TEM was performed on a JEOL JEM 1101 (USA) transmission electron microscope. The samples for TEM were prepared by placing a drop of primary sample on a holey carbon copper grid and drying for 6 h at 80 °C in an oven.
Jem 1101
Manufactured by JEOL
Sourced in Japan, United States
The JEM 1101 is a transmission electron microscope (TEM) produced by JEOL. It is designed to provide high-resolution imaging and analysis of materials at the nanoscale. The JEM 1101 offers a stable and reliable platform for a wide range of research and industrial applications.
Automatically generated - may contain errors
Lab products found in correlation
Lambda 35, by PerkinElmer (3 mentions)
D2 phaser x ray diffractometer, by Bruker (1 mentions)
Raman spectroscopy, by Renishaw (1 mentions)
1000 ftir instrument, by PerkinElmer (1 mentions)
Jsm 7600 f instrument, by JEOL (1 mentions)
D2 phaser, by Bruker (1 mentions)
Jsm 6360a, by JEOL (1 mentions)
Altima 4, by Rigaku (1 mentions)
Phi 5600 multi technique xps, by Physical Electronics (1 mentions)
Nova 4200e surface area and pore size analyzer, by Anton Paar (1 mentions)
7 protocols using jem 1101
1
Transmission Electron Microscopy Sample Preparation
2
Characterization of Synthesized Nanomaterials
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The formation of as-synthesized GO and PGE-HRG-Ag was confirmed by several techniques, including, UV-Vis spectroscopy (PerkinElmer lambda 35 [Waltham, MA, USA]), high-resolution transmission electron microscopy (JEM 1101 [JEOL, Tokyo, Japan]), XRD (D2 Phaser X-ray diffractometer [Bruker Optik GmbH, Ettlingen, Germany]), Cu Kα radiation (λ=1.5418 Å), and Raman spectroscopy (Renishaw, Gloucestershire, UK) equipped with a 514.5 nm line of argon ion laser as excitation source.
3
Characterization of Functionalized Nanoparticles
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UV measurements
were performed using a Perkin-Elmer lambda 35 (Waltham, MA, USA) UV-visual
spectrophotometer. The analysis was performed in quartz cuvettes using
distilled water as a reference solvent. The sample for the UV measurement
is obtained from a stock solution, which was prepared by diluting
1.0 mL functionalized NPs in 9 mL water via sonication for 15 min.
This stock solution was further diluted by taking a 2 mL solution
in 8.0 mL water. IR measurements were performed on a Perkin-Elmer
1000 (USA) Fourier transform infrared spectrometer. To remove residual
or unbound glutamic acid molecules, the functionalized NPs were gently
washed several times with ethanol. The sample was isolated by centrifuge
at 9000 rpm for 30 min and dried in an oven for further use. Subsequently,
the functionalized NPs were mixed with KBr powder to prepare the pellet
for IR measurements. Background correction was made using a reference
blank KBr pellet. The X-ray diffraction pattern was measured on an
Altima IV [Make: Regaku, Japan] X-ray powder diffractometer using
Cu Kα radiation (λ = 1.5418 Å). Meanwhile, TEM images
were obtained from a JEOL JEM 1101 (USA) transmission electron microscope.
The samples for TEM were prepared by placing a drop of the primary
sample on a copper grid, which were dried for 6 h at 80 °C in
an oven.
were performed using a Perkin-Elmer lambda 35 (Waltham, MA, USA) UV-visual
spectrophotometer. The analysis was performed in quartz cuvettes using
distilled water as a reference solvent. The sample for the UV measurement
is obtained from a stock solution, which was prepared by diluting
1.0 mL functionalized NPs in 9 mL water via sonication for 15 min.
This stock solution was further diluted by taking a 2 mL solution
in 8.0 mL water. IR measurements were performed on a Perkin-Elmer
1000 (USA) Fourier transform infrared spectrometer. To remove residual
or unbound glutamic acid molecules, the functionalized NPs were gently
washed several times with ethanol. The sample was isolated by centrifuge
at 9000 rpm for 30 min and dried in an oven for further use. Subsequently,
the functionalized NPs were mixed with KBr powder to prepare the pellet
for IR measurements. Background correction was made using a reference
blank KBr pellet. The X-ray diffraction pattern was measured on an
Altima IV [Make: Regaku, Japan] X-ray powder diffractometer using
Cu Kα radiation (λ = 1.5418 Å). Meanwhile, TEM images
were obtained from a JEOL JEM 1101 (USA) transmission electron microscope.
The samples for TEM were prepared by placing a drop of the primary
sample on a copper grid, which were dried for 6 h at 80 °C in
an oven.
4
Visualizing Nanoparticle Size and Shape
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5
Characterization of Silver Nanoparticles
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A UV-Visible analysis was performed on lambda 35, Perkin Elmer, Waltham, MA, USA. A Fourier transform infrared analysis were performed on a 1000 FTIR instrument, Perkin-Elmer Waltham, MA, USA. The X-ray powder diffraction analysis of the as-prepared silver nanoparticles was performed on D2-Phaser, Bruker, Germany. Transmission electron microscopy (TEM) analysis was performed using JEM-1101, Jeol, Japan. Scanning electron microscopy (SEM) and an energy-dispersive X-ray analysis was performed using JSM 7600F instrument, JEOL, Tokyo, Japan.
6
Characterization of Silver Nanoparticles
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TEM and EDX were performed with a JEM 1101 transmission electron microscope (JEOL, Tokyo, Japan) to confirm the size, shape, and elemental composition of the AgNPs. The sample was dispersed in ethanol on a carbon-coated copper TEM grid, and the images were obtained by operating at an accelerating voltage of 120 kV.
7
Characterization of Nanoparticle Morphology and Composition
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SEM and elemental analysis (energy-dispersive X-ray analysis (EDX)) were carried out using a Jeol SEM model JSM 6360A (JEOL Ltd., Akishima-shi, Japan). This was used to determine the morphology of nanoparticles and its elemental composition. TEM was carried out using a Jeol TEM model JEM-1101 (JEOL Ltd., Akishima-shi, Japan), which was used to determine the shape and size of nanoparticles. Powder X-ray diffraction studies were carried out using an Altima IV (Make: Rigaku, Shibuya-ku, Japan) X-ray diffractometer. Fourier transform infrared spectroscopy (FT-IR) spectra were recorded as KBr pellets using a PerkinElmer 1000 FT-IR spectrophotometer (PerkinElmer, Waltham, MA, USA). BET surface area was measured on a NOVA 4200e surface area and pore size analyzer (Quantachrome Instruments, FL, USA). Thermogravimetric analysis was carried out using PerkinElmer Thermogravimetric Analyzer 7 (PerkinElmer, Waltham, MA, USA). XPS was measured on a PHI 5600 Multi-Technique XPS (Physical Electronics, Lake Drive East, Chanhassen, MN, USA) using monochromatized Al Kα at 1486.6 eV. Peak fitting was performed with CASA XPS Version 2.3.14 software.
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