Merlin compact sem edx microanalysis

The crystal structure and phase purity of the samples were measured by a Panaco X'Pert PRO X-ray diffractometer. A Panalytical Empyrean powder X-ray Cu-Kα radiation diffractometer with wavelength set to 0.15406 nm, commonly used voltage at 45 kV, current at 40 mA, and scanning speed: 2° min⁻¹, was used for measurement in the following test range: 10° ≤ 2θ ≤ 70°. The elemental composition of the Fe(OH)₃/Fe₂O₃@Au nanocomposites was determined by Zeiss MERLIN Compact SEM-EDX microanalysis. The chemical states of different elements were determined by Thermo ESCALAB 250XI X-ray photoelectron spectroscopy (XPS). TEM images of the samples were obtained on a FEI Talos F200S transmission electron microscope (acceleration voltage: 200 kV). The UV-Vis absorption spectra of the samples were measured on a Shimadzu UV-1780 UV-vis-NIR spectrophotometer. The absorbance of the solution during the reaction was monitored by a 722N visible spectrophotometer.