We examined outcrop‐scale structures within serpentinite exposed at Mie, near Nagasaki, Japan (Figure 1a ). Polished thin sections for microstructural analysis were prepared in the x‐z plane of the finite strain ellipsoid. Electron images were produced using a Zeiss Sigma Field Emission Gun Scanning Electron Microscope (FEG‐SEM) at the School of Earth and Environmental Sciences, Cardiff University. EBSD data were collected using an Oxford Instruments Symmetry EBSD detector in an FEI Quanta FEG‐SEM at the School of Earth and Environment, University of Leeds. EBSD patterns were collected at a step size 0.1 μm using a 20 kV electron beam. The Oxford Instruments program AZtec Crystal and the mtex toolbox for matlab (Bachmann et al., 2010 (link)) were used to process the data. A description of the processing routine is provided with the EBSD data. Raman spectra were collected using a WITec Alpha 300R + confocal Raman microscope in the Department of Chemistry, University of Otago, New Zealand. Analytical and data processing methods followed those described in Rooney et al. (2018 (link)).
Sigma field emission gun scanning electron microscope feg sem
Manufactured by Zeiss
The SIGMA field emission gun scanning electron microscope (FEG-SEM) is a powerful imaging tool designed for high-resolution, high-magnification analysis of a wide range of samples. It utilizes a field emission gun as the electron source, providing a focused electron beam that can achieve nanometer-scale resolution. The SIGMA FEG-SEM is capable of producing detailed, high-quality images of the surface topography and composition of various materials and samples.
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Lab products found in correlation
Stem detector, by Zeiss (2 mentions)
Pt7150 plasma barrel etcher, by Quorum Technologies (2 mentions)
Quanta feg sem, by Thermo Fisher Scientific (1 mentions)
Azteccrystal, by Oxford Instruments (1 mentions)
Alpha 300r confocal raman microscope, by WITec (1 mentions)
Amira 3d software, by Thermo Fisher Scientific (1 mentions)
Cm100 transmission electron microscope, by Philips (1 mentions)
5 protocols using sigma field emission gun scanning electron microscope feg sem
1
Microstructural Analysis of Serpentinite
2
Scanning Electron Microscopy of Composite Materials
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Microstructural investigations of composite materials were made using a Zeiss SIGMA field emission gun scanning electron microscope (FEG-SEM) at an accelerating voltage of 1–1.5 kV in a working distance of 2.1 mm. Samples were imaged in high vacuum conditions and a secondary electron detector was used for image acquisition. The pre-reduction samples could not be successfully imaged due to their highly-insulating nature, with significant beam damage and charging noted during measurements. Owing to the relatively high electrical conductivity of the post-reduction samples, they were imaged successfully without modification.
3
Particle Morphology of DPA-MPC-DPA Copolymer Nanoparticles
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Particle morphology of 0.15 and 1.5 % w/v DPA 50 -MPC 250 -DPA 50 copolymer nanoparticle systems was investigated at pH 7.5, via STEM, using a Zeiss SIGMA field emission gun scanning electron microscope (FEG-SEM) equipped with a Zeiss STEM detector. Working conditions used were; 20 kV accelerating voltage, 20 µm aperture, and 3 mm working distance. To prepare the STEM samples, 200 mesh Formvar coated copper TEM grids were plasma treated (5 watts) in a Polaron PT7150 plasma barrel etcher for 30 seconds, to improve surface wettability, 1 drop of sample applied to the TEM grid for 60 seconds, excess wicked way, 1 drop of filtered (0.22 µm) 2 % w/v PTA (pH 7.5) applied to the TEM grid for 60 seconds, excess wicked away, and then air dried.
4
Particle Morphology Analysis via STEM
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Particle morphology was investigated via STEM, using a Zeiss SIGMA field emission gun scanning electron microscope (FEG-SEM) equipped with a Zeiss STEM detector. Working conditions used were; 20 kV accelerating voltage, 20 µm aperture, and 3 mm working distance. To prepare the STEM samples, 200 mesh Formvar coated copper TEM grids were plasma treated, 40 seconds at 5 watts, in a Polaron PT7150 plasma barrel etcher for 30 seconds, to improve surface wettability. Then 1 drop of sample (0.22 µm filtered) was applied to the TEM grid for 60 seconds, excess wicked way, 1 drop of filtered (0.22 µm) 2% phophotungstic acid (PTA) (pH 7.4) applied to the TEM grid for 60 seconds, excess wicked away, and then air dried at room temperature.
5
Ultrastructural Imaging of Coaggregated Oral Bacteria
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For high resolution imaging of coaggregation by transmission electron microscopy (TEM), coaggregation was induced as described above. Samples were placed into 2% (v/v) glutaraldehyde and stored at 4°C for up to 48 h. Samples were dehydrated through a series of ethanol washes, embedded in epoxy resin and sectioned at Electron Microscopy Research Services, Newcastle University. Sections were analyzed in a Philips CM100 transmission electron microscope. For serial block face sectioning-scanning electron microscopy (SBF-SEM), coaggregated cells were fixed in 2% glutaraldehyde for 24 h at 4°C, rinsed twice in PBS and then dehydrated through a series of ethanol washes: once each in 25%, 50%, 75%, and two times in 100% ethanol for 30 min.
The structure of coaggregates was visualized using a Zeiss Sigma Field Emission Gun Scanning Electron Microscope (FEGSEM) incorporating Gatan 3view. Approximately 100 serial 70 nm sections were analysed. S. gordonii and A. oris cells were manually identified and color-coded, facilitated by AMIRA 3D software (Thermo Fisher).
The structure of coaggregates was visualized using a Zeiss Sigma Field Emission Gun Scanning Electron Microscope (FEGSEM) incorporating Gatan 3view. Approximately 100 serial 70 nm sections were analysed. S. gordonii and A. oris cells were manually identified and color-coded, facilitated by AMIRA 3D software (Thermo Fisher).
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