The mineralogical composition of all samples was determined with X-ray diffraction (XRD), at the School of Mineral Resources Engineering, Technical University of Crete (Chania, Greece), on a Bruker D8 Advance Diffractometer equipped with a Lynx Eye strip silicon detector, 0.6° divergence and receiving slits, using Ni-filtered CuKaα radiation (35 kV, 35 mA). Data were collected in the 20 range 3–70° 2θ with a step size of 0.02° and counting time 1 s per strip step (total time 63.6 s per step). The XRD traces were analyzed and interpreted with the Diffrac Plus 13 software package from Bruker, Germany, and the Powder Diffraction Files (PDF). The quantitative analysis was performed on random powder samples (side loading mounting) by the Rietveld method using the BMGN code (Autoquan© software package version 2.8, Seifert GmbH & Co, Ahrensburg, Germany). About 1 g of finely ground sample <10 μm in size was used for the analyses.
Eye strip silicon detector
Manufactured by Bruker
The Eye strip silicon detector is a high-performance semiconductor detector used in various analytical and research applications. It is designed to accurately and efficiently measure the energy of incident particles or photons. The device features a silicon-based sensor that converts the energy of the incoming radiation into an electrical signal, which can be analyzed and processed by associated electronic systems.
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Lab products found in correlation
4 protocols using eye strip silicon detector
1
Quantitative Mineralogical Analysis by XRD
2
Quantitative Mineralogical Analysis by XRD
Check if the same lab product or an alternative is used in the 5 most similar protocols
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The mineralogical composition of all samples was determined with X-ray diffraction (XRD), at the School of Mineral Resources Engineering, Technical University of Crete (Chania, Greece), on a Bruker D8 Advance Diffractometer equipped with a Lynx Eye strip silicon detector, 0.6° divergence and receiving slits, using Ni-filtered CuKaα radiation (35 kV, 35 mA). Data were collected in the 20 range 3–70° 2θ with a step size of 0.02° and counting time 1 s per strip step (total time 63.6 s per step). The XRD traces were analyzed and interpreted with the Diffrac Plus 13 software package from Bruker, Germany, and the Powder Diffraction Files (PDF). The quantitative analysis was performed on random powder samples (side loading mounting) by the Rietveld method using the BMGN code (Autoquan© software package version 2.8, Seifert GmbH & Co, Ahrensburg, Germany). About 1 g of finely ground sample <10 μm in size was used for the analyses.
3
Quantitative Mineralogical Analysis by XRD
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The mineralogical composition of all samples was determined with X-ray diffraction (XRD), at the School of Mineral Resources Engineering, Technical University of Crete, on a Bruker D8 Advance Diffractometer equipped with a Lynx Eye strip silicon detector, using Ni-filtered CuKα radiation (35 kV, 35 mA). Data were collected in the 2θ range 3–70° 2θ with a step size of 0.02° and counting time 1 s per strip step (total time 63.6 s per step). The XRD traces were analysed and interpreted with the Diffrac Plus software package from Bruker and the Powder Diffraction Files (PDF). The quantitative analysis was performed on random powder samples using Al-holders (side loading mounting approach), by the Rietveld method using the BMGN code (Autoquan© software package version 2.8).
4
Quantitative Mineral Analysis by XRD
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The mineralogical composition of all samples was determined with X-ray diffraction (XRD), at the School of Mineral Resources Engineering, Technical University of Crete, on a Bruker D8 Advance Diffractometer equipped with a Lynx Eye strip silicon detector, using Ni-filtered CuKα radiation (35 kV, 35mA) . Data were collected in the 2θ range 3-70° 2θ with a step size of 0.02° and counting time 1 s per strip step (total time 63.6 s per step). The XRD traces were analyzed and interpreted with the Diffrac Plus software package from Bruker and the Powder Diffraction Files (PDF). The quantitative analysis was performed on random powder samples (side loading mounting) by the Rietveld method using the BMGN code (Autoquan© software package version 2.8).
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