Fluoromax 4 pl spectrometer

The thicknesses of MP1D films deposited by using various solutions (50, 75, 100, 125, and 150 mM) were estimated by surface profiler (Bruker Dektak XT, Billerica, MA, USA) and were 67, 70, 77, 132, and 267 nm, respectively. The current-voltage curves of the ITO/MP1D/Al sandwich-type devices were measured by Keitheley 4200 semiconductor analyzer. The photocurrent was obtained in AM 1.5 G solar spectrum with a power density of 100 mW/cm² at 25 °C. To analyze the elemental composition of MP1D film, X-ray photoelectron spectroscopy (XPS) was measured by an X-ray photoelectron spectrometer (ULVAC-PHI, PHI Quantera II, Kanagawa, Japan) equipped with a monochromatic Al Kα X-ray source (1486.6 eV). To observe self-assembled nanoparticles, tunneling electron microscope (TEM) images were employed (JEOL JEM-2100 TEM, Tokyo, Japan). PL characteristics were performed on a FluoroMax-4 PL spectrometer (Horiba Jobin Yvon, Kyoto, Japan) under illumination of 325 nm wavelength at room temperature. Ultraviolet-visible (UV-Vis) absorption and reflectance spectra were conducted by using an UV/VIS/NIR spectrophotometer (UV-3150, Shimadzu Corporation, Tokyo, Japan). The optical band-gap energy (E_g) was measured from UV-Vis absorption spectra.

The thicknesses of MP8B films prepared from different solutions (1, 5, 10, and 25 mM) were measured by surface profiler (Bruker Dektak XT, Billerica, MA, USA) and were 63 nm, 65 nm, 81 nm, and 84 nm, respectively. The morphology of the polymer films were observed by atomic force microscope (Bruker, Dimension ICON, Tucson, AZ, USA). For the analysis of self-assembled nanoparticles, TEM images were captured (JEOL JEM-2100 TEM, Tokyo, Japan). PL properties were measured by a FluoroMax-4PL spectrometer (Horiba Jobin Yvon, Kyoto, Japan) and recorded in the range of 400–700 nm at 325 nm excitation wavelength at room temperature. UV-Vis absorption, reflectance, and transmittance spectra were measured using an UV/VIS/NIR spectrophotometer (UV-3150, Shimadzu Corporation, Tokyo, Japan). UV-Vis absorption spectra were also employed to estimate the optical band-gap energy (E_g).