of fabricated microspheres was patterned on a piece of clean silicon
wafer. The reflection spectra and corresponding OM images were measured
on the pre-patterned samples in the BF and DF illumination modes,
using a microscope with a 20×/0.4 NA objective integrated with
a white light source (100 W tungsten xenon lamp) with a light spot
size around 1.1 mm in diameter and an Ocean Optics HR4000 visible
fiber optic spectrometer. The reflected light was collected by the
same objective and passed through a multimode fiber (QP450–1-XSR,
Ocean Optics) to the spectrometer with an integrated detector (HR4000,
Ocean Optics). A clean silicon wafer without any patterns was used
as 100% reflection in BF mode. The observed intensities of samples
from the microscope are normalized to the intensity as observed with
a clean piece of silicon wafer without any patterns. The used microscope
uses a higher illumination intensity in the DF mode than that in the
BF mode. The fabricated samples were measured both in ambient air
and hexadecane.