Jsm 7500f scanning microscope
The JEOL JSM-7500F is a high-resolution scanning electron microscope (SEM) capable of producing detailed images of surface topography and composition. It features a field emission electron gun, high-resolution objectives, and advanced imaging capabilities for a wide range of applications.
Lab products found in correlation
2 protocols using jsm 7500f scanning microscope
Characterization of Calcium Carbonate Crystals by SEM
Morphological Characterization of Amorphous Solid Dispersions
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