To prepare SEM samples, 5 μL of the samples were prepared on SEM grid by drop casting method. After incubation at room temperature for 30 min, the samples were dried, and excess samples were removed by blowing nitrogen gas. The images were obtained using Zeiss Sigma 500 SEM (Thornwood, NY, USA).
Sigma 500 sem
Manufactured by Zeiss
Sourced in Germany
The Sigma 500 SEM is a scanning electron microscope (SEM) designed and manufactured by Zeiss. It provides high-resolution imaging and analysis capabilities for a variety of materials and samples. The Sigma 500 SEM features a high-performance electron column, advanced detection systems, and user-friendly software interfaces to enable efficient and reliable sample observation and characterization.
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Lab products found in correlation
Mastersizer 2000, by Malvern Panalytical (1 mentions)
Smz25, by Nikon (1 mentions)
Ds ri2, by Nikon (1 mentions)
Jsm it100, by JEOL (1 mentions)
Glutaraldehyde, by Electron Microscopy Sciences (1 mentions)
Autosamdri 815, by Tousimis (1 mentions)
Glutaraldehyde solution, by Merck Group (1 mentions)
Evos fl microscope, by Thermo Fisher Scientific (1 mentions)
Dpbs 1x, by Thermo Fisher Scientific (1 mentions)
10 protocols using sigma 500 sem
1
SEM Sample Preparation by Drop Casting
2
SEM Analysis of Nanocarbon in UC
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The SEM test for floating
UC at the collector dosage is 9000 g/t. SIGMA 500 SEM (Carl Zeiss,
Germany) was used to analyze the filling of nanocarbon particles in
the pores of UC particle. A layer of gold is sprayed on the surface
of sample to increase conductivity before the SEM/EDS tests.
UC at the collector dosage is 9000 g/t. SIGMA 500 SEM (Carl Zeiss,
Germany) was used to analyze the filling of nanocarbon particles in
the pores of UC particle. A layer of gold is sprayed on the surface
of sample to increase conductivity before the SEM/EDS tests.
3
Characterization of Industrial Waste Fillers
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The industrial solid wastes used in this study included RM, SS, and GGBFS. RM was collected from Aluminum Corporation of China Limited. SS, GGBFS, and LS were all obtained from Yuanheng Water Purification Materials Factory in Gongyi City, China. RM, SS, and GGBFS waste powders were compared with the LS powder, and the four fillers are shown in Figure 2 . The oxide compositions of the four fillers (listed in Table 2 ) were analyzed using ARLAdvantX Intellipower 3600 X-ray fluorescence (Thermo Fisher, Waltham, MA, USA). The micromorphologies of the fillers were characterized using a Sigma 500 SEM (ZEISS, Jena, Germany). The particle size analysis of the filler was conducted using the Mastersizer 2000 (Malvern, UK). Owing to the nonconductive nature of the inorganic filler, the surface of the filler was sprayed with gold before the SEM test. The microscopic morphologies of the four filler particles are shown in Figure 3 ; the four fillers exhibited differences in particle morphology and surface texture.
4
Scanning Electron Microscopy of Beetle Elytra
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Elytra of the extant beetles were imaged using a Nikon SMZ25 stereomicroscope coupled to a Nikon DS-Ri2 camera before and after each experiment. Untreated elytra and elytra matured at temperatures less than or equal to 350°C were embedded in epoxy resin and polished until the complete longitudinal sections were revealed (electronic supplementary material, figure S2a–d); cuticles matured at higher temperatures were too friable to allow embedding in resin. Elytra were platinum- or gold-coated, mounted on Al stubs using carbon tape and examined in high vacuum mode using a JEOL JSM-IT100 variable pressure scanning electron microscope (VP-SEM) at an accelerating voltage of 10 kV and a working distance of 11–20 mm or a Zeiss Sigma 500 SEM at an accelerating voltage of 5 kV and a working distance of 4–8 mm.
Samples (ca 10 mm2) of fossil cuticle were platinum coated and examined using a Zeiss Sigma 500 SEM equipped with an Oxford X-max 150 energy dispersive spectroscopy (EDS) detector. Observations were made in high vacuum mode at an accelerating voltage of 15 kV and a working distance of 6–8 mm, with acquisition times of 20 min for EDS maps.
