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Multimode iiia

Manufactured by Bruker
Sourced in United States

The MultiMode IIIa is a high-performance atomic force microscope (AFM) designed for a wide range of applications in materials science, nanotechnology, and life sciences. It offers high-resolution imaging, advanced force spectroscopy, and a variety of scanning modes to enable comprehensive characterization of samples at the nanoscale.

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2 protocols using multimode iiia

1

Atomic Force Microscopy of Bacterial Cellulose

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AFM imaging was carried out using a commercial scanning probe microscope MultiMode IIIa, (Bruker, USA) in air and liquid. Liquid imaging was performed both in contact and in tapping modes in a tapping mode liquid cell (Bruker, USA). Silicon nitride AFM probes of NP series (Bruker, USA) were used in air and in both modes in liquid. For AFM imaging in liquid, water-rinsed BC films were dried in ambient conditions and glued to metal disks. A drop of distilled water was injected into the AFM liquid cell. After the swelling of the hydrated part of the BC membrane, AFM images were acquired. Image processing and representation was performed by means of FemtoScan001 SPM image processing software (Advanced Technologies Center, Russia). The experimental scatter for cells height measurements was determined as the standard deviations of averaged mean values (N = 50).
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2

Atomic Force Microscopy Imaging Protocol

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AFM images were taken using either a Bruker (formerly Veeco) Dimension 3100 or Bruker Multimode IIIa. Images were taken in tapping mode in air using AppNano ATC-25 silicon cantilevers with a nominal tip radius of 10 nm and resonant frequency of 307 kHz. Drive amplitudes were often high to combat surface adhesion, but set points were kept at 80 % of free amplitude. Two μm and 10 μm height and phase images, 512 px × 512 px in resolution, were collected. Nine horizontal lines were drawn on each image and average roughness was calculated using Gwydion software (version 2.38); data was further analysed using Graph Pad Prism version 5.03 software.
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