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Em 400 transmission electron microscope

Manufactured by Philips

The EM 400 is a transmission electron microscope manufactured by Philips. It is designed to produce high-resolution images of small-scale samples by focusing a beam of electrons through the specimen and onto a detector.

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3 protocols using em 400 transmission electron microscope

1

Transmission Electron Microscopy Sample Preparation

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For TEM acquisition, the chips were fixed with 2.5% glutaraldehyde (Agar Scientific, Essex, UK) in 0.15 M HEPES (Sigma-Aldrich) buffer (670 mOsm, pH 7.35). The samples were placed at 4 °C. Samples were post-fixed for 1 h in a 1% osmium tetroxide solution in 0.1 M sodium cacodylate buffer (Merck) and rinsed three times in the same buffer. Next, the chips were dehydrated at room temperature with an ethanol concentration series (70, 80 and 96%) for 15 min each. Then, they were immersed in 100% ethanol (Merck) three times for 10 min. The chips were embedded in an epoxy solution and incubated at 60 °C for 4 days. For samples without cells, the chips were directly embedded in the epoxy solution. After removing the PDMS surrounding the gold mesh, ultrathin sections (70 nm) were cut with an ultramicrotome UC6 (Leica Microsystems) and mounted on 1 mm single-slot copper grids. Pictures were taken with a Philips EM 400 transmission electron microscope.
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2

Ultrastructural Changes in Motor Cortex

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The gerbils were perfused intracardially with normal saline and fixed rapidly with 4% glutaraldehyde (in phosphate-buffered saline) at 4 °C. The motor cortices were isolated and post-fixed with 1% osmium tetroxide for two hours. Subsequently, the tissues were dehydrated through the ethanol series and acetone and embedded in Epon812 epoxy resin (PELCO Eponate 12TM Kit; Clovis, CA, USA) according to general methods. Thereafter, the embedded tissues were cut into 50-nm thickness using a UC-7 ultramicrotome (Leica Biosystems, Wetzlar, Germany) and placed on copper grids. Thereafter, the sections were stained using uranyl acetate, and ultrastructural changes following tFI were observed using a Philips EM400 transmission electron microscope (Koninklijke Philips N.V., Amsterdam, The Netherlands).
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3

Characterization of Nanoparticle Samples

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Transmission electron microscope (TEM) images were collected using a Phillips EM-400 transmission electron microscope operating at an accelerating voltage of 120 kV. Samples were prepared by casting one drop of dilute dispersed sample in toluene onto a 300-mesh Formvar and carbon-coated copper grid (Ted Pella, Inc.). Particle counting analysis used a minimum of 200 individual particles and size was determined using the ImageJ program (http://rsbweb.nih.gov/ij/). Powder X-Ray diffraction (XRD) patterns were collected with a Rigaku SmartLab X-ray Diffractometer in the Bragg-Brentano geometry using Cu Kα radiation. Samples were dropcast in toluene onto either a zero background plate or a fused quartz substrate. Simulated powder XRD patterns were made using the CrystalMaker software suite. Scanning electron microscope (SEM) images of dropcast films were obtained using a Zeiss NVision 40 field emission SEM operating at 3 kV. X-Ray photoelectron spectroscopy (XPS) analyses were performed on a Kratos Axis Ultra X-ray photoelectron spectrometer with a monochromatic Al Kα excitation source operating at 15 kV and 10 mA. Samples were prepared by dropcasting the sample onto a gold-coated Si wafer.
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