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5 protocols using jes fa200 esr spectrometer

1

Multi-Modal Characterization of Luminescent Materials

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CL aptitudes were
measured with a BPCL luminescence analyzer (Institute of Biophysics,
Chinese Academy of Sciences, Beijing, China). A F-7000 fluorescence
spectrophotometer (Hitachi, Japan) was used for the photoluminescence
(PL) study, and absorption spectra were recorded by a UV-3900s spectrophotometer
(Hitachi, Japan). Electron spin resonance (ESR) analysis was performed
on a JEOL JES-FA200 ESR spectrometer (ESP-300E, Bruker, Japan). Mass
spectrometry was performed on MALDI-TOF-MS (Shimadzu Biotech Axima,
Japan). Electrochemical measurements were carried out using a Zahner
IM6 potentiostat (Zahner Elektrik GmbH & Co. KG-Kronach, Germany).
The CL spectra were recorded by a F-7000 fluorescence spectrophotometer
(Hitachi, Japan) at a closed light source in a flow cell connected
to peristaltic pumps.
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2

Characterization of Chemical Compounds

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All commercially available chemicals were used without further purification. The solvents used in this study were processed by standard procedures. 1H-NMR experiments were carried out on a JEOL ECX-400 MHz instrument. DOSY experiment was carried out on a Bruker Avance 600 MHz instrument using a 5 mm TXI H-C/N-D Z-GRD probe. 2D sequence for diffusion measurements were conducted using stimulated echo with 1 spoil gradient. Mass spectra were obtained using a Thermo Scientific Exactive Orbitrap instrument. UV-vis measurements were performed using Agilent Cary Series UV-Vis-NIR. EPR experiments were carried out using JEOL JES-FA200 ESR Spectrometer and Bruker E580. Elemental analyses were recorded on a Thermo FlashEA 1112 elemental analyzer. The details of X-ray crystallographic measurements are summarized in Supplementary Data 5 and 6.
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3

Comprehensive Characterization of Material Samples

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The crystal structures and phase data of samples could be determined by X-ray diffractometry (XRD) (D/MAX2500 PC, Rigaku Corporation, Tokyo, Japan). The morphologies and composition of the samples could be investigated by transmission electron microscopy (TEM) (JEM-2010, JEOL Ltd., Akishima, Japan), energy dispersive X-ray spectroscopy (EDX) (s-4800, Hitachi, Chiyoda, Japan), and scanning electron microscopy (SEM) (s-4800, Hitachi, Chiyoda, Japan). The spectrofluorometer (f7000, Hitachi, Chiyoda, Japan) could be used to investigate the separation efficiency of photo-induced charge for powdered samples. The Perkin Elmer System 2000 infrared spectrometer provided the Fourier transform infrared (FTIR) spectra (Perkin Elmer, Shanghai, China), with KBr as the reference sample. The spin trapping electron spin resonance (ESR) measurements were performed on a Bruker JES FA200 ESR spectrometer (Oubeier, Beijing, China). The electrochemical and photoelectrochemical measurements were performed via a three-electrode quartz cell system. A CHI 660B electrochemical system (Shanghai Chenhua Instrument Corp., Shanghai, China) was used to record the photoelectrochemical results.
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4

Characterization of Catalytic Materials

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X-ray powder diffractometer (Shimadzu XRD-7000) was used to analyse the crystallographic properties of the catalyst. X-ray photoelectron spectroscopy (XPS) was obtained using PHI-5400 (America PE) 250 xi system. The morphology of the sample was analysed by scanning electron microscope (SEM, JSM-6700F) and transmission electron microscope (JEM-2100) (Japan electronics). Energy disperse X-ray (EDX) was performed using a field emission scanning electron microscope (JSM-7610F) to analyse the samples elemental features. The photoluminescence (PL) spectra were measured with an FLS 980 Series of Fluorescence Spectrometers (UK). The UV-Vis diffuse reflectance spectra (UV-Vis-DRS) was measured on UV-2550 UV-Vis Spectrophotometer. The electron spin resonance (ESR) spectra were examined on a Bruker model ESR JES-FA200 spectrometer.
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5

Comprehensive Structural and Spectroscopic Analysis

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The crystal structure and phase purity of the samples were examined by powder X-ray diffractometer (XRD, Bruker D8 Advance, Cu Kα radiation λ = 1.540 nm). The morphologies and structures were characterized by transmission electron microscopy (TEM, JEM-2010). X-ray photoelectron spectroscopy (XPS, THERMO SCIENTIFIC K-ALPHA) was utilized to analyze the valence. The Fourier transform infrared spectrometer (FT-IR Nicolet 5700), ranges from 400 to 4000 cm−1. The samples were tested with UV-vis diffuse reflectance spectroscopy (DRS, Lamda 850, United States) using an ultraviolet-visible light photometer. Porosity and Brunauer–Emmett–Teller1 surface areas of the products were evaluated by multi-point BET method with adsorption data. Electron paramagnetic resonance (EPR) spectra were performed using a Bruker ESR JES-FA200 spectrometer. The nitrogen adsorption–desorption isotherms were collected through a TriStar II 3020 Surface Area Analyzer. Transmission electron microscopy (TEM) images and high-resolution TEM image were obtained via a JEOL-2100 TEM with an acceleration voltage of 200 kV. UV-vis diffuse reflection spectra of the prepared samples were recorded on a UV-2450 UV-vis spectrophotometer.
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