to the C 1 s peak of surface adventitious carbon at 284.6 eV. The surface area of the samples was measured by the Brunauer–Emmett–Teller (BET) method using nitrogen adsorption and desorption isotherms on a Micrometrics ASAP 2020 system. PFM analysis was performed on a commercial piezoresponse force microscope (Oxford Instruments, MFP-3D). The photothermal effect of the sample was recorded by a Fotric IR thermal imager. Theoretical calculation and additional characterization have been provided in the Supplementary Methods.
3
Characterization of Nanostructured Materials
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The compositions and phases of the obtained samples were characterized by powder XRD on the PANalytical X’Pert diffractometer with a CuKα radiation. SEM (SU8100) and HRTEM (FEI Tecnai-F20) were used to characterize the shape and crystal structure. The surface compositions of samples were characterized by PHI QUANTUM2000 photoelectron spectrometer (XPS). N2 adsorption/desorption isotherms were used to characterize the surface areas of samples based on the BET method (Micrometrics ASAP 2020 system). Bruker ESP-300E spectrometer was used to measure EPR spectra at 9.8 GHz with X-band and 100 Hz field modulation. Dynamic light scattering (DLS) experiments were conducted on a Nano-Zetasizer (Nano-ZS) from Malvern Instruments (Malvern, UK). The experimental process was as follows: samples (0.1 g) and ethanol (10 mL) were added into a glass bottle (15 mL) and dispersed uniformly by ultrasonication for 10 min. Solutions were placed at different times under agitation and non-agitation, respectively. Then, the upper liquids were taken for DLS tests.
4
Morphological Characterization of Nanomaterials
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The morphology and micro-structure of the collected products were examined by SEM (Filiphis, XL-30) and HRTEM (Philip CM-200). The fiber orientation was identified by XRD. Here, XRD data were collected on a MACM18XHF diffractometer with Cu Kα radiation. The nitrogen adsorption and desorption isotherms at 77 K were collected by using a Micrometrics ASAP 2020 system. The samples were degassed overnight prior to the test. Brunauer–Emmett–Teller (BET) surface areas were estimated over a relative pressure (P/P0) range from 0.05 to 0.30.
5
Comprehensive Material Characterization
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Thermogravimetric analyses were performed under nitrogen with a Perkin-Elmer TGA-7 TG analyzer. Elemental analyses were conducted with a Perkin-Elmer 2400 CHN elemental analyzer. Infrared spectra were recorded in the range of 4000–400 cm−1 with a Frontier FT-IR spectrometer. Powder X-ray diffraction measurements were performed at room temperature on a Bruker D8 Advance diffractometer with a copper radiation source with a step size of 0.02° in θ and a scan speed of 1 s per step size. Brunauer−Emmett−Teller analyses were investigated with a Micrometrics ASAP 2020 system using carbon dioxide as the adsorbate at 195 K, 273 K, and 298 K.
6
Comprehensive Physicochemical Characterization
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The composition and phase of the as-prepared products were acquired by the powder X-ray diffraction (XRD) pattern using a Panalytical X-pert diffractometer with CuKα radiation. The morphology and crystal structure of as-prepared products were observed by scanning electron microscopy (SEM, SU8100), and high-resolution transmission electron microscopy (HRTEM, FEI Tecnai-F20) with an acceleration voltage of 200 kV. All TEM samples were prepared from depositing a drop of diluted suspensions in ethanol on a carbon film coated copper grid. Raman spectra of the material were collected with a micro-Raman system with 632.8 nm diode laser excitation on a 300 lines per mm grating at room temperature. PHI QUANTUM2000 photoelectron spectrometer (XPS) was using to characterize the surface compositions of product. The surface areas of these samples were measured by the Brunauer–Emmett–Teller (BET) method using nitrogen adsorption and desorption isotherms on a Micrometrics ASAP 2020 system.
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