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Regulus su8230

Manufactured by Hitachi
Sourced in Japan

The Regulus SU8230 is a high-resolution field emission scanning electron microscope (FE-SEM) manufactured by Hitachi. It is designed to provide high-quality imaging and analysis capabilities for a wide range of materials and samples.

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3 protocols using regulus su8230

1

Extracellular Vesicle Visualization Workflow

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Purified EVs resuspended in Phosphate Buffered Saline(PBS) were dropped onto a sheet of Parafilm and a 200-mesh formvar coated copper grids were floated at room temperature allowed to adsorb for 10 min, followed by wash with PBS twice and fixed with 2% paraformaldehyde. After rinsing with PBS twice, the grids were negatively stained with 2% Uranyl acetate for 2 min and observed using a transmission electron microscope(Hitachi HT7700 TEM, Tokyo, Japan) or scanning electron microscope(Hitachi Regulus SU8230, Tokyo, Japan).
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2

Characterizing Calcite Surface Morphology

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The surface morphology and elements of the calcite were examined using scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS) (Regulus SU8230, Hitachi, Tokyo, Japan). The resin A glue and B glue were mixed with a mass ratio of 3:1, stirred for 5 min to obtain transparent mixed resin glue, the flake calcite sample (5 × 5 × 3 mm) was placed in a silica gel mold with a diameter of 1.0 cm, and then the resin glue was poured and allowed to stand for 24 h to obtain the glued calcite sample. Then, 200, 800, 1500, 3000, and 5000 mesh silicon carbide sandpaper were used to polish the glued calcite sample surface. The samples were then processed with 3 mol/L sulfuric acid, reacting for 5 min. After that, the mineral samples were coated with gold using a sputter coater after being dried in a vacuum oven at 40 °C. Finally, the processed samples were examined using a Phenom (Ambler, PA, USA) ProX equipment at a 10 kV accelerating voltage.
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3

Topological Imaging with FE-SEM

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Field emission SEM (FE-SEM) was used to obtain the surface topology (Hitachi Regulus SU8230). The samples were placed on the microscope holder and adhered to a carbon tape. It was then loaded into the FE-SEM chamber, with a working distance of 3.8 mm, an accelerating voltage of 15 kV, and an emission current of 700 nA. The reading from secondary electron detectors was then used to obtain the topological information.
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