Samples (ca 10 mm2) of fossil cuticle were platinum coated and examined using a Zeiss Sigma 500 SEM equipped with an Oxford X-max 150 energy dispersive spectroscopy (EDS) detector. Observations were made in high vacuum mode at an accelerating voltage of 15 kV and a working distance of 6–8 mm, with acquisition times of 20 min for EDS maps.
5
Nanomaterial Characterization by SEM and TEM
6
Imaging and Analysis of Cellular Protrusions
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Samples were fixed with 2% glutaraldehyde (Electron Microscopy Sciences) and 4% paraformaldehyde, pH 7.4, for 24 h. Samples were critical point dried in increasing concentrations of high-grade ethanol using an Autosamdri 815 critical point dryer and then sputter coated with iridium using an Emitech K575X. Imaging was done with a QUANTA FEG 250 ESEM (Field Electron and Ion Company) or Sigma 500 SEM (Zeiss). For each image, the average length and number of filopodia and intercellular NTs was measured and counted using the FIJI imaging analysis software [69 (link)].
7
Nanowire Characterization with SEM, FIB, and TEM
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The NW
morphology, shape, size, and orientation were observed using a scanning
electron microscope (Sigma 500 SEM, Zeiss). The analysis of the crystal
structure and growth direction was done with a focused ion beam (FIB,
FEI Helios 600 dual beam microscope, Thermo Fisher Scientific) to
cut thin, electron-transparent lamellae in the NW cross section, which
is sequentially observed with a high-resolution transmission electron
microscope (HRTEM–Themis-Z). The TEM images were analyzed by
extracting reduced fast Fourier transform (FFT) patterns from selected
areas in the NW cross sections. The d-spacing values
were compared to literature tables of bulk CdTe with an error <
5%. Elemental composition analysis was done using the same microscope
with Super-X large solid angle X-ray energy dispersive X-ray spectroscopy
(EDS) detector.
morphology, shape, size, and orientation were observed using a scanning
electron microscope (Sigma 500 SEM, Zeiss). The analysis of the crystal
structure and growth direction was done with a focused ion beam (FIB,
FEI Helios 600 dual beam microscope, Thermo Fisher Scientific) to
cut thin, electron-transparent lamellae in the NW cross section, which
is sequentially observed with a high-resolution transmission electron
microscope (HRTEM–Themis-Z). The TEM images were analyzed by
extracting reduced fast Fourier transform (FFT) patterns from selected
areas in the NW cross sections. The d-spacing values
were compared to literature tables of bulk CdTe with an error <
5%. Elemental composition analysis was done using the same microscope
with Super-X large solid angle X-ray energy dispersive X-ray spectroscopy
(EDS) detector.
8
Collagen Gel Polymerization with PEG
9
Visualizing Algae-Nanoparticle Motor Interactions
10
Degradation of Electrospun PVA and PEDOT:PSS/PVA Scaffolds
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After either 15 or 30 min of crosslinking, 8 % w/v PVA electrospun scaffolds were incubated in DPBS (1X) (Gibco, 14190-144) at 37 °C over 4 weeks. Scaffolds containing 9.75 % PEDOT:PSS/PVA crosslinked at 30 min were also incubated to investigate the degradation of conductive scaffolds. Scanning electron microscopy (SEM) images of scaffolds immediately before and after crosslinking, as well as after 1, 2, or 4 weeks of incubation were obtained on a Zeiss Sigma 500 SEM. The scaffolds were mounted on carbon-taped standard aluminum stubs and sputter coated with iridium to reduce electron charging on the sample surface. A working accelerating voltage of 3 kV and an objective aperture of 30 μm were utilized for all samples. Three images per scaffold at each timepoint were obtained. SEM images obtained at 10 k magnification were analyzed on ImageJ to determine the average electrospun fiber diameter over time. Three images per scaffold and 10 fibers per image were measured. In instances where the fibers annealed and formed a film, the fiber diameter was not measured.
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