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Copper temgrid

Manufactured by Agar Scientific
Sourced in United Kingdom

The Copper TEMgrid is a specialized sample support for transmission electron microscopy (TEM) applications. It is made of copper and is designed to hold thin specimens for analysis under the electron beam. The Copper TEMgrid provides a stable and conductive platform for sample observation and examination in the TEM.

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2 protocols using copper temgrid

1

High-Resolution SEM Imaging and Analysis

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High-resolution
SEM images
were obtained with a Nova NanoSEM 450 instrument (FEI). SEM-EDX was
conducted using a FEI XL30FEG electron microscope equipped with an
EDAX detector. Spectral analysis and quantification were performed
with Genesis 4.61 software. Samples were mounted onto a copper TEM
grid (300 mesh, Agar Scientific) fixed on a gold-coated cover slide
which was then immobilized on to an aluminum stub using carbon sticker.
These were imaged without any further sample modification.
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2

Characterization of Silver Nanoparticles

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Further confirmation
of NP size distribution was attained by diameter measurement using
electron micrographs from a transmission electron microscope (TEM,
Tecnai G2, FEI). The TEM samples were made ready by drop-casting 2
μL of individual silver NPs in glycerol solution onto a Formvar–carbon-coated
400 mesh copper TEM grid (Agar Scientific, UK) at RT until being dried
and imaged on a FEI Tecnai TF20 FEG high-resolution TEM system, operating
at 200 kV. For the calibration of magnification as well as the scale
bar for TEM images, a standard cross-grating was used. For the calculation
of the average size and standard deviation of silver NPs, an image-processing
tool (Image J 1.50i) was used, with around 50 particles in the TEM
images.
Scanning-TEM-HAADF (high-angle annular dark-field) images
and STEM-energy-dispersive X-ray spectroscopy (STEM-EDS) spectrum
images were obtained with a Nion UltraSTEM 200-X instrument. The magnification
calibrations for the HAADF images were checked against the gold nanoparticle
lattice spacing. The EDS spectrum images were measured using EDX AMETEK,
with an active area of 30 mm, and analyzed with the TIA (TEM Imaging
and Analysis) software. The STEM-EDS maps are drawn with raw counts,
using the Cu peaks.
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