The morphology of synthesized samples was examined using a scanning electron microscope (SEM, JEOL JSM-IT800, Tokyo, Japan). High-resolution transmission electron microscopy (HRTEM, JEOL JEM-2200FS, Tokyo, Japan) was used to analyze the microstructures of synthesized samples. Using energy-dispersive x-ray spectroscopy (EDX), elemental analysis was conducted with scanning transmission electron microscopy (STEM, JEOL JEM-2200F, Tokyo, Japan). Attenuated total reflectance: Fourier transform infrared (ATR-FTIR) spectra were acquired at room temperature with an ATR-FTIR spectrometer (Bruker, Tensor 27, Billerica, MA, USA). To evaluate the elemental composition, X-ray diffraction (XRD) (Rigaku Miniflex II desktop, Tokyo, Japan) measurements were performed. To determine the actual amount of each component in the nanocomposite, simultaneous thermal analysis (STA) was performed using a Rigaku (Thermo Plus Evo2, Tokyo, Japan) analyzer in air.
Jem 2200f
Manufactured by JEOL
Sourced in Japan, United States
The JEM-2200FS is a field emission scanning transmission electron microscope (FE-STEM) designed for high-resolution imaging and analytical capabilities. It is equipped with a field emission gun and advanced optics to achieve high-resolution imaging and precise elemental analysis.
Automatically generated - may contain errors
Lab products found in correlation
S 4800, by Hitachi (5 mentions)
Em gp, by Leica (5 mentions)
Labram hr800, by Horiba (4 mentions)
Temcam f416, by TVIPS (4 mentions)
Drx 500 spectrometer, by Bruker (3 mentions)
D max 2500, by Rigaku (3 mentions)
Vitrobot mark 4, by Thermo Fisher Scientific (3 mentions)
Jem 1011, by JEOL (3 mentions)
D8 advanced, by Bruker (3 mentions)
Theta probe, by Thermo Fisher Scientific (3 mentions)
D8 advance, by Bruker (3 mentions)
Tensor 27, by Bruker (3 mentions)
Multilab 2000, by Thermo Fisher Scientific (3 mentions)
Escalab 250, by Thermo Fisher Scientific (3 mentions)
Jsm 7001f, by JEOL (2 mentions)
Xl30s feg, by Philips (2 mentions)
Alpha 300 r spectrometer, by WITec (2 mentions)
Kbr windows, by PIKE Technologies (2 mentions)
K3 direct electron detector, by Ametek (2 mentions)
Libra 120, by Zeiss (2 mentions)
189 protocols using jem 2200f
1
Comprehensive Characterization of Synthesized Nanocomposites
2
Characterization of Ni-Doped Graphene
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The microstructure of Ni-doped graphene was indicated by transmission electron microscope (JEM-2200FS JEOL Japan). The crystal lattice structures of Ni-doped graphene were showed by XRD (D/max-2550 RigaKu Japan) and HRTEM (JEM-2200FS JEOL Japan).
3
Nanoparticle Characterization by TEM
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TEM images of the nanoparticles for the evaluation of the particle size were acquired with a Zeiss Leo EM922 Omega TEM with an accelerating voltage of 200 kV. For each sample 4 µL of very diluted NP dispersion were drop-casted on a carbon-coated meshed copper grid and dried in air. Aqueous dispersions were transferred to ethanol for faster drying. Particle sizes were obtained by measuring 100 particles from at least three images.
TEM images of the lattice planes of the nanoparticles (capped with L-lysine, aminobenzoic acid, tartaric acid and cysteamine) were acquired with a JEOL JEM-2200FS with an accelerating voltage of 200 kV at high magnification. The samples were prepared as for evaluation of particle size. Occurring atomic distances were evaluated by creating diffraction patterns by Fourier Transformation with Image J and comparing those to projections of magnetite in Jmole. For each sample about 20 images were evaluated. The existence of the preferential growing facets of magnetite ((100), (111) and (110)) was confirmed (Extended Data Fig.4 ).
TEM images of the lattice planes of the nanoparticles (capped with L-lysine, aminobenzoic acid, tartaric acid and cysteamine) were acquired with a JEOL JEM-2200FS with an accelerating voltage of 200 kV at high magnification. The samples were prepared as for evaluation of particle size. Occurring atomic distances were evaluated by creating diffraction patterns by Fourier Transformation with Image J and comparing those to projections of magnetite in Jmole. For each sample about 20 images were evaluated. The existence of the preferential growing facets of magnetite ((100), (111) and (110)) was confirmed (Extended Data Fig.
4
Comprehensive Material Characterization
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The phase and crystallinity of the composite were characterized by X-ray diffract meter (XRD, Rigaku, Japan) with Cu-Kα (λ = 1.54056 Å) radiation over a range of 2Θ angle from 10° to 80°. The morphology of the products was observed by field-emission scanning electron microscopy (FESEM, Htachi S-7400, Japan) whereas the distribution of elements was measured using energy dispersive X-ray spectroscopy (EDX) analysis. While high resolution TEM images and selected area electron diffraction patterns were observed by JEOL JEM-2200FS transmission electron microscope (TEM) operating at 200 kV equipped with EDX (JEOL, Japan).
