The morphology of the carbon collector was observed with a scanning electron microscope (JSM-7600FA, JEOL). The cross-sections of PEAA-graphite layer were observed with a tabletop microscope (TM4000, HITACHI). Sheet resistance was measured with the residence measurement (sigma − 5 + -S.P., NPS). The thickness of the electrode was measured with the profiler (Dektak XT, ULVAC). The contact angle was measured with the contact angle meter (Theta T200-Basic, Biolin Scientific). The discharging test was conducted with charge/discharge tester (EP-7100P, Electrofield).
Jsm 7600fa
Manufactured by JEOL
Sourced in Japan
The JSM-7600FA is a field emission scanning electron microscope (FE-SEM) produced by JEOL. It is designed to provide high-resolution imaging and analysis of a wide range of materials. The JSM-7600FA features a high-performance electron optical system, advanced imaging modes, and various analytical capabilities.
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4 protocols using jsm 7600fa
1
Characterization of Carbon Collector Morphology
2
Comprehensive Nanomaterial Characterization
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A field emission Scanning electron microscope (SEM, JEOL JSM 7600 FA) was used for the measurements of SEM. A diffractometer (Rigaku Co. Ltd., SmartLab, Japan) with Cu Kα radiation (dwelling time = 2 s, incident angle = 0.5°, step size = 0.02°, λ = 1.541 Å) was used for the collecting of grazing incidence X-ray diffraction data. A Renishaw inVia Raman Microscope system was used to acquire the Raman spectra at room temperature (25 °C). A ×100 objective and a 532 nm excitation laser were used. A PHI 5000 VersaProbe (ULVAC-PHI) with an Al Kα X-ray source (1486.6 eV) was used to obtain the X-ray photoelectron spectroscopy (XPS). The pass energies of 117.4 eV and 23.5 eV were used for the electron analyzer to analyze the wide scans and narrow scans, respectively.
3
Characterization of Laser-Induced Microstructures
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Surfaces of laser-written microstructures were observed by scanning electron microscope (JSM-5510, JEOL Co., Japan). The elemental analysis was carried out using energy-dispersive X-ray spectroscopy (JSM-7600FA, JEOL Co., Japan). For TEM cross-sectional observation (JEM-2100, JEOL Co., Japan), thin sections of approximately 200 nm thickness were prepared from a line micropattern using focused ion beam (JEM-9320, JEOL Co., Japan). Thin film of Pt-Pd for conductivity and that of C for protection were deposited before FIB etching.
4
Platelet Adhesion Quantification on Polymers
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To investigate the number of platelets adhering to the polymers, blood was drawn from 3 healthy volunteers (nonsmokers; age 22 male, age 33 female, and age 42 male) and mixed with a 1/9 volume of 3.2% sodium citrate. Platelet-rich plasma (PRP) and platelet-poor plasma (PPP) were obtained by centrifugation of citrated blood at 1,500 rpm for 5 min and 4,000 rpm for 10 min, respectively. Plasma containing 3-4 × 107 cells/cm2 was prepared by mixing PRP with PPP. Then, 200 μL of the platelet suspension was placed on each polymer surface and incubated for 1 h at 37°C. After the films were washed three times with PBS, they were immersed in 1% glutaraldehyde in PBS for 120 min at 4°C to fix the adhered platelets. The samples were dried and sputter-coated in platinum-palladium using an ion sputter coater prior to SEM (JSM-7600FA, JEOL Ltd., Tokyo, Japan). The number of adherent platelets on the polymer films was counted in five randomly selected SEM images (n = 6).
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