The PL of the SWCNT solutions was characterized with a Horiba Jobin Yvon NanoLog spectrofluorometer using a liquid-N2 cooled InGaAs array. Note that for PL spectroscopy measurements, D2O was used in place of Nanopure water as the solvent. UV–vis-NIR absorption spectra were measured with a spectrophotometer equipped with a broadband InGaAs detector (Lambda 1050, PerkinElmer). For TCFs, an integrating sphere (Labsphere Model No. 150MM RSA ASSY) equipped with a broadband InGaAs detector attached to the UV–vis-NIR spectrophotometer was also used. Raman scattering was measured from thin-film samples using a LabRAM ARAMIS Raman microscope (Horiba Jobin Yvon) in duo scan mode, which averaged spectra from a 30 × 30 μm2 area. Each sample was measured from at least 10 different regions and averaged to ensure the data were statistically meaningful.
Labram aramis raman microscope
Manufactured by Horiba
Sourced in United States
The LabRAM ARAMIS Raman microscope is a versatile and advanced analytical instrument designed for high-performance Raman spectroscopy. It features a laser-based excitation system and a specialized optical microscope to enable the analysis of materials at the micro-scale level.
Automatically generated - may contain errors
Lab products found in correlation
Lambda 1050, by PerkinElmer (2 mentions)
Axis 165 spectrometer, by Shimadzu (2 mentions)
Labspec 6, by Horiba (2 mentions)
Easynav package, by Horiba (2 mentions)
Nanolog spectrofluorometer, by Horiba (1 mentions)
Su 70 sem, by Hitachi (1 mentions)
Evolution 600 uv vis spectrophotometer, by Thermo Fisher Scientific (1 mentions)
Axis ultra dld spectrometer, by Shimadzu (1 mentions)
Titan st, by Thermo Fisher Scientific (1 mentions)
Summit 11600 ap, by Microtech (1 mentions)
Cary 5000, by Agilent Technologies (1 mentions)
10 protocols using labram aramis raman microscope
1
Characterization of SWCNT Solutions
2
Raman and XPS Analysis of SWCNTs
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The SWCNTs were precipitated
out from solutions and deposited on glass slides for Raman scattering
or on gold-coated silicon substrates for XPS measurements. XPS was
performed on a Kratos Axis 165 spectrometer at 25 and 175 °C
under ultrahigh vacuum (<1 × 10–8 Torr).
Raman spectra were measured on a LabRAM ARAMIS Raman microscope (Horiba
Scientific). The samples were excited with a He–Ne laser (632.8
nm) or a 532 nm laser at a power density of 0.014–0.14 mW μm–2. Each spectrum was obtained by averaging the data
collected from three different spots.
out from solutions and deposited on glass slides for Raman scattering
or on gold-coated silicon substrates for XPS measurements. XPS was
performed on a Kratos Axis 165 spectrometer at 25 and 175 °C
under ultrahigh vacuum (<1 × 10–8 Torr).
Raman spectra were measured on a LabRAM ARAMIS Raman microscope (Horiba
Scientific). The samples were excited with a He–Ne laser (632.8
nm) or a 532 nm laser at a power density of 0.014–0.14 mW μm–2. Each spectrum was obtained by averaging the data
collected from three different spots.
3
Characterization of Synthesized SWCNTs
4
Raman Spectroscopy Analysis of Remineralized Dentin
5
Raman Spectroscopy Analysis of Remineralized Dentin
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The demineralized dentin specimens (as control) and P-AIDD specimens (as test group samples) before and after remineralization were imaged using a LabRAM ARAMIS Raman microscope (HORIBA Jobin Yvon, Edison, NJ, United States). This Raman spectrometer was equipped with a HeNe laser (λ = 633 nm, a laser power of 17 mW) as an excitation source. The samples were mounted in a computer-controlled, high-precision x-y stage. Raman spectra were acquired under these instrument conditions: 200 μm confocal hole, 150 μm wide entrance slit, 600 g/mm grating, 15 s spectra acquisition time, four acquisitions per cycle, and 50X long working distance objective Olympus lens. With the assistance of HORIBA’s EasyNav™ package, Raman spectra were acquired over a range of 300–1,800 cm−1 and data processing was performed using LabSPEC 6 software (HORIBA Jobin Yvon, Edison, NJ, United States). In this work, two-dimensional micro-Raman mapping/imaging was used to determine the spatial relationships and distribution of the functional or chemical groups. The spectra were collected from the defined area at regular intervals of 15 μm in both X and Y planes. At least four rectangular areas from test group or control group samples were imaged and submitted to spectral analysis.
6
Raman Spectroscopy of Sample Characterization
7
Characterization of Purified DWCNTs
8
Raman Microscopy Technique Protocol
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All spectra were collected using a Horiba-LabRAM ARAMIS Raman microscope equipped with a 325 nm He-Cd laser, full range grating, and motorized stage. The instrument was operated using the Thermo Scientific OMNIC 8 software suite. OMNIC™ Atlμs™ mapping software was used to collect and analyze the data.
9
Characterization of Cu2O/SnO Bilayer Films
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The capacitance curve for the ATO dielectric was measured by a capacitance meter (Agilent E4981A). The electrical performance of p- and n-type TFTs and CMOS inverters were characterized at room temperature in dark using a semiconductor device analyzer (Agilent B1500A) and a microprobe station (Summit-11600 AP, Cascade Microtech). The chemical composition of the Cu2O/SnO bilayer films was analyzed by x-ray photoelectron spectroscopy (XPS) using an Axis Ultra DLD spectrometer (Kratos Analytical, UK). Raman spectra were analyzed at room temperature at wavenumber range from 100 to 800 cm−1 by LabRAM ARAMIS Raman Microscope (Horiba Scientific) and a 473 nm cobalt laser source was used for excitation. Cross-sectional TEM sample was prepared by a focused ion beam (FIB) from Quanta 3D FEG (FEI). About 500 nm amorphous carbon layer was deposited by a carbon coater (Emitech K950X) as protection layer before performing the cross-sectional sample preparation by FIB. High resolution TEM image of bilayer sample was investigated by a Titan ST (FEI) transmission electron microscope. The UV-Vis transmittance spectra was measured by Evolution 600 UV-Vis Spectrophotometer (Thermo Scientific).
10
Characterization of Au Nanostructures
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The different sizes of AuNSs were characterised using transmission electron microscopy (TEM) (H-7650) and ultraviolet/visible/near-infrared (UV-vis-NIR) spectra (Agilent Cary 5000). SEM images of the substrates were acquired using a Hitachi S4800 microscope operated at 5 kV and an Apreo S LoVac microscope operated at 15 kV. The sizes of different nanoparticles were calculated by measuring more than 100 nanoparticles in TEM or SEM images using Image J software. The nanogap of near nanoparticles was calculated by measuring more than 100 spacing distances in SEM images using Image J software. The SERS activity of the 2D and 3D substrates was studied by an area SERS mapping (25 × 25 μm2 with 5 μm step) with 4-MBA as the probe. The 2D and 3D SERS substrates were soaked in 0.1 mM of 4-MBA ethanol solution for 2 h, then rinse with ethanol and dried at room temperature to remove any unbound molecules. Raman spectra were recorded on a LabRAM Aramis Raman microscope of Horiba JY. The 785 nm extinction line was focused on the substrate through a 10 × (NA = 0.25) objective. The Raman scattering light was collected using the same objective. The excitation wavelengths (633 nm, 785 nm) were focused on substrates with a power of 0.44 mW and 4.34 mW. The exposure time was 1 s for one mapping pixel.
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