5
Virus Enumeration Using Latex Beads
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Equal volumes of virus suspension and polystyrene latex spheres (Agar Scientific, AGS130-02) at a known concentration per ml were mixed in 2 volumes of TNE buffer (20 mM Tris [pH 7.5], 0.5 M NaCl, and 1 mM EDTA). 5 μl of suspension was then added to a glow discharged EM grid (Agar Scientific, S162-4), allowed to rest for 1 min, washed three times in deionised water, and stained with Ammonium Molybdate (2% (w/v) pH 7.2). Dry grids were examined using a JEM2200 FS electron microscope (JEOL) and images captured using an Ultrascan 4000 charge-coupled-device (CCD) camera (Gatan). Multiple images (n ≥ 6) per sample were used for virus particle and latex bead enumeration and used to calculate the number of particles per ml of virus stock inoculum.
6
Protein Sample Visualization by TEM
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Twenty microliters of protein sample at 0.5 μg/μl was deposited on a carbon-Formvar grid (Ted Pella Inc.), incubated for 2 min, and blotted dry. The grid was then covered with 20 μl of 2% uranyl acetate, incubated for 2 min, and blotted dry. Samples were visualized on a JEOL JEM-2200FS transmission electron microscope.
7
Electrical Characterization of Protein Nanowire Sensors
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The electrical measurements were performed in the ambient environment, unless otherwise specified. The I–V curves were measured by using semiconductor parameter analyzers (Keysight B1500A and Agilent 4155C). The voltage and current outputs of protein nanowire sensors were measured by a source meter (Keithley 2401) and a semiconductor analyzer (Keysight B1500A). The relative humidity (RH) in the ambient environment was real-time monitored by a hygrometer (Model 8706; REED Instruments). A high-resolution scanning electron microscope (SEM, JSM-7001F; JEOL) was used to measure the device structures and film thickness. The nanowire networks were imaged by using a transmission electron microscope (TEM, JEM2200FS; JEOL).
8
Graphene Imaging via TEM
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TEM images were obtained by a JEM-2200FS transmission electron microscope (JEOL Ltd., Tokyo, Japan) with a resolution of 0.1 nm at an accelerating voltage of 200 kV. Aqueous dispersions of graphene were deposited onto a copper grid covered with a carbon film.
9
Transmission Electron Microscopy of Nanocrystals
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The samples were prepared by dropping
dilute solutions of NCs onto carbon coated gold grids, which were
then placed under a vacuum to preserve them from oxidation. Low resolution
transmission electron microscopy (TEM) measurements were carried out
on a JEOL JEM-1100 transmission electron microscope operating at an
acceleration voltage of 100 kV. High resolution TEM (HRTEM) was performed
with a JEOL JEM-2200FS microscope equipped with a 200 kV field emission
gun, a CEOS spherical aberration corrector in the objective lens,
enabling a spatial resolution of 0.9 Å, and an in column energy
filter. High angle annular dark field images were acquired on the
same microscope in scanning mode (STEM) with a nominal probe size
of 0.2 nm, and an inner cutoff angle of the annular detector of 75
mrad.
dilute solutions of NCs onto carbon coated gold grids, which were
then placed under a vacuum to preserve them from oxidation. Low resolution
transmission electron microscopy (TEM) measurements were carried out
on a JEOL JEM-1100 transmission electron microscope operating at an
acceleration voltage of 100 kV. High resolution TEM (HRTEM) was performed
with a JEOL JEM-2200FS microscope equipped with a 200 kV field emission
gun, a CEOS spherical aberration corrector in the objective lens,
enabling a spatial resolution of 0.9 Å, and an in column energy
filter. High angle annular dark field images were acquired on the
same microscope in scanning mode (STEM) with a nominal probe size
of 0.2 nm, and an inner cutoff angle of the annular detector of 75
mrad.
10
Comprehensive Structural Characterization of Samples
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The crystal structure of the samples was collected on a D/max γA diffractometer using a Cu–Kα target (λ = 0.154178 nm) (XRD, MiniFlex-600, Rigaku Co., Tokyo, Japan). The morphology of the samples was observed by field-emission scanning electron microscopy (SEM, Magellan-400, FEI Co., Hillsboro, OR, USA). The single-crystalline feature and elemental distribution were verified by the transmission electron microscope using an accelerating voltage of 200 kV (TEM, HRTEM(High Resolution Transmission Electron Microscopy), and Mapping, JEM-2200FS, JEOL Co., Tokyo, Japan). The characteristic modes of the sample were measured by a Raman system that consisted of the solid-state diode-pumped Nd:vanadate laser (Coherent Co., Santa Clara, CA, USA) and the liquid-nitrogen-cooled CCD detector (Princeton Co., Trenton, NJ, USA).
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