Fei nova nanosem
The FEI Nova NanoSEM is a high-resolution scanning electron microscope (SEM) designed for advanced materials analysis and imaging. It features a field emission electron source, providing high-resolution imaging capabilities. The instrument is capable of examining a wide range of sample types, including conductive and non-conductive materials, at nanometer-scale resolutions.
13 protocols using fei nova nanosem
SEM Imaging of Insect Wing Morphology
Structural and Elemental Analysis of Nanotubes
Characterization of Titanium Dental Implants
Scanning Electron Microscopy of Samples
Cell Fixation and Imaging Protocol
Dielectrophoretic Cell Characterization
Following cell immobilization and buffer aspiration, high magnification and resolution images were taken using a scanning electron microscope (FEI Nova NanoSEM). A Helix gaseous secondary electron detector was implemented to achieve the SEM imaging under low vacuum mode. Resolution of the SEM has been adjusted at 3.0 spot size using 5 kV acceleration in 0.6 Torr (∼80 Pa) vacuum environment, enabling charge-free imaging and analysis of fully hydrated specimens.
Substrate Cleaning and SEM Imaging
Characterization of Kana-Cu3(PO4)2 Hybrid Flowers
Thermogel Microscopy Characterization
SEM Imaging of Tissue Samples
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