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Jsm 7500f scanning microscope

Manufactured by JEOL
Sourced in Japan

The JEOL JSM-7500F is a high-resolution scanning electron microscope (SEM) capable of producing detailed images of surface topography and composition. It features a field emission electron gun, high-resolution objectives, and advanced imaging capabilities for a wide range of applications.

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2 protocols using jsm 7500f scanning microscope

1

Characterization of Calcium Carbonate Crystals by SEM

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The structural surface characterization of the calcium carbonate crystals was made by scanning electron microscopy (SEM) using a JEOL JSM-7500F scanning microscope (JEOL Ltd., Japan) at 5.0 kV. Each cover glass, with crystals on it, had been previously coated approx. 10–20 nm with gold/palladium (80/20) in argon gas using a BAL-TEC SCD 005 Sputter Coater (Leica Mikrosysteme Vertrieb GmbH, Germany). The size of the calcium carbonate crystals was determined from SEM images by measuring crystals for the edge length of parallele-piped crystals or the diameter of rounded crystals.
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2

Morphological Characterization of Amorphous Solid Dispersions

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The surface morphology of Dio, Soluplus, Dio ASDs and PM was evaluated by SEM (Jeol-JSM-7500F scanning microscope, Tokyo, Japan) operating at 5 kV. All samples were simply mixed to avoid surface changes. Before observation, the samples were fixed on the glass stump with double-sided adhesive tape, and vacuum argon plating was used. Micrographs were acquired at different magnifications to study the morphological and surface characteristics of the ASDs.
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