Jem cx 100 transmission electron microscope

The GNPs were adsorbed on a copper grid coated with a poly (vinyl formal) for 10 min. Images were obtained using a JEM CX-100 transmission electron microscope (Jeol, Tokyo, Japan) and analyzed by Image-Tool (UTHSCSA, San Antonio, TX, USA).

All nanoparticles were characterized by JEM CX-100 transmission electron microscope (Jeol, Tokyo, Japan) at an accelerating voltage of 80 kV. Nanoparticles were dropped onto a grid (300 mesh, PELCO Grids, Ted Pella, Redding, CA, USA) coated with polyvinyl formal support film. The obtained images of nanoparticles were digitalized and processed with Image Tool software (University of Texas Health Science Center in San Antonio, TX, USA). To estimate the size distribution using the TEM data, single-peaked Gauss approximation was used. The fitting was calculated using OriginPro 9.0 software (OriginLab, Northampton, MA, USA). Meanwhile, using the image of nanoparticles from TEM micrographs, we calculated the ellipticity coefficient by the ratio of major axis to its minor axis. For each type of nanoparticle, mean values and standard deviations of coefficient of ellipticity were found.