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Fe sem field emission microscope

Manufactured by Zeiss

The FE-SEM field-emission microscope is a scanning electron microscope that uses a field-emission electron source to generate a high-resolution electron beam. It is designed to provide high-quality, high-resolution imaging of a wide range of materials and samples.

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2 protocols using fe sem field emission microscope

1

SEM Imaging with Platinum-Palladium Coating

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SEM imaging was performed using a Zeiss FE-SEM field-emission microscope with variable pressure, operating at 1.5 kV, as previously reported (34 (link), 35 , 38 (link)). Shortly, all the specimens were sputtered with a 5- to 10-nm platinum-palladium layer before imaging. ImageJ Fiji (version 1.47d) software package was used for the visualization and analysis of the micrographs.
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2

Nanoscale Imaging of Fiber Surfaces

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Scanning electron microscopy (SEM) imaging was performed with a Zeiss FE-SEM field emission microscope with variable pressure, operating at 1–1.5 kV for all the samples. A thin platinum coating was sputtered onto the samples prior to imaging of surfaces and cross-sections of the fibers.
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