The transmission electron microscopy (TEM) images were taken on a JEM-200CX instrument (Japan), using an accelerating voltage of 200 kV. The HRTEM images were recorded on JEOL-2100F apparatus at an accelerating voltage of 200 kV. Surface morphologies of the carbon materials were examined by a scanning electron microscope (SEM, JSM-7600F) at an acceleration voltage of 10 kV. The EDS spectra were taken on JSM-5160LV-Vantage typed energy spectrometer. The powder X-Ray diffraction (XRD) patterns were recorded on a D/max 2500 VL/PC diffractometer (Japan) equipped with graphite monochromatized Cu Kα radiation (λ = 1.54060 Å). Corresponding work voltage and current is 40 kV and 100 mA, respectively. X-ray photon spectroscopy (XPS) was recorded by a scanning X-ray microprobe (PHI 5000 Verasa, ULAC-PHI, Inc.) using Al kα radiation and the C1s peak at 284.6 eV as internal standard. The Raman spectra of dried samples were obtained on Lab-RAM HR800 with excitation by an argon ion laser (514.5 nm). The nitrogen adsorption-desorption experiments were operated at 77 K on a Micromeritics ASAP 2050 system. Prior to the measurement, the samples were degassed at 150°C for 10 h.
Asap 2050 system
Manufactured by Micromeritics
The ASAP 2050 system is a surface area and porosity analyzer designed to measure the physical characteristics of solid materials. It utilizes gas adsorption techniques to determine the surface area, pore volume, and pore size distribution of a wide range of materials.
Automatically generated - may contain errors
Lab products found in correlation
Escalab 250 spectrometer, by Thermo Fisher Scientific (4 mentions)
Model d max rc x ray diffractometer, by Thermo Fisher Scientific (3 mentions)
Thermogravimetric analyzer, by PerkinElmer (1 mentions)
S 4800 scanning electron microscope, by Hitachi (1 mentions)
60thermoanalyzer, by Shimadzu (1 mentions)
Tecnai g2 f20 microscope, by JEOL (1 mentions)
S 4800 scanning electron microscope, by JEOL (1 mentions)
Jem 2100f, by JEOL (1 mentions)
Jem 2010, by JEOL (1 mentions)
5 protocols using asap 2050 system
1
Comprehensive Characterization of Carbon Materials
2
Comprehensive Characterization of Material Samples
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The morphology and particle size of the samples were investigated using a JEOL JEM-2010 transmission electron microscopy (TEM) operated at an accelerating potential of 200 kV. Scanning electron microscopy (SEM) images were captured on a Hitachi S-4800 scanning electron microscope, operating at 5 kV. X-ray diffraction (XRD) patterns were performed on Model D/max-rC X-ray diffractometer using Cu Kα radiation source (λ = 1.5406 Å) and operating at 40 kV and 100 mA. X-ray photoelectron spectroscopy (XPS) measurements were carried out on a Thermo VG Scientific ESCALAB 250 spectrometer with a monochromatic Al Kα X-ray source (1486.6 eV photons). The binding energy was calibrated with respect to C1s at 284.6 eV. The compositions of the catalysts were determined using the energy dispersive X-ray (EDX) technique. The Brunauer-Emmett-Teller (BET) specific surface area and pore size distribution were measured at 77 K using a Micromeritics ASAP 2050 system. Fourier transform infrared (FTIR) spectrum was recorded with a Nicolet 520 SXFTIR spectrometer. The UV-vis spectra were recorded at room temperature on a UV3600 spectrophotometer. Thermal analysis was performed on a Perkin Elmer thermogravimetric analyzer under air atmosphere with a heating rate of 10 °C min−1.
3
Comprehensive Characterization of Nanomaterials
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The FTIR
was collected on a Nexus 670 spectrometer. The Raman measurements
were carried out using a Renishaw inVia Raman Microscope (532 nm).
