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Sirion 200 microscope

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Sirion 200 is a high-resolution scanning electron microscope (SEM) designed for advanced imaging and analysis. It features a high-brightness electron source and advanced optics to deliver exceptional resolution and image quality. The Sirion 200 is capable of imaging a wide range of samples, including materials, life science, and nanotechnology specimens.

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4 protocols using sirion 200 microscope

1

Comprehensive Characterization of Catalytic Materials

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Transmission electron microscopy (TEM) images were taken on a JEM 2100 F microscope (JEOL, Japan) operated at 200 kV. Scanning electron microscopy (SEM) imaging was carried out on a Sirion 200 microscope (FEI, USA) operated at 5 kV. Nitrogen sorption isotherms were obtained at 77 K with a Micromertics ASAP 3020 analyzer (Micromertics, USA). Before each measurement, the sample was degassed in vacuum at 200 °C for at least 5 h. The Brunauer-Emmett-Teller (BET) method was used to calculate the specific surface areas of the samples. The Barrett-Joyner-Halenda (BJH) model was utilized to analyze pore size distributions, based on which total pore volumes could be obtained. Powder X-ray diffraction (XRD) data were collected with a MiniFlex 600 diffractometer (Rigadu, Japan) using Cu Kα radiation (40 kV, 15 mA). The X-ray photoelectron spectra (XPS) were recorded on an ESCALab MKII X-ray photo-electron spectrometer using Mg Kα radiation as an exciting source. The Co and B contents were determined with an Optima 7300 DV ICP-AES (PerkinElmer, USA). The N and C contents were analyzed with a VarioELIII element analyzer (Elementar Analysensysteme GmbH, Germany).
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2

Multimodal Characterization of Materials

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Scanning electron microscopy (SEM) images were obtained on a Sirion200 microscope (FEI Company, Eindhoven, the Netherlands) at an accelerating voltage of 10.0 kV. The infrared spectra were obtained from a Nicolet 6700 Fourier transform infrared (FT-IR) spectrometer (Thermo Fisher Scientific, Waltham, MA, USA). X-ray diffraction (XRD) pattern was collected on a Bruker axs D8 advanced diffractometer (Bruker Corporation, Frankfurt, Germany) using Cu Kα radiation. X-ray photoelectron spectroscopy (XPS) spectra were collected on a Shimadzu Axis-Ultra multifunctional X-ray photoelectron spectrometer (Shimadzu Corporation, Tokyo, Japan) using an Al K X-ray source. Metal concentrations were confirmed using a Perkin-Elmer Optima 2100 (Perkin-Elmer Company, Waltham, MA, USA) inductively coupled plasma-optical emission spectrometry (ICP-OES).
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3

Visualizing S. aureus Biofilm Formation

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S. aureus in TSB broth was added into wells of a 6-well tissue culture plate. LBA was then added to the final concentrations which were 1 × MIC and 0.5 × MIC. Sterile glass slides (10mm × 10 mm) were added to each well and incubated at 37 °C for 24 h. Each cover glass covered by biofilm was washed twice with PBS to remove non-adherent bacteria, and examined by field emission-SEM (FE-SEM) using a Sirion 200 microscope (FEI, Hillsboro, OR, USA) as previously described with minor modifications [19 (link)]. The biofilms were fixed in 1 mL of 2.5% glutaraldehyde for 12 h at 4 °C. The fixed cells were dehydrated in a gradient of 30, 50, 70, 90, 95, and 100% ethanol (v/v). After freeze-drying and gold coating, the S. aureus biofilm samples were observed by high-resolution FE-SEM using a Sirion 200 microscope at an accelerating voltage of 20 kV and 20,000× magnification. The group without LBA as the control.
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4

Multi-Technique Characterization of Composite Materials

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FTIR was recorded using a Nicolet iS10 spectrometer (USA) with KBr pellet. XRD was carried out with a Rigaku D/MAX-2500 (Japan) using Cu Kα radiation source. SEM was conducted with a Hitachi SU8020 microscope (Japan) at an accelerating voltage of 1 kV and a FEI sirion200 microscope (Holland) at an accelerating voltage of 20 kV to observe the surface and fracture surface of the composites, respectively. The diameter distribution of particles was characterized by Malvern Zetasizer 3000HSA (UK). The Dielectric properties of the composites were determined by broad dielectric tester (HIOKI3532-50 LCR meter, Japan) in the frequency range of 102–107 Hz at room temperature. The breakdown strength was measured by HT-100 withstand voltage tester (China) and the voltage was continuously increased at the rate of 1kV/s until the sample broken down. The thermal gravimetric analysis (TGA) was carried out by using an STA 449F3 simultaneous thermal analyzer (Germany) at a heating rate of 10°C/min from 40°C to 550°C in nitrogen atmosphere.
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