The imaging of particle morphology was conducted with scanning electron microscopy (SEM) using Phenom XL (Phenom-World BV, Eindhoven, The Netherlands). To guarantee sample grounding and to minimise charging effects, samples were fixed onto carbon stickers and gold-sputtered with BAL-Tec SCP 050 Sputter Coater (Leica Instruments, Wetzlar, Germany). All images were taken at 1000× or 2500× magnitude with an acceleration voltage of 10 kV and with the use of a backscatter detector.
Bal tec scp 050 sputter coater
Manufactured by Leica
Sourced in Germany
The BAL-Tec SCP 050 Sputter Coater is a laboratory equipment used for the deposition of thin films onto various substrates. It employs the sputter coating technique to apply uniform coatings of conductive materials, such as gold or platinum, onto samples for subsequent examination using electron microscopy.
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Lab products found in correlation
2 protocols using bal tec scp 050 sputter coater
1
Particle Morphology Imaging via SEM
2
Morphological Analysis of Micronized Trehalose
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Scanning electron microscopy (SEM, Carl Zeiss Microscopy GmbH, Oberkochen, Germany) was used to investigate the morphological features of micronized trehalose and OP blend. Samples were mounted on sticky carbon tabs and sputtered with gold using a BAL-TEC SCP 050 Sputter Coater (Leica Instruments, Wetzlar, Germany) before imaging.
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