The thermogravimetric analysis (TGA) was carried out by using a Shimadzu-60
thermoanalyzer in air argon with a heating rate of 10 °C min–1 from room temperature to 1100 °C. Nitrogen adsorption–desorption
isotherms were evaluated at 77 K on a Micromeritics ASAP 2050 system,
whereas the pore size distributions were calculated according to the
Barrett–Joyner–Halenda formula. The TEM and high-resolution
TEM images were captured by JEOL-2100F apparatus and JEOL JSM-6700
M scanning electron microscope, respectively. The energy-dispersive
X-ray (EDX) was performed on JSM-5160LV-Vantage typed energy spectrometer.
The XPS measurements was collected on a scanning X-ray microprobe
(PHI 5000 Verasa; ULAC-PHI, Inc.) using the excitation energy of 1486.6
eV (Al Kα) and the C 1s line at 284.8 eV as energy reference.
was collected on a Nexus 670 spectrometer. The Raman measurements
were carried out using a Renishaw inVia Raman Microscope (532 nm).
The thermogravimetric analysis (TGA) was carried out by using a Shimadzu-60
thermoanalyzer in air argon with a heating rate of 10 °C min–1 from room temperature to 1100 °C. Nitrogen adsorption–desorption
isotherms were evaluated at 77 K on a Micromeritics ASAP 2050 system,
whereas the pore size distributions were calculated according to the
Barrett–Joyner–Halenda formula. The TEM and high-resolution
TEM images were captured by JEOL-2100F apparatus and JEOL JSM-6700
M scanning electron microscope, respectively. The energy-dispersive
X-ray (EDX) was performed on JSM-5160LV-Vantage typed energy spectrometer.
The XPS measurements was collected on a scanning X-ray microprobe
(PHI 5000 Verasa; ULAC-PHI, Inc.) using the excitation energy of 1486.6
eV (Al Kα) and the C 1s line at 284.8 eV as energy reference.
4
Comprehensive Characterization of Carbon Materials
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The TEM and HRTEM images were recorded on JEOL-2100F apparatus at an accelerating voltage of 200 kV. Surface morphologies of the carbon materials were examined by a SEM (JSM-7600F) at an acceleration voltage of 10 kV. The EDX was taken on JSM-5160LV-Vantage-typed energy spectrometer. The XRD patterns were recorded on a D/max 2500VL/PC diffractometer (Japan) equipped with graphite monochromatized Cu Kα radiation (λ=1.54060 Å). Corresponding work voltage and current is 40 kV and 100 mA, respectively. XPS was recorded by a scanning X-ray microprobe (PHI 5000 Verasa, ULAC-PHI, Inc.) using Al Kα radiation and the C1s peak at 284.8 eV as internal standard. The Raman spectra of dried samples were obtained on Lab-RAM HR800 with excitation by an argon ion laser (514.5 nm). The nitrogen adsorption–desorption experiments were operated at 77 K on a Micromeritics ASAP 2050 system. BET surface areas were determined over a relative pressure range of 0.05–0.3, during which the BET plot is linear. The pore size distributions were measured by using the nonlocalized density functional theory method. Before the measurement, the samples were degassed at 150 °C for 10 h.
5
Comprehensive Structural Characterization of Products
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The morphology and structure of products were measured with a Hitachi S-4800 scanning electron microscope (SEM) and JEOL JEM-2010 transmission electron microscope (TEM). High-resolution TEM (HRTEM), energy-dispersive X-ray (EDX), high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM), and elemental mapping measurements were carried out on a FEI Tecnai G2 F20 microscope, which was built as an accessory on the JEOL JEM-2100F. The Fourier transform infrared (FTIR) spectra were obtained with a Nicolet 520 SXFTIR spectrometer. The Brunauer–Emmett–Teller (BET) specific surface area and pore size distribution were examined at 77 K using a Micromeritics ASAP 2050 system. The phase purity and crystallinity of the products were confirmed by X-ray diffraction (XRD) on a Model D/max-rC X-ray diffractometer using Cu Kα radiation source (λ = 1.5406 Å) and operating at 40 kV and 100 mA. X-ray photoelectron spectroscopy (XPS) tests were performed on a Thermo VG Scientific ESCALAB 250 spectrometer with a monochromatic Al Kα X-ray source (1486.6 eV photons). The binding energy was trued with respect to C1s at 284.6 eV